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In Situ Irradiated X‐Ray Photoelectron Spectroscopy Investigation on a Direct Z‐Scheme TiO2/CdS Composite Film Photocatalyst

Low, Jingxiang, Dai, Benzhe, Tong, Tong, Jiang, Chuanjia, Yu, Jiaguo·2019·Advanced Materials

Abstract

Inspired by nature, artificial photosynthesis through the construction of direct Z‐scheme photocatalysts is extensively studied for sustainable solar fuel production due to the effectiveness in enhancing photoconversion efficiency. However, there is still a lack of thorough understanding and direct evidence for the direct Z‐scheme charge transfer in these photocatalysts. Herein, a recyclable direct Z‐scheme composite film composed of titanium dioxide and cadmium sulfide (TiO 2/CdS) is prepared for high‐efficiency photocatalytic carbon dioxide (CO 2) reduction. In situ irradiated X‐ray photoelectron spectroscopy (ISI‐XPS) confirms the direct Z‐scheme charge‐carrier migration pathway in the photocatalytic system. Furthermore, density functional theory simulation identifies the intrinsic cause for the formation of the direct Z‐scheme heterojunction between the TiO 2 and the CdS. Thanks to the significantly enhanced redox abilities of the charge carriers in the direct Z‐scheme system, the photocatalytic CO 2 reduction performance of the optimized TiO 2/CdS is 3.5, 5.4, and 6.3 times higher than that of CdS, TiO 2, and commercial TiO 2 (P25), respectively, in terms of methane production. This work is a valuable guideline in preparation of highly efficient recyclable nanocomposite for photoconversion applications.

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Metadata

Authors
Low, J., Dai, B., Tong, T., Jiang, C., & Yu, J.
Venue
Advanced Materials
Publisher
Wiley
Published
2018-10-21
Volume
31
Issue
6
Pages
e1802981-e1802981
ISSN
  • 0935-9648 (ISSN-L)
  • 1521-4095
OpenAlex
W2896044205
Cited by
929
References
0
FWCI
27.15
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: In Situ Irradiated X‐Ray Photoelectron Spectroscopy Investigation on a Direct Z‐Scheme TiO2/CdS Composite Film Photocatalyst. https://app.cochat.ai/papers/10.1002/adma.201802981
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Low, J., Dai, B., Tong, T., Jiang, C., & Yu, J. (2019). In Situ Irradiated X‐Ray Photoelectron Spectroscopy Investigation on a Direct Z‐Scheme TiO2/CdS Composite Film Photocatalyst. Advanced Materials. https://doi.org/10.1002/adma.201802981

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