Lee, Byeong Ha

Gwangju Institute of Science and Technology

1 paper on CoChatORCID 0000-0003-4544-1232

Most cited papers

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Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics
Kim, S., Na, J., Kim, M. J., & Lee, B. H. (2008) · Optics Express
Optical measurement and interference techniquesDigital Holography and Microscopy
Cited by 123

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