Xiao, Ming

Surge-Energy and Overvoltage Ruggedness of P-Gate GaN HEMTs

Zhang, R., Kozak, J. P., Xiao, M., Liu, J., & Zhang, Y. (2020) · IEEE Transactions on Power Electronics

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

Cited by 148

Dynamic Breakdown Voltage of GaN Power HEMTs

Zhang, R., Kozak, J. P., Song, Q., Xiao, M., Liu, J., & Zhang, Y. (2020) · 2020 IEEE International Electron Devices Meeting (IEDM)

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

Cited by 81