The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
Low voltage scanning electron microscopy
Overview
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Citations
Cites
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018) · Springer eBooks · doi:10.1007/978-1-4939-6676-9 · Cited by 5,361
Self-citationGoldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Romig, A. D., Lyman, C. E., Fiori, C., & Lifshin, E. (1992) · Springer eBooks · doi:10.1007/978-1-4613-0491-3 · Cited by 1,214
Self-citationSecondary electron emission in the scanning electron microscope
Seiler, H. (1983) · Journal of Applied Physics · doi:10.1063/1.332840 · Cited by 1,026
Monte Carlo Modeling for Electron Microscopy and Microanalysis
Joy, D. C. (1995) · doi:10.1093/oso/9780195088748.001.0001 · Cited by 576
Self-citationChung, M. S., & Everhart, T. E. (1974) · Journal of Applied Physics · doi:10.1063/1.1663306 · Cited by 272
A database on electron‐solid interactions
Joy, D. C. (1995) · Scanning · doi:10.1002/sca.4950170501 · Cited by 248
Self-citationBruining, H., & de Boer, J. H. (1938) · Physica · doi:10.1016/s0031-8914(38)80103-8 · Cited by 115
Experimental determinations of electron stopping power at low energies
Luo, S., Zhang, X., & Joy, D. C. (1991) · Radiation effects and defects in solids · doi:10.1080/10420159108220619 · Cited by 60
Self-citationThe theory and practice of high-resolution scanning electron microscopy
Joy, D. C. (1991) · Ultramicroscopy · doi:10.1016/0304-3991(91)90020-7 · Cited by 60
Self-citation
Cited by
Serial Block-Face Scanning Electron Microscopy to Reconstruct Three-Dimensional Tissue Nanostructure
Denk, W., & Horstmann, H. (2004) · PLoS Biology · doi:10.1371/journal.pbio.0020329 · Cited by 1,644
Hovington, P., Drouin, D., & Gauvin, R. (1997) · Scanning · doi:10.1002/sca.4950190101 · Cited by 655
Metadata
- Authors
- Joy, D. C., & Joy, C. S.
- Venue
- Micron
- Publisher
- Elsevier BV
- Published
- 1996-06
- Volume
- 27
- Issue
- 3-4
- Pages
- 247-263
- ISSN
- 0968-4328 (ISSN-L)
- OpenAlex
- W2062887854
- Cited by
- 318
- References
- 9
- FWCI
- 6.69
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
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How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Low voltage scanning electron microscopy. https://app.cochat.ai/papers/10.1016/0968-4328(96)00023-6
- The paper
- Joy, D. C., & Joy, C. S. (1996). Low voltage scanning electron microscopy. Micron. https://doi.org/10.1016/0968-4328(96)00023-6
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
