Cited by 25Silicon Carbide Semiconductor TechnologiesReliability and Maintenance OptimizationPhotovoltaic System Optimization Techniques

IGBT Reliability Analysis of Photovoltaic Inverter with Reactive Power Output Capability

Zhang, Bo, Gao, Yuan·2023·Microelectronics Reliability

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Crossref · 10.1016/j.microrel.2023.115073

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Authors
Zhang, B., & Gao, Y.
Affiliations
North China Electric Power University (CN)
Corresponding author
Zhang, Bo
Venue
Microelectronics Reliability
Publisher
Elsevier BV
Published
2023-08
Volume
147
Pages
115073
ISSN
0026-2714 (ISSN-L)
OpenAlex
W4383163778
Cited by
25
References
0
Citations by year
2026: 3 · 2025: 8 · 2024: 10 · 2023: 4
FWCI
1.86
Type
journal article
Language
en
Open access
closed
Locations
Microelectronics Reliability (publishedVersion)
Funders
Natural Science Foundation of Hebei Province (E2022502059)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
  • Physical Sciences › Engineering › Safety, Risk, Reliability and Quality › Reliability and Maintenance Optimization
  • Physical Sciences › Energy › Renewable Energy, Sustainability and the Environment › Photovoltaic System Optimization Techniques
Keywords
IGBT reliability, photovoltaic inverter, reactive power control, distribution networks, LightGBM, solar irradiance, ambient temperature, IEEE 33-bus system

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