Krivanek, O L

Nion (United States) · Arizona State University

1 paper on CoChatORCID 0000-0001-7271-3737

Most cited papers

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Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV
Dellby, N., Nelson-Quillin, A. M., Krivanek, O. L., Hrncirik, P., Mittelberger, A., Plotkin-Swing, B., & Lovejoy, T. C. (2023) · Microscopy and Microanalysis
Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy Techniques
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