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Cited by 285

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Layer‐Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination

Li, Xiao‐Li, Han, Wen‐Peng, Wu, Jiang‐Bin, Qiao, Xiao‐Fen, Zhang, Jun, Tan, Ping‐Heng·2017·Advanced Functional Materials

Abstract

The quantum confinement in atomic scale and the presence of interlayer coupling in multilayer make the electronic and optical properties of 2D materials (2DMs) be dependent on the layer number (N) from monolayer to multilayer. Optical properties of 2DMs have been widely probed by several optical techniques, such as optical contrast, Rayleigh scattering, Raman spectroscopy, optical absorption, photoluminescence, and second harmonic generation. Here, it is reviewed how optical properties of several typical 2DMs (e.g., monolayer and multilayer graphenes, transition metal dichalcogenides) probed by these optical techniques significantly depend on N. Further, it has been demonstrated how these optical techniques service as fast and nondestructive approaches for N counting or thickness determination of these typical 2DM flakes. The corresponding approaches can be extended to the whole 2DM family produced by micromechanical exfoliations, chemical‐vapor‐deposition growth, or transfer processes on various substrates, which bridges the gap between the characterization and international standardization for thickness determination of 2DM flakes.

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Metadata

Authors
Li, X., Han, W., Wu, J., Qiao, X., Zhang, J., & Tan, P.
Venue
Advanced Functional Materials
Publisher
Wiley
Published
2017-01-05
Volume
27
Issue
19
ISSN
  • 1616-301X (ISSN-L)
  • 1616-3028
OpenAlex
W2568869592
Cited by
285
References
129
FWCI
9.94
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Layer‐Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination. https://app.cochat.ai/papers/10.1002/adfm.201604468
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Li, X., Han, W., Wu, J., Qiao, X., Zhang, J., & Tan, P. (2017). Layer‐Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination. Advanced Functional Materials. https://doi.org/10.1002/adfm.201604468

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