The DOI matches its Crossref record.
Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis
Abstract
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculat
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Phase imaging and stiffness in tapping-mode atomic force microscopy
Magonov, S. N., Elings, V., & Whangbo, M.-H. (1997) · Surface Science · doi:10.1016/s0039-6028(96)01591-9 · Cited by 1,020
Self-citationConnor, P., Schuch, J., Kaiser, B., & Jaegermann, W. (2020) · Zeitschrift für Physikalische Chemie · doi:10.1515/zpch-2019-1514 · Cited by 351
Optimized nanoscale composite behaviour in limpet teeth
Lu, D., & Barber, A. H. (2012) · Journal of The Royal Society Interface · doi:10.1098/rsif.2011.0688 · Cited by 62
In situ observation of low molecular weight poly(ethylene oxide) crystal melting, recrystallization
Chen, E.-Q., Jing, A. J., Weng, X., Huang, P., Lee, S.-W., Cheng, S. Z. D., Hsiao, B. S., & Yeh, F. (2003) · Polymer · doi:10.1016/s0032-3861(03)00557-3 · Cited by 43
Metadata
- Authors
- Magonov, S. N., & Whangbo, M.
- Venue
- Wiley eBooks
- Publisher
- Wiley
- Published
- 1995-12-14
- OpenAlex
- W2505309729
- Cited by
- 454
- References
- 0
- FWCI
- 5.91
- Type
- book
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis. https://app.cochat.ai/papers/10.1002/9783527615117
- The paper
- Magonov, S. N., & Whangbo, M. (1995). Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis. Wiley eBooks. https://doi.org/10.1002/9783527615117
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
