Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 206

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Highly Versatile and Robust Materials for Soft Imprint Lithography Based on Thiol‐ene Click Chemistry

Open access
Campos, Luis M., Meinel, Ines, Guino, Rosette G., Schierhorn, Martin, Gupta, Nalini, Stucky, Galen D., Hawker, Craig J.·2008·Advanced Materials

Abstract

As easy as “shake and bake”, the mixing and photocuring of poly-functional thiols with alkene-functional cross-linkers, via thiol-ene click chemistry, leads to materials with outstanding and tunable characteristics for soft imprint lithography. The materials are cured within 2 minutes at ambient conditions allowing stamps with high aspect ratio and sub-100 nm features to be fabricated.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1002/adma.200800330

Cites

1 of 1 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 1 references

Cited by

See all 206

Metadata

Authors
Campos, L. M., Meinel, I., Guino, R. G., Schierhorn, M., Gupta, N., Stucky, G. D., & Hawker, C. J.
Venue
Advanced Materials
Publisher
Wiley
Published
2008-09-25
Volume
20
Issue
19
Pages
3728-3733
ISSN
  • 0935-9648 (ISSN-L)
  • 1521-4095
OpenAlex
W2002825909
Cited by
206
References
1
FWCI
14.28
Type
journal article
Language
en
Open access
bronze

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Highly Versatile and Robust Materials for Soft Imprint Lithography Based on Thiol‐ene Click Chemistry. https://app.cochat.ai/papers/10.1002/adma.200800330
The paper
Campos, L. M., Meinel, I., Guino, R. G., Schierhorn, M., Gupta, N., Stucky, G. D., & Hawker, C. J. (2008). Highly Versatile and Robust Materials for Soft Imprint Lithography Based on Thiol‐ene Click Chemistry. Advanced Materials. https://doi.org/10.1002/adma.200800330

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.