Hu, Xiaobo Sharon
University of Notre Dame
7 papers on CoChatORCID 0000-0002-6636-9738
Most cited papers
- Verified
Computing in memory with FeFETs
Reis, D., Niemier, M., & Hu, X. S. (2018) · Proceedings of the International Symposium on Low Power Electronics and Design
Ferroelectric and Negative Capacitance DevicesAdvanced Memory and Neural Computing
Cited by 102
- Verified
Device-Circuit-Architecture Co-Exploration for Computing-in-Memory Neural Accelerators
Jiang, W., Lou, Q., Yan, Z., Yang, L., Hu, J., Hu, X. S., & Shi, Y. (2021) · IEEE Transactions on Computers
Advanced Memory and Neural ComputingAdvanced Neural Network Applications
Cited by 96
- Verified · note
DAC-SDC Low Power Object Detection Challenge for UAV Applications
Xu, X., Zhang, X., Yu, B., Hu, X. S., Rowen, C., Hu, J., & Shi, Y. (2021) · IEEE Transactions on Pattern Analysis and Machine Intelligence
Advanced Neural Network ApplicationsEmbedded Systems and FPGA Applications
Cited by 93
- Verified
SearcHD: A Memory-Centric Hyperdimensional Computing With Stochastic Training
Imani, M., Yin, X., Messerly, J., Gupta, S., Niemier, M., Hu, X. S., & Rosing, T. (2020) · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Advanced Memory and Neural ComputingAdvanced Neural Network Applications
Cited by 87
- Verified
MNSIM 2.0: A Behavior-Level Modeling Tool for Memristor-based Neuromorphic Computing Systems
Zhu, Z., Sun, H., Qiu, K., Xia, L., Krishnan, G., Dai, G., Niu, D., Chen, X., Hu, X. S., Cao, Y., et al. (2020) · Proceedings of the 2020 on Great Lakes Symposium on VLSI
Advanced Memory and Neural ComputingParallel Computing and Optimization Techniques
Cited by 77
- Verified
Experimentally validated memristive memory augmented neural network with efficient hashing and similarity search
Mao, R., Wen, B., Kazemi, A., Zhao, Y., Laguna, A. F., Lin, R., Wong, N., Niemier, M., Hu, X. S., Sheng, X., et al. (2022) · Nature Communications
Advanced Memory and Neural ComputingNeural Networks and Applications
Cited by 71
- Verified
On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM
Thomann, S., Li, C., Zhuo, C., Prakash, O., Yin, X., Hu, X. S., & Amrouch, H. (2021) · 2021 IEEE 39th VLSI Test Symposium (VTS)
Network Packet Processing and OptimizationFerroelectric and Negative Capacitance Devices
Cited by 24
Go further with a free account
Verify every reference, keep papers in a library, and ask questions across them.
Sign up - it is free