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Cited by 87Advanced Fluorescence Microscopy TechniquesNear-Field Optical MicroscopyAdvanced optical system design

The DOI matches its Crossref record.

Scanning optical microscopy

Wilson, T.·1985·Scanning

Abstract

The scanning optical microscope, provides new information about a wide variety of specimens. The confocal mode provides a form of super‐resolution and allows the depth of field of the microscope to be tuned at will, and extended, in principle, without limit. The instrument is particularly advantageous for the study of materials and devices, especially semiconductors. The image is built up on a cathode ray tube display by mechanically scanning the object across a focussed spot.

Overview

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Crossref · 10.1002/sca.4950070203

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Citations

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Research works printed but not linked: 7

  1. Dekkers N H, 1974, Differential phase contrast in a STEM, Optik, 41, 452
  2. 10.1364/JOSAA.1.000322 · DOI
  3. 10.1364/JOSA.57.000932 · DOI
  4. Wilson T, 1984, Theory and practice of scanning optical microscopy, 213
  5. 10.1007/BF00620289 · DOI
  6. 10.1007/BF00688286 · DOI
  7. 10.1080/713821513 · DOI

Cited by

See all 87

Metadata

Authors
Wilson, T.
Affiliations
University of Oxford (GB)
Corresponding author
Wilson, T.
Venue
Scanning
Publisher
Wiley
Published
1985-01
Volume
7
Issue
2
Pages
79-87
ISSN
  • 0161-0457 (ISSN-L)
  • 1932-8745
OpenAlex
W2156199518
Cited by
87
References
0
Citations by year
2025: 2 · 2024: 1 · 2023: 1 · 2017: 1 · 2014: 2 · 2013: 1
FWCI
2.26
Type
journal article
Language
en
Open access
closed
Locations
Scanning (publishedVersion)
Topics
  • Life Sciences › Biochemistry, Genetics and Molecular Biology › Biophysics › Advanced Fluorescence Microscopy Techniques
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Near-Field Optical Microscopy
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Advanced optical system design
Keywords
scanning optical microscope, confocal microscopy, super-resolution, depth of field, CRT display, mechanical scanning, semiconductors

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Scanning optical microscopy. https://app.cochat.ai/papers/10.1002/sca.4950070203
The paper
Wilson, T. (1985). Scanning optical microscopy. Scanning. https://doi.org/10.1002/sca.4950070203

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.