The DOI matches its Crossref record; 56 of the 56 references it cites were found in a registry or an index.
Advances in Large-Scale Metrology – Review and future trends
Open accessAbstract
The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology.
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Cites
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Bundle Adjustment — A Modern Synthesis
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Cyber Physical Systems: Design Challenges
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The Finite Element Method: its Basis and Fundamentals
(2013) · Elsevier eBooks · doi:10.1016/c2009-0-24909-9 · Cited by 3,469
Building Information Modeling (BIM) for existing buildings — Literature review and future needs
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Cyber-physical systems in manufacturing
Monostori, L., Kádár, B., Bauernhansl, T., Kondoh, S., Kumara, S., Reinhart, G., Sauer, O., Schuh, G., Sihn, W., & Ueda, K. (2016) · CIRP Annals · doi:10.1016/j.cirp.2016.06.005 · Cited by 1,697
Metadata
- Authors
- Schmitt, R. H., Peterek, M., Morse, E., Knapp, W., Galetto, M., Härtig, F., Goch, G., Hughes, B., Forbes, A., & Estler, W. T.
- Venue
- CIRP Annals
- Publisher
- Elsevier BV
- Published
- 2016
- Volume
- 65
- Issue
- 2
- Pages
- 643-665
- ISSN
- 0007-8506 (ISSN-L)
- OpenAlex
- W2465146196
- Cited by
- 264
- References
- 56
- FWCI
- 18.30
- Type
- journal article
- Language
- en
- Open access
- green
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- Schmitt, R. H., Peterek, M., Morse, E., Knapp, W., Galetto, M., Härtig, F., Goch, G., Hughes, B., Forbes, A., & Estler, W. T. (2016). Advances in Large-Scale Metrology – Review and future trends. CIRP Annals. https://doi.org/10.1016/j.cirp.2016.05.002
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