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Cited by 526

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Definitive Molecular Level Characterization of Defects in UiO‐66 Crystals

Trickett, Christopher A., Gagnon, Kevin J., Lee, Seungkyu, Gándara, Felipe, Bürgi, Hans‐Beat, Yaghi, Omar M.·2015·Angewandte Chemie International Edition

Abstract

The identification and characterization of defects, on the molecular level, in metal‐organic frameworks (MOFs) remain a challenge. With the extensive use of single‐crystal X‐ray diffraction (SXRD), the missing linker defects in the zirconium‐based MOF UiO‐66, Zr 6 O 4(OH)4(C 8 H 4 O 4)6, have been identified as water molecules coordinated directly to the zirconium centers. Charge balancing is achieved by hydroxide anions, which are hydrogen bonded within the pores of the framework. Furthermore, the precise nature of the defects and their concentration can be manipulated by altering the starting materials, synthesis conditions, and post‐synthetic modifications.

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Metadata

Authors
Trickett, C. A., Gagnon, K. J., Lee, S., Gándara, F., Bürgi, H., & Yaghi, O. M.
Venue
Angewandte Chemie International Edition
Publisher
Wiley
Published
2015-08-07
Volume
54
Issue
38
Pages
11162-11167
ISSN
  • 1433-7851 (ISSN-L)
  • 1521-3773
OpenAlex
W2113510568
Cited by
526
References
1
FWCI
16.35
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Definitive Molecular Level Characterization of Defects in UiO‐66 Crystals. https://app.cochat.ai/papers/10.1002/anie.201505461
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Trickett, C. A., Gagnon, K. J., Lee, S., Gándara, F., Bürgi, H., & Yaghi, O. M. (2015). Definitive Molecular Level Characterization of Defects in UiO‐66 Crystals. Angewandte Chemie International Edition. https://doi.org/10.1002/anie.201505461

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