Structural, Dielectric, Ferroelectric and Optical Properties of PBCT, PBST and PCST Complex Thin Films on LaNiO3 Metallic Conductive Oxide Layer Coated Si Substrates by the CSD Technique
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LNO is the most relevant electrode material for oxide electronics due to relatively low electrical resistivity (100-1000 μOhm·cm) and lattice parameters close to many ferroelectric and multiferroic perovskites.
“LNO is the most relevant electrode material for oxide electronics due to a relatively low electrical resistivity (100–1000 μOhm·cm) and lattice parameters close to those of many ferroelectric and multiferroic perovskites [10,11,12,13].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [10]
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Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
- Authors
- Pontes, D. S. L., Chiquito, A. J., Pontes, F. M., & Longo, E.
- Affiliations
- Universidade Federal de São Carlos (BR)
- Universidade Estadual Paulista (Unesp) (BR)
- Corresponding author
- Pontes, F.M.
- Venue
- Journal of Alloys and Compounds
- Publisher
- Elsevier BV
- Published
- 2014-10
- Volume
- 609
- Pages
- 33-39
- ISSN
- 0925-8388 (ISSN-L)
- OpenAlex
- W2057215384
- Cited by
- 7
- References
- 0
- Citations by year
- 2023: 1 · 2018: 3 · 2017: 1 · 2016: 2
- FWCI
- 0.45
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Alloys and Compounds (publishedVersion)
- Acervo Digital da Universidade Estadual Paulista (Universidade Estadual Paulista) (submittedVersion)
- UNESP Institutional Repository (São Paulo State University) (submittedVersion)
- Funders
- FAPESP (08/57150-6, 11/20536-7 and 13/07296-2)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Engineering › Biomedical Engineering › Dielectric materials and actuators
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Multiferroics and related materials
- Keywords
- ferroelectric thin films, LaNiO3, perovskite oxides, chemical solution deposition, dielectric properties, ferroelectricity, optical band gap, remnant polarization, hysteresis loops, SiO2 substrate, multilayer structures, perovskite phase
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
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Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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