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Cited by 272

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

The Materials Challenge in Diffraction‐Unlimited Direct‐Laser‐Writing Optical Lithography

Fischer, Joachim, von Freymann, Georg, Wegener, Martin·2010·Advanced Materials

Abstract

Using a novel photoresist (composed of pentaerythritol triacrylate and isopropyl thioxanthone) that favors stimulated emission depletion by a π-π* transition and using a two-color two-photon excitation scheme, 65-nm wide lines are achieved. This value is limited by parasitic two-photon absorption of the continuous-wave depletion beam. It is estimated that, without this process, line widths of 30 nm are in reach.

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Metadata

Authors
Fischer, J., von Freymann, G., & Wegener, M.
Venue
Advanced Materials
Publisher
Wiley
Published
2010-06-30
Volume
22
Issue
32
Pages
3578-3582
ISSN
  • 0935-9648 (ISSN-L)
  • 1521-4095
OpenAlex
W2125191421
Cited by
272
References
1
FWCI
12.38
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: The Materials Challenge in Diffraction‐Unlimited Direct‐Laser‐Writing Optical Lithography. https://app.cochat.ai/papers/10.1002/adma.201000892
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Fischer, J., von Freymann, G., & Wegener, M. (2010). The Materials Challenge in Diffraction‐Unlimited Direct‐Laser‐Writing Optical Lithography. Advanced Materials. https://doi.org/10.1002/adma.201000892

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.