Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 779

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Recent Developments in p‐Type Oxide Semiconductor Materials and Devices

Wang, Zhenwei, Nayak, Pradipta K., Caraveo‐Frescas, Jesus A., Alshareef, Husam N.·2016·Advanced Materials

Abstract

The development of transparent p‐type oxide semiconductors with good performance may be a true enabler for a variety of applications where transparency, power efficiency, and greater circuit complexity are needed. Such applications include transparent electronics, displays, sensors, photovoltaics, memristors, and electrochromics. Hence, here, recent developments in materials and devices based on p‐type oxide semiconductors are reviewed, including ternary Cu‐bearing oxides, binary copper oxides, tin monoxide, spinel oxides, and nickel oxides. The crystal and electronic structures of these materials are discussed, along with approaches to enhance valence‐band dispersion to reduce effective mass and increase mobility. Strategies to reduce interfacial defects, off‐state current, and material instability are suggested. Furthermore, it is shown that promising progress has been made in the performance of various types of devices based on p‐type oxides. Several innovative approaches exist to fabricate transparent complementary metal oxide semiconductor (CMOS) devices, including novel device fabrication schemes and utilization of surface chemistry effects, resulting in good inverter gains. However, despite recent developments, p‐type oxides still lag in performance behind their n‐type counterparts, which have entered volume production in the display market. Recent successes along with the hurdles that stand in the way of commercial success of p‐type oxide semiconductors are presented.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1002/adma.201503080

Cites

2 of 2 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 2 references

Cited by

See all 779

Metadata

Authors
Wang, Z., Nayak, P. K., Caraveo‐Frescas, J. A., & Alshareef, H. N.
Venue
Advanced Materials
Publisher
Wiley
Published
2016-02-16
Volume
28
Issue
20
Pages
3831-3892
ISSN
  • 0935-9648 (ISSN-L)
  • 1521-4095
OpenAlex
W2286666918
Cited by
779
References
2
FWCI
31.86
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Recent Developments in p‐Type Oxide Semiconductor Materials and Devices. https://app.cochat.ai/papers/10.1002/adma.201503080
The paper
Wang, Z., Nayak, P. K., Caraveo‐Frescas, J. A., & Alshareef, H. N. (2016). Recent Developments in p‐Type Oxide Semiconductor Materials and Devices. Advanced Materials. https://doi.org/10.1002/adma.201503080

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.