The DOI matches its Crossref record; 23 of the 23 references it cites were found in a registry or an index.
Intrinsic Topological Insulator Bi2Te3 Thin Films on Si and Their Thickness Limit
Abstract
High-quality Bi2Te3 films can be grown on Si by the state-of-art molecular beam epitaxy technique. In situ ARPES measurement reveals that the as-grown films are intrinsic topological insulators and the single-Dirac-cone surface state develops at a thickness of two quintuple layers. The work opens a new avenue for engineering of topological materials based on well-developed Si technology.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Quantum Spin Hall Effect and Topological Phase Transition in HgTe Quantum Wells
Bernevig, B. A., Hughes, T. L., & Zhang, S.-C. (2006) · Science · doi:10.1126/science.1133734 · Cited by 7,090
Self-citationTopological insulators in Bi2Se3, Bi2Te3 and Sb2Te3 with a single Dirac cone on the surface
Zhang, H., Liu, C.-X., Qi, X.-L., Dai, X., Fang, Z., & Zhang, S.-C. (2009) · Nature Physics · doi:10.1038/nphys1270 · Cited by 6,359
Self-citationQuantum Spin Hall Insulator State in HgTe Quantum Wells
König, M., Wiedmann, S., Brüne, C., Roth, A., Buhmann, H., Molenkamp, L. W., Qi, X.-L., & Zhang, S.-C. (2007) · Science · doi:10.1126/science.1148047 · Cited by 6,151
Self-citationThin-film thermoelectric devices with high room-temperature figures of merit
Venkatasubramanian, R., Siivola, E., Colpitts, T., & O'Quinn, B. (2001) · Nature · doi:10.1038/35098012 · Cited by 5,205
Topological Insulators in Three Dimensions
Fu, L., Kane, C. L., & Mele, E. J. (2007) · Physical Review Letters · doi:10.1103/physrevlett.98.106803 · Cited by 4,651
Observation of a large-gap topological-insulator class with a single Dirac cone on the surface
Xia, Y., Qian, D., Hsieh, D., Wray, L., Pal, A., Lin, H., Bansil, A., Grauer, D., Hor, Y. S., Cava, R. J., et al. (2009) · Nature Physics · doi:10.1038/nphys1274 · Cited by 3,765
Experimental Realization of a Three-Dimensional Topological Insulator, Bi 2 Te 3
Chen, Y. L., Analytis, J. G., Chu, J.-H., Liu, Z. K., Mo, S.-K., Qi, X. L., Zhang, H. J., Lu, D. H., Dai, X., Fang, Z., et al. (2009) · Science · doi:10.1126/science.1173034 · Cited by 3,585
Self-citationA topological Dirac insulator in a quantum spin Hall phase
Hsieh, D., Qian, D., Wray, L., Xia, Y., Hor, Y. S., Cava, R. J., & Hasan, M. Z. (2008) · Nature · doi:10.1038/nature06843 · Cited by 3,523
Topological field theory of time-reversal invariant insulators
Qi, X.-L., Hughes, T. L., & Zhang, S.-C. (2008) · Physical Review B · doi:10.1103/physrevb.78.195424 · Cited by 3,329
Self-citationTopological invariants of time-reversal-invariant band structures
Moore, J. E., & Balents, L. (2007) · Physical Review B · doi:10.1103/physrevb.75.121306 · Cited by 2,350
Cited by
Topological insulators and superconductors
Qi, X.-L., & Zhang, S.-C. (2011) · Reviews of Modern Physics · doi:10.1103/revmodphys.83.1057 · Cited by 14,394
Self-citationExperimental Observation of the Quantum Anomalous Hall Effect in a Magnetic Topological Insulator
Chang, C.-Z., Zhang, J., Feng, X., Shen, J., Zhang, Z., Guo, M., Li, K., Ou, Y., Wei, P., Wang, L.-L., et al. (2013) · Science · doi:10.1126/science.1234414 · Cited by 3,893
Self-citationSynthesis of MoS 2 and MoSe 2 Films with Vertically Aligned Layers
Kong, D., Wang, H., Cha, J. J., Pasta, M., Koski, K. J., Yao, J., & Cui, Y. (2013) · Nano Letters · doi:10.1021/nl400258t · Cited by 2,250
Topological Insulator Materials
Ando, Y. (2013) · Journal of the Physical Society of Japan · doi:10.7566/jpsj.82.102001 · Cited by 1,789
Xu, J.-P., Wang, M.-X., Liu, Z. L., Ge, J.-F., Yang, X., Liu, C., Xu, Z. A., Guan, D., Gao, C. L., Qian, D., et al. (2015) · Physical Review Letters · doi:10.1103/physrevlett.114.017001 · Cited by 587
Self-citation
Metadata
- Authors
- Li, Y., Wang, G., Zhu, X., Liu, M., Ye, C., Chen, X., Wang, Y., He, K., Wang, L., Ma, X., Zhang, H., Dai, X., Fang, Z., Xie, X., Liu, Y., Qi, X., Jia, J., Zhang, S., & Xue, Q.
- Venue
- Advanced Materials
- Publisher
- Wiley
- Published
- 2010-07-20
- Volume
- 22
- Issue
- 36
- Pages
- 4002-4007
- ISSN
- 0935-9648 (ISSN-L)
- 1521-4095
- OpenAlex
- W2143493810
- Cited by
- 441
- References
- 23
- FWCI
- 19.30
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Intrinsic Topological Insulator Bi2Te3 Thin Films on Si and Their Thickness Limit. https://app.cochat.ai/papers/10.1002/adma.201000368
- The paper
- Li, Y., Wang, G., Zhu, X., Liu, M., Ye, C., Chen, X., Wang, Y., He, K., Wang, L., Ma, X., Zhang, H., Dai, X., Fang, Z., Xie, X., Liu, Y., Qi, X., Jia, J., Zhang, S., & Xue, Q. (2010). Intrinsic Topological Insulator Bi2Te3 Thin Films on Si and Their Thickness Limit. Advanced Materials. https://doi.org/10.1002/adma.201000368
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.