Effect of Metal Electrodes on the Steady-State Leakage Current in PZT Thin Film Capacitors
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In case of impenetrable interfaces, accumulation of oxygen vacancies can stimulate electrons injection with formation of induced p-n junctions.
“In the case of impenetrable interfaces, the accumulation of oxygen vacancies can stimulate electrons injection with the formation of induced p-n junctions [62].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [62]
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Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
Self-citation
- Authors
- Podgorny, Y. V., Antonovich, A. N., Petrushin, A. A., Sigov, A. S., & Vorotilov, K. A.
- Affiliations
- MIREA - Russian Technological University (RU)
- Corresponding author
- Vorotilov, Konstantin A.
- Venue
- Journal of Electroceramics
- Published
- 2022-06-25
- Volume
- 49
- Issue
- 1
- Pages
- 15-21
- ISSN
- 1385-3449 (ISSN-L)
- 1573-8663
- OpenAlex
- W4283454244
- Cited by
- 10
- References
- 0
- Citations by year
- 2026: 4 · 2025: 2 · 2024: 2 · 2023: 2
- FWCI
- 0.42
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Electroceramics (publishedVersion)
- Funders
- Российский Фонд Фундаментальных Исследований (19-29-03058)
- Ministry of Science and Higher Education of Russia (0706-2020-0022)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor materials and devices
- Keywords
- leakage current, metal electrodes, oxygen vacancies, electron beam induced current, p-n junction, electron injection, negative differential resistance, ferroelectric capacitors, current-voltage characteristics
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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