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Cited by 511

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Microstructural Characterization and Charge Transport in Thin Films of Conjugated Polymers

Salleo, Alberto, Kline, R. Joseph, DeLongchamp, Dean M., Chabinyc, Michael L.·2010·Advanced Materials

Abstract

The performance of semiconducting polymers has been steadily increasing in the last 20 years. Improved control over the microstructure of these materials and a deeper understanding of how the microstructure affects charge transport are partially responsible for such trend. The development and widespread use of techniques that allow to characterize the microstructure of semiconducting polymers is therefore instrumental for the advance of these materials. This article is a review of the characterization techniques that provide information used to enhance the understanding of structure/property relationships in semiconducting polymers. In particular, the applications of optical and X‐ray spectroscopy, X‐ray diffraction, and scanning probe techniques in this context are described.

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Metadata

Authors
Salleo, A., Kline, R. J., DeLongchamp, D. M., & Chabinyc, M. L.
Venue
Advanced Materials
Publisher
Wiley
Published
2010-07-06
Volume
22
Issue
34
Pages
3812-3838
ISSN
  • 0935-9648 (ISSN-L)
  • 1521-4095
OpenAlex
W2056580069
Cited by
511
References
0
FWCI
40.12
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Microstructural Characterization and Charge Transport in Thin Films of Conjugated Polymers. https://app.cochat.ai/papers/10.1002/adma.200903712
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Salleo, A., Kline, R. J., DeLongchamp, D. M., & Chabinyc, M. L. (2010). Microstructural Characterization and Charge Transport in Thin Films of Conjugated Polymers. Advanced Materials. https://doi.org/10.1002/adma.200903712

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