Cited by 16Terahertz technology and applicationsMetamaterials and Metasurfaces ApplicationsMicrowave and Dielectric Measurement Techniques

The DOI matches its Crossref record; 45 of the 45 references it cites were found in a registry or an index.

Complex Refractive Index of Media in the THz Spectral Range

Peiponen, Kai-Erik, Gornov, Evgeny·2012·Springer Series in Optical Sciences

Overview

Integrity signals

Registry

Crossref · 10.1007/978-3-642-29564-5_3

Cites

45 of 45 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Citations

Cites

Research works printed but not linked: 2

  1. C.F. Bohren, D.R. Huffman, Absorption of Light by Small Particles (Wiley, New York, 1983)
  2. O. Wiener, Abh. Math. Phys. K1 Königl. Ges. 32, 509 (1912)

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Metadata

Authors
Peiponen, K.-E., & Gornov, E.
Affiliations
University of Eastern Finland (FI)
Venue
Springer Series in Optical Sciences
Published
2012
Pages
57-79
ISSN
  • 0342-4111 (ISSN-L)
  • 1556-1534
OpenAlex
W2115670771
Cited by
16
References
45
Citations by year
2025: 1 · 2024: 2 · 2023: 2 · 2022: 2 · 2020: 2 · 2019: 2 · 2018: 3 · 2012: 1
FWCI
0.98
Type
book chapter
Language
en
Open access
closed
Locations
Springer series in optical sciences/SPringer series in optical sciences (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
  • Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Metamaterials and Metasurfaces Applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
Keywords
complex refractive index, complex permittivity, terahertz radiation, effective medium model, two-phase media, Kramers-Kronig relations, maximum entropy model, dielectric properties

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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