Scott, Ethan A.

Thermal conductivity and thermal boundary resistance of atomic layer deposited high- k dielectric aluminum oxide, hafnium oxide, and titanium oxide thin films on silicon

Scott, E. A., Gaskins, J. T., King, S. W., & Hopkins, P. E. (2018) · APL Materials

Thermal properties of materialsSemiconductor materials and devices

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Limitations and Advances in Optical Thermal Transport Measurements: Extremes in Properties, Length Scales, and Temperature

Pfeifer, T. W., Schonfeld, H. B., Scott, E. A., Aller, H. T., Gaskins, J. T., Olson, D. H., Braun, J. L., Graham, S., & Hopkins, P. E. (2025) · Annual Review of Materials Research

Thermal properties of materialsThermal Radiation and Cooling Technologies

Cited by 16