Cited by 93Industrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesEvolutionary Algorithms and Applications

Surface defect classification in large-scale strip steel image collection via hybrid chromosome genetic algorithm

Hu, Huijun, Liu, Ya, Liu, Maofu, Nie, Liqiang·2016·Neurocomputing

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Crossref · 10.1016/j.neucom.2015.05.134

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  • The adaptive genetic algorithm and the hybrid chromosome genetic algorithm were proposed to enhance visual feature selection.

    “To enhance the visual feature selection, the adaptive genetic algorithm (AGA) [91] and the hybrid chromosome genetic algorithm (HCGA) [67] were proposed.”
  • SVM is a generalized linear classifier for binary classification and has been widely used for defect classification of flat steel surfaces.

    “SVM is a generalized linear classifier for binary classification, which has been widely used for the defect classification of flat steel surfaces [67, 100-102, 118].”

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Authors
Hu, H., Liu, Y., Liu, M., & Nie, L.
Affiliations
  • Wuhan University (CN)
  • Wuhan University of Science and Technology (CN)
  • National University of Singapore (SG)
Corresponding author
Liu, Maofu
Venue
Neurocomputing
Publisher
Elsevier BV
Published
2016-03
Volume
181
Pages
86-95
ISSN
0925-2312 (ISSN-L)
OpenAlex
W2196029350
Cited by
93
References
2
Citations by year
2026: 3 · 2025: 10 · 2024: 11 · 2023: 10 · 2022: 15 · 2021: 7 · 2020: 13 · 2019: 7 · 2018: 10 · 2017: 4 · 2016: 3
FWCI
9.93
Type
journal article
Language
en
Open access
closed
Locations
Neurocomputing (publishedVersion)
Funders
  • National Natural Science Foundation of China (61100133, znss2013B014)
  • Hubei Province Key Laboratory Open Foundation
Topics
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Engineering › Mechanical Engineering › Non-Destructive Testing Techniques
  • Physical Sciences › Computer Science › Artificial Intelligence › Evolutionary Algorithms and Applications
Keywords
defect classification, support vector machine, kernel function optimization, visual feature extraction, texture features, real-time classification, large-scale image databases

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