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Microscopic Understanding of the Anisotropic Conductivity of PEDOT:PSS Thin Films
Abstract
The anisotropic conductivity of thin films of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) is correlated to the film morphology as obtained from scanning tunneling and atomic force microscopy images. The material was found to consist of layers of flattened PEDOT-rich particles that are separated by quasi-continuous PSS lamella (see figure).
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Citations
Cited by
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Ray, T. R., Choi, J., Bandodkar, A. J., Krishnan, S., Gutruf, P., Tian, L., Ghaffari, R., & Rogers, J. A. (2019) · Chemical Reviews · doi:10.1021/acs.chemrev.8b00573 · Cited by 1,350
Structural control of mixed ionic and electronic transport in conducting polymers
Rivnay, J., Inal, S., Collins, B. A., Sessolo, M., Stavrinidou, E., Strakosas, X., Tassone, C., Delongchamp, D. M., & Malliaras, G. G. (2016) · Nature Communications · doi:10.1038/ncomms11287 · Cited by 939
PEDOT Nanocrystal in Highly Conductive PEDOT:PSS Polymer Films
Takano, T., Masunaga, H., Fujiwara, A., Okuzaki, H., & Sasaki, T. (2012) · Macromolecules · doi:10.1021/ma300120g · Cited by 426
Metadata
- Authors
- Nardes, A. M., Kemerink, M., Janssen, R. A. J., Bastiaansen, J. A. M., Kiggen, N. M. M., Langeveld, B. M. W., van Breemen, A. J. J. M., & de Kok, M. M.
- Venue
- Advanced Materials
- Publisher
- Wiley
- Published
- 2007-04-13
- Volume
- 19
- Issue
- 9
- Pages
- 1196-1200
- ISSN
- 0935-9648 (ISSN-L)
- 1521-4095
- OpenAlex
- W2081525996
- Cited by
- 539
- References
- 0
- FWCI
- 21.43
- Type
- journal article
- Language
- en
- Open access
- closed
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- Nardes, A. M., Kemerink, M., Janssen, R. A. J., Bastiaansen, J. A. M., Kiggen, N. M. M., Langeveld, B. M. W., van Breemen, A. J. J. M., & de Kok, M. M. (2007). Microscopic Understanding of the Anisotropic Conductivity of PEDOT:PSS Thin Films. Advanced Materials. https://doi.org/10.1002/adma.200602575
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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