The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
Phase imaging and stiffness in tapping-mode atomic force microscopy
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Citations
Cites
Ueber die Berührung fester elastischer Körper.
Hertz, H. (1882) · crll · doi:10.1515/crll.1882.92.156 · Cited by 4,789
Sneddon, I. N. (1965) · International Journal of Engineering Science · doi:10.1016/0020-7225(65)90019-4 · Cited by 4,346
On the Contact of Elastic Solids
Hertz (1882) · Journal für die reine und angewandte Mathematik (Crelles Journal) · Cited by 3,051
Atomic force microscope–force mapping and profiling on a sub 100-Å scale
Martin, Y., Williams, C. C., & Wickramasinghe, H. K. (1987) · Journal of Applied Physics · doi:10.1063/1.338807 · Cited by 1,428
Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy
Zhong, Q., Inniss, D., Kjoller, K., & Elings, V. B. (1993) · Surface Science · doi:10.1016/0039-6028(93)90582-5 · Cited by 924
Self-citationClarke, H. G. (1958) · Journal of the Franklin Institute · doi:10.1016/0016-0032(58)90727-0 · Cited by 465
Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis
Magonov, S. N., & Whangbo, M. (1995) · Wiley eBooks · doi:10.1002/9783527615117 · Cited by 454
Self-citationTip Surface Interactions in STM and AFM
Pethica, J. B., & Oliver, W. C. (1987) · Physica Scripta · doi:10.1088/0031-8949/1987/t19a/010 · Cited by 388
Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operation
Sarid, D., Ruskell, T. G., Workman, R. K., et al. (1996) · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · doi:10.1116/1.589163 · Cited by 91
Cited by
Jalili, N., & Laxminarayana, K. (2004) · Mechatronics · doi:10.1016/j.mechatronics.2004.04.005 · Cited by 610
AFM: a versatile tool in biophysics
Alessandrini, A., & Facci, P. (2005) · Measurement Science and Technology · doi:10.1088/0957-0233/16/6/r01 · Cited by 384
Physical Morphology and Surface Properties of Unsaturated Pseudomonas putida Biofilms
Auerbach, I. D., Sorensen, C., Hansma, H. G., & Holden, P. A. (2000) · Journal of Bacteriology · doi:10.1128/jb.182.13.3809-3815.2000 · Cited by 144
Fujie, T., Ricotti, L., Desii, A., Menciassi, A., Dario, P., & Mattoli, V. (2011) · Langmuir · doi:10.1021/la203140a · Cited by 52
Tong, J. D., Leclère, P., Doneux, C., Brédas, J. L., Lazzaroni, R., & Jérôme, R. (2001) · Polymer · doi:10.1016/s0032-3861(00)00759-x · Cited by 49
Metadata
- Authors
- Magonov, S. N., Elings, V., & Whangbo, M.-H.
- Venue
- Surface Science
- Publisher
- Elsevier BV
- Published
- 1997-04
- Volume
- 375
- Issue
- 2-3
- Pages
- L385-L391
- ISSN
- 0039-6028 (ISSN-L)
- OpenAlex
- W2071777008
- Cited by
- 1,020
- References
- 9
- FWCI
- 31.58
- Type
- journal article
- Language
- en
- Open access
- closed
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
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How to cite
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- This page
- CoChat. (2026). Citation check: Phase imaging and stiffness in tapping-mode atomic force microscopy. https://app.cochat.ai/papers/10.1016/s0039-6028(96)01591-9
- The paper
- Magonov, S. N., Elings, V., & Whangbo, M.-H. (1997). Phase imaging and stiffness in tapping-mode atomic force microscopy. Surface Science. https://doi.org/10.1016/s0039-6028(96)01591-9
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
