Cited by 1,283Organic Electronics and PhotovoltaicsOrganic Light-Emitting Diodes ResearchFullerene Chemistry and Applications

Charge Transport and Photocurrent Generation in Poly(3‐hexylthiophene): Methanofullerene Bulk‐Heterojunction Solar Cells

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Mihailetchi, V. D., Xie, H. X., de Boer, B., Koster, L. J. A., Blom, P. W. M.·2006·Advanced Functional Materials

Abstract

The effect of controlled thermal annealing on charge transport and photogeneration in bulk‐heterojunction solar cells made from blend films of regioregular poly(3‐hexylthiophene) (P3HT) and methanofullerene (PCBM) has been studied. With respect to the charge transport, it is demonstrated that the electron mobility dominates the transport of the cell, varying from 10 –8 m 2 V –1 s –1 in as‐cast devices to ≈3 × 10 –7 m 2 V –1 s –1 after thermal annealing. The hole mobility in the P3HT phase of the blend is dramatically affected by thermal annealing. It increases by more than three orders of magnitude, to reach a value of up to ≈ 2 × 10 –8 m 2 V –1 s –1 after the annealing process, as a result of an improved crystallinity of the film. Moreover, upon annealing the absorption spectrum of P3HT:PCBM blends undergo a strong red‐shift, improving the spectral overlap with solar emission, which results in an increase of more than 60 % in the rate of charge‐carrier generation. Subsequently, the experimental electron and hole mobilities are used to study the photocurrent generation in P3HT:PCBM devices as a function of annealing temperature. The results indicate that the most important factor leading to a strong enhancement of the efficiency, compared with non‐annealed devices, is the increase of the hole mobility in the P3HT phase of the blend. Furthermore, numerical simulations indicate that under short‐circuit conditions the dissociation efficiency of bound electron–hole pairs at the donor/acceptor interface is close to 90 %, which explains the large quantum efficiencies measured in P3HT:PCBM blends.

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Research works printed but not linked: 29

  1. J. Nelson, Curr. Opin. Solid State Mater. Sci. 2002, 6, 87.
  2. K. M. Coakley, M. D. McGehee, Chem. Mater. 2004, 16, 4533.
  3. H. Spanggaard, F. C. Krebs, Sol. Energy Mater. Sol. Cells 2004, 83, 125.
  4. C. J. Brabec, G. Zerza, G. Cerullo, S. De Silvestri, S. Luzzati, J. C. Hummelen, S. Sariciftci, Chem. Phys. Lett. 2001, 340, 232.
  5. J. M. Kroon, M. M. Wienk, W. J. H. Verhees, J. C. Hummelen, Thin Solid Films 2002, 403, 223.
  6. S. E. Shaheen, C. J. Brabec, N. S. Sariciftci, F. Padinger, T. Fromherz, J. C. Hummelen, Appl. Phys. Lett. 2001, 78, 841.
  7. M. M. Wienk, J. M. Kroon, W. J. H. Verhees, J. Knol, J. C. Hummelen, P. A. van Hal, R. A. J. Janssen, Angew. Chem. Int. Ed. 2003, 42, 3371.
  8. V. D. Mihailetchi, L. J. A. Koster, P. W. M. Blom, C. Melzer, B. de Boer, J. K. J. van Duren, R. A. J. Janssen, Adv. Funct. Mater. 2005, 15, 795.
  9. V. D. Mihailetchi, J. Wildeman, P. W. M. Blom, Phys. Rev. Lett. 2005, 94, 126 602.
  10. D. Chirvase, J. Parisi, J. C. Hummelen, V. Dyakonov, Nanotechnology 2004, 15, 1317.
  11. Y. Kim, S. A. Choulis, J. Nelson, D. D. C. Bradley, S. Cook, J. R. Dur- rant, Appl. Phys. Lett. 2005, 86, 063 502.
  12. F. Padinger, R. S. Rittberger, N. S. Sariciftci, Adv. Funct. Mater. 2003, 13, 85.
  13. C. J. Brabec, Sol. Energy Mater. Sol. Cells 2004, 83, 273.
  14. X. Yang, J. Loos, S. C. Veenstra, W. J. H. Verhees, M. M. Wienk, J. M. Kroon, M. A. J. Michels, R. A. J. Janssen, Nano Lett. 2005, 5, 579.
  15. L. J. A. Koster, E. C. P. Smits, V. D. Mihailetchi, P. W. M. Blom, Phys. Rev. B 2005, 72, 085 205.
  16. V. D. Mihailetchi, L. J. Koster, J. C. Hummelen, P. W. Blom, Phys. Rev. Lett. 2004, 93, 216 601.
  17. H. Sirringhaus, P. J. Brown, R. H. Friend, M. M. Nielsen, K. Bech- gaard, B. M. W. Langeveld-Voss, A. J. H. Spiering, R. A. J. Janssen, E. W. Meijer, P. Herwig, D. M. de Leeuw, Nature 1999, 401, 685.
  18. R. J. Kline, M. D. McGehee, E. N. Kadnikova, J. S. Liu, J. M. J. Fre- chet, Adv. Mater. 2003, 15, 1519.
  19. Y. Kim, S. Cook, S. A. Choulis, J. Nelson, J. R. Durrant, D. D. C. Bradley, Chem. Mater. 2004, 16, 4812.
  20. C. Goh, R. J. Kline, M. D. McGehee, E N. Kadnikova, J. M. J. Fré- chet, Appl. Phys. Lett. 2005, 86, 122 110.
  21. C. Melzer, E. J. Koop, V. D. Mihailetchi, P. W. M. Blom, Adv. Funct. Mater. 2004, 14, 865.
  22. V. D. Mihailetchi, P. W. M. Blom, J. C. Hummelen, M. T. Rispens, J. Appl. Phys. 2003, 94, 6849.
  23. B. de Boer, A. Hadipour, M. M. Mandoc, T. van Woudenbergh, P. W. M. Blom, Adv. Mater. 2005, 17, 621.
  24. P. N. Murgatroyd, J. Phys. D 1970, 3, 151.
  25. K. J. Ihn, J. Moulton, P. Smith, J. Polym. Sci., Part B: Polym. Phys. 1993, 31, 735.
  26. S. Malik, A. K. Nandi, J. Polym. Sci., Part B: Polym. Phys. 2002, 40, 2073.
  27. E. Mena-Osteritz, A. Meyer, B. M. W. Langeveld-Voss, R. A. J. Janssen, E. W. Meijer, P. Bauerle, Angew. Chem. Int. Ed. 2000, 39, 2680.
  28. N. Camaioni, G. Ridolfi, G. Casalbore-Miceli, G. Possamai, M. Maggini, Adv. Mater. 2002, 14, 1735.
  29. G. Hass, J. E. Waylonis, J. Opt. Soc. Am. 1961, 51, 719.

Cited by

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Authors
Mihailetchi, V. D., Xie, H. X., de Boer, B., Koster, L. J. A., & Blom, P. W. M.
Affiliations
University of Groningen (NL)
Venue
Advanced Functional Materials
Publisher
Wiley
Published
2006-02-16
Volume
16
Issue
5
Pages
699-708
ISSN
  • 1616-301X (ISSN-L)
  • 1616-3028
OpenAlex
W2069640466
Cited by
1,283
References
0
Citations by year
2026: 17 · 2025: 10 · 2024: 11 · 2023: 23 · 2022: 17 · 2021: 42 · 2020: 34 · 2019: 48 · 2018: 71 · 2017: 76 · 2016: 83 · 2015: 107 · 2014: 121 · 2013: 128 · 2012: 119
FWCI
51.29
Type
journal article
Language
en
Open access
Locations
  • Advanced Functional Materials (publishedVersion, other-oa)
  • University of Groningen research database (University of Groningen / Centre for Information Technology) (publishedVersion, other-oa)
  • University of Groningen research database (University of Groningen / Centre for Information Technology) (submittedVersion, other-oa)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Organic Electronics and Photovoltaics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Organic Light-Emitting Diodes Research
  • Physical Sciences › Chemistry › Organic Chemistry › Fullerene Chemistry and Applications
Keywords
poly(3-hexylthiophene), methanofullerenes, PCBM, bulk heterojunction solar cells, annealing, charge transport, electron mobility, hole mobility, photogeneration, charge separation, donor-acceptor interface, film crystallinity, bathochromic shift, quantum efficiency, regioregular conjugated polymers

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