Tanaka, Kenichiro

Panasonic (Japan)

1 paper on CoChatORCID 0000-0003-0960-8218

Most cited papers

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Hot-Electron Trapping and Hole-Induced Detrapping in GaN-Based GITs and HD-GITs
Fabris, E., Meneghini, M., De Santi, C., Borga, M., Kinoshita, Y., Tanaka, K., Ishida, H., Ueda, T., Meneghesso, G., & Zanoni, E. (2019) · IEEE Transactions on Electron Devices
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 29

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