The DOI matches its Crossref record; 18 of the 18 references it cites were found in a registry or an index.
X-ray microtomography
Overview
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Citations
Cites
A Threshold Selection Method from Gray-Level Histograms
Otsu, N. (1979) · IEEE Transactions on Systems, Man, and Cybernetics · doi:10.1109/tsmc.1979.4310076 · Cited by 43,398
Henke, B. L., Gullikson, E. M., & Davis, J. C. (1993) · Atomic Data and Nuclear Data Tables · doi:10.1006/adnd.1993.1013 · Cited by 6,285
Principles of Computerized Tomographic Imaging
Kak, A. C., & Slaney, M. (2001) · doi:10.1137/1.9780898719277 · Cited by 5,809
Davies, A., & Fennessy, P. (2001) · Digital Imaging for Photographers · doi:10.1016/b978-0-240-51590-8.50007-x · Cited by 4,371
Russ, J. C. (2006) · CRC Press eBooks · doi:10.1201/9780203881095 · Cited by 2,107
Image reconstruction from projections : the fundamentals of computerized tomography
Herman, G. T. (1980) · Academic Press eBooks · Cited by 1,993
Computed Tomography: Principles, Design, Artifacts, and Recent Advances
Hsieh, J. (2015) · doi:10.1117/3.2197756 · Cited by 1,400
On the determination of functions from their integral values along certain manifolds
Radon, J. (1986) · IEEE Transactions on Medical Imaging · doi:10.1109/tmi.1986.4307775 · Cited by 776
Three-Dimensional X-Ray Microtomography
Flannery, B. P., Deckman, H. W., Roberge, W. G., & D'Amico, K. L. (1987) · Science · doi:10.1126/science.237.4821.1439 · Cited by 773
Recent advances in X-ray microtomography applied to materials
Stock, S. R. (2008) · International Materials Reviews · doi:10.1179/174328008x277803 · Cited by 517
Metadata
- Authors
- Landis, E. N., & Keane, D. T.
- Venue
- Materials Characterization
- Publisher
- Elsevier BV
- Published
- 2010-12
- Volume
- 61
- Issue
- 12
- Pages
- 1305-1316
- ISSN
- 1044-5803 (ISSN-L)
- OpenAlex
- W2083860642
- Cited by
- 608
- References
- 18
- FWCI
- 16.03
- Type
- journal article
- Language
- en
- Open access
- closed
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
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- CoChat. (2026). Citation check: X-ray microtomography. https://app.cochat.ai/papers/10.1016/j.matchar.2010.09.012
- The paper
- Landis, E. N., & Keane, D. T. (2010). X-ray microtomography. Materials Characterization. https://doi.org/10.1016/j.matchar.2010.09.012
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.