The DOI matches its Crossref record; 49 of the 49 references it cites were found in a registry or an index.
Metal‐Ion‐Modified Black Phosphorus with Enhanced Stability and Transistor Performance
Abstract
Black phosphorus (BP), a burgeoning elemental 2D semiconductor, has aroused increasing scientific and technological interest, especially as a channel material in field‐effect transistors (FETs). However, the intrinsic instability of BP causes practical concern and the transistor performance must also be improved. Here, the use of metal‐ion modification to enhance both the stability and transistor performance of BP sheets is described. Ag+ spontaneously adsorbed on the BP surface via cation–π interactions passivates the lone‐pair electrons of P thereby rendering BP more stable in air. Consequently, the Ag+‐modified BP FET shows greatly enhanced hole mobility from 796 to 1666 cm 2 V−1 s−1 and ON/OFF ratio from 5.9 × 10 4 to 2.6 × 10 6. The mechanisms pertaining to the enhanced stability and transistor performance are discussed and the strategy can be extended to other metal ions such as Fe 3+, Mg 2+, and Hg 2+. Such stable and high‐performance BP transistors are crucial to electronic and optoelectronic devices. The stability and semiconducting properties of BP sheets can be enhanced tremendously by this novel strategy.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Electric Field Effect in Atomically Thin Carbon Films
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Zhang, Y., Dubonos, S. V., Grigorieva, I. V., & Firsov, A. A. (2004) · Science · doi:10.1126/science.1102896 · Cited by 66,834
Electronics and optoelectronics of two-dimensional transition metal dichalcogenides
Wang, Q. H., Kalantar-Zadeh, K., Kis, A., Coleman, J. N., & Strano, M. S. (2012) · Nature Nanotechnology · doi:10.1038/nnano.2012.193 · Cited by 16,374
Atomically Thin MoS 2 : A New Direct-Gap Semiconductor
Mak, K. F., Lee, C., Hone, J., Shan, J., & Heinz, T. F. (2010) · Physical Review Letters · doi:10.1103/physrevlett.105.136805 · Cited by 15,586
Radisavljevic, B., Radenovic, A., Brivio, J., Giacometti, V., & Kis, A. (2011) · Nature Nanotechnology · doi:10.1038/nnano.2010.279 · Cited by 14,939
Black phosphorus field-effect transistors
Li, L., Yu, Y., Ye, G. J., Ge, Q., Ou, X., Wu, H., Feng, D., Chen, X. H., & Zhang, Y. (2014) · Nature Nanotechnology · doi:10.1038/nnano.2014.35 · Cited by 8,413
Ultrahigh electron mobility in suspended graphene
Bolotin, K. I., Sikes, K. J., Jiang, Z., Klima, M., Fudenberg, G., Hone, J., Kim, P., & Stormer, H. L. (2008) · Solid State Communications · doi:10.1016/j.ssc.2008.02.024 · Cited by 8,057
Phosphorene: An Unexplored 2D Semiconductor with a High Hole Mobility
Liu, H., Neal, A. T., Zhu, Z., Luo, Z., Xu, X., Tománek, D., & Ye, P. D. (2014) · ACS Nano · doi:10.1021/nn501226z · Cited by 6,480
Progress, Challenges, and Opportunities in Two-Dimensional Materials Beyond Graphene
Butler, S. Z., Hollen, S. M., Cao, L., Cui, Y., Gupta, J. A., Gutiérrez, H. R., Heinz, T. F., Hong, S. S., Huang, J., Ismach, A. F., et al. (2013) · ACS Nano · doi:10.1021/nn400280c · Cited by 4,878
Graphene-Like Two-Dimensional Materials
Xu, M., Liang, T., Shi, M., & Chen, H. (2013) · Chemical Reviews · doi:10.1021/cr300263a · Cited by 4,531
Semiconductor Devices: Physics and Technology
Sze, S. M. (1985) · Cited by 4,096
Cited by
Fast Charging Anode Materials for Lithium‐Ion Batteries: Current Status and Perspectives
Li, S., Wang, K., Zhang, G., Li, S., Xu, Y., Zhang, X., Zhang, X., Zheng, S., Sun, X., & Ma, Y. (2022) · Advanced Functional Materials · doi:10.1002/adfm.202200796 · Cited by 607
Self-citationZeng, X., Luo, M., Liu, G., Wang, X., Tao, W., Lin, Y., Ji, X., Nie, L., & Mei, L. (2018) · Advanced Science · doi:10.1002/advs.201800510 · Cited by 598
Zeng, M., Xiao, Y., Liu, J., Yang, K., & Fu, L. (2018) · Chemical Reviews · doi:10.1021/acs.chemrev.7b00633 · Cited by 574
Tyagi, D., Wang, H., Huang, W., Hu, L., Tang, Y., Guo, Z., Ouyang, Z., & Zhang, H. (2020) · Nanoscale · doi:10.1039/c9nr10178k · Cited by 508
Self-citation2D Material Optoelectronics for Information Functional Device Applications: Status and Challenges
Tan, T., Jiang, X., Wang, C., Yao, B., & Zhang, H. (2020) · Advanced Science · doi:10.1002/advs.202000058 · Cited by 458
Self-citation
Metadata
- Authors
- Guo, Z., Chen, S., Wang, Z., Yang, Z., Liu, F., Xu, Y., Wang, J., Yi, Y., Zhang, H., Liao, L., Chu, P. K., & Yu, X.
- Venue
- Advanced Materials
- Publisher
- Wiley
- Published
- 2017-09-28
- Volume
- 29
- Issue
- 42
- ISSN
- 0935-9648 (ISSN-L)
- 1521-4095
- OpenAlex
- W2758958565
- Cited by
- 516
- References
- 49
- FWCI
- 30.04
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Metal‐Ion‐Modified Black Phosphorus with Enhanced Stability and Transistor Performance. https://app.cochat.ai/papers/10.1002/adma.201703811
- The paper
- Guo, Z., Chen, S., Wang, Z., Yang, Z., Liu, F., Xu, Y., Wang, J., Yi, Y., Zhang, H., Liao, L., Chu, P. K., & Yu, X. (2017). Metal‐Ion‐Modified Black Phosphorus with Enhanced Stability and Transistor Performance. Advanced Materials. https://doi.org/10.1002/adma.201703811
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.