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Back Gated Multilayer InSe Transistors with Enhanced Carrier Mobilities via the Suppression of Carrier Scattering from a Dielectric Interface
Abstract
The back gate multilayer InSe FETs exhibit ultrahigh carrier mobilities, surpassing all the reported layer semiconductor based electronics with the same device configuration, which is achieved by the suppression of the carrier scattering from interfacial coulomb impurities or surface polar phonons at the interface of an oxidized dielectric substrate. The room-temperature mobilities of multilayer InSe transistors increase from 64 cm(2)V(-1)s(-1) to 1055 cm(2)V(-1)s(-1) using a bilayer dielectric of poly-(methyl methacrylate) (PMMA)/Al2O3. The transistors also have high current on/off ratios of 1 × 10(8), low standby power dissipation, and robust current saturation in a broad voltage range.
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Electronics and optoelectronics of two-dimensional transition metal dichalcogenides
Wang, Q. H., Kalantar-Zadeh, K., Kis, A., Coleman, J. N., & Strano, M. S. (2012) · Nature Nanotechnology · doi:10.1038/nnano.2012.193 · Cited by 16,374
Cited by
Two-dimensional transistors beyond graphene and TMDCs
Liu, Y., Duan, X., Huang, Y., & Duan, X. (2018) · Chemical Society Reviews · doi:10.1039/c8cs00318a · Cited by 474
Large‐Size Growth of Ultrathin SnS2 Nanosheets and High Performance for Phototransistors
Zhou, X., Zhang, Q., Gan, L., Li, H., & Zhai, T. (2016) · Advanced Functional Materials · doi:10.1002/adfm.201600318 · Cited by 361
Metadata
- Authors
- Feng, W., Zheng, W., Cao, W., & Hu, P.
- Venue
- Advanced Materials
- Publisher
- Wiley
- Published
- 2014-08-28
- Volume
- 26
- Issue
- 38
- Pages
- 6587-6593
- ISSN
- 0935-9648 (ISSN-L)
- 1521-4095
- OpenAlex
- W2123510151
- Cited by
- 501
- References
- 1
- FWCI
- 11.32
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Back Gated Multilayer InSe Transistors with Enhanced Carrier Mobilities via the Suppression of Carrier Scattering from a Dielectric Interface. https://app.cochat.ai/papers/10.1002/adma.201402427
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- Feng, W., Zheng, W., Cao, W., & Hu, P. (2014). Back Gated Multilayer InSe Transistors with Enhanced Carrier Mobilities via the Suppression of Carrier Scattering from a Dielectric Interface. Advanced Materials. https://doi.org/10.1002/adma.201402427
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