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Interface and Defect Engineering for Metal Halide Perovskite Optoelectronic Devices
Abstract
Metal halide perovskites have been in the limelight in recent years due to their enormous potential for use in optoelectronic devices, owing to their unique combination of properties, such as high absorption coefficient, long charge‐carrier diffusion lengths, and high defect tolerance. Perovskite‐based solar cells and light‐emitting diodes (LEDs) have achieved remarkable breakthroughs in a comparatively short amount of time. As of writing, a certified power conversion efficiency of 22.7% and an external quantum efficiency of over 10% have been achieved for perovskite solar cells and LEDs, respectively. Interfaces and defects have a critical influence on the properties and operational stability of metal halide perovskite optoelectronic devices. Therefore, interface and defect engineering are crucial to control the behavior of the charge carriers and to grow high quality, defect‐free perovskite crystals. Herein, a comprehensive review of various strategies that attempt to modify the interfacial characteristics, control the crystal growth, and understand the defect physics in metal halide perovskites, for both solar cell and LED applications, is presented. Lastly, based on the latest advances and breakthroughs, perspectives and possible directions forward in a bid to transcend what has already been achieved in this vast field of metal halide perovskite optoelectronic devices are discussed.
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Metadata
- Authors
- Han, T., Tan, S., Xue, J., Meng, L., Lee, J., & Yang, Y.
- Venue
- Advanced Materials
- Publisher
- Wiley
- Published
- 2019-02-14
- Volume
- 31
- Issue
- 47
- Pages
- e1803515-e1803515
- ISSN
- 0935-9648 (ISSN-L)
- 1521-4095
- OpenAlex
- W2914145088
- Cited by
- 481
- References
- 205
- FWCI
- 21.24
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- Funders
- Air Force Office of Scientific Research (FA9550‐15‐1‐0333)
- Office of Naval Research (N00014‐17‐1‐2484)
- National Science Foundation (ECCS‐EPMD‐1509955)
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