Lu, Guoguang

China Electronic Product Reliability and Environmental Test Institute

1 paper on CoChatORCID 0000-0001-6310-7401

Most cited papers

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Investigation of Performance Degradation in 600-V HD-GITs Under Power Cycling Tests
Huang, X., Sun, P., He, Z., Lu, G., Du, X., & Luo, Q. (2023) · IEEE Journal of Emerging and Selected Topics in Power Electronics
Silicon Carbide Semiconductor TechnologiesGaN-based semiconductor devices and materials
Cited by 10

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