Koller, C.

Infineon Technologies (Austria)

1 paper on CoChatORCID 0000-0003-1649-3092

Most cited papers

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Positive and negative charge trapping GaN HEMTs: Interplay between thermal emission and transport-limited processes
Nardo, A., De Santi, C., Koller, C., Ostermaier, C., Daumiller, I., Meneghesso, G., Zanoni, E., & Meneghini, M. (2021) · Microelectronics Reliability
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
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