Cited by 7Ferroelectric and Piezoelectric MaterialsDielectric materials and actuatorsMultiferroics and related materials

Structural, Dielectric, Ferroelectric and Optical Properties of PBCT, PBST and PCST Complex Thin Films on LaNiO3 Metallic Conductive Oxide Layer Coated Si Substrates by the CSD Technique

Pontes, D.S.L., Chiquito, A.J., Pontes, F.M., Longo, E.·2014·Journal of Alloys and Compounds

Integrity signals

Registry

Crossref · 10.1016/j.jallcom.2014.04.132

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Claims the paper makes

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Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • LNO is the most relevant electrode material for oxide electronics due to relatively low electrical resistivity (100-1000 μOhm·cm) and lattice parameters close to many ferroelectric and multiferroic perovskites.

    “LNO is the most relevant electrode material for oxide electronics due to a relatively low electrical resistivity (100–1000 μOhm·cm) and lattice parameters close to those of many ferroelectric and multiferroic perovskites [10,11,12,13].”

    From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [10]

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Authors
Pontes, D. S. L., Chiquito, A. J., Pontes, F. M., & Longo, E.
Affiliations
  • Universidade Federal de São Carlos (BR)
  • Universidade Estadual Paulista (Unesp) (BR)
Corresponding author
Pontes, F.M.
Venue
Journal of Alloys and Compounds
Publisher
Elsevier BV
Published
2014-10
Volume
609
Pages
33-39
ISSN
0925-8388 (ISSN-L)
OpenAlex
W2057215384
Cited by
7
References
0
Citations by year
2023: 1 · 2018: 3 · 2017: 1 · 2016: 2
FWCI
0.45
Type
journal article
Language
en
Open access
closed
Locations
  • Journal of Alloys and Compounds (publishedVersion)
  • Acervo Digital da Universidade Estadual Paulista (Universidade Estadual Paulista) (submittedVersion)
  • UNESP Institutional Repository (São Paulo State University) (submittedVersion)
Funders
FAPESP (08/57150-6, 11/20536-7 and 13/07296-2)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
  • Physical Sciences › Engineering › Biomedical Engineering › Dielectric materials and actuators
  • Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Multiferroics and related materials
Keywords
ferroelectric thin films, LaNiO3, perovskite oxides, chemical solution deposition, dielectric properties, ferroelectricity, optical band gap, remnant polarization, hysteresis loops, SiO2 substrate, multilayer structures, perovskite phase

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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