Ruzzarin, Maria

University of Padua

1 paper on CoChatORCID 0000-0003-4098-4297

Most cited papers

Verified
Reliability and failure analysis in power GaN-HEMTs: An overview
Meneghini, M., Rossetto, I., De Santi, C., Rampazzo, F., Tajalli, A., Barbato, A., Ruzzarin, M., Borga, M., Canato, E., Zanoni, E., et al. (2017) · 2017 IEEE International Reliability Physics Symposium (IRPS)
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 120

Go further with a free account

Verify every reference, keep papers in a library, and ask questions across them.

Sign up - it is free