The DOI matches its Crossref record; 12 of the 12 references it cites were found in a registry or an index.
Electronic skin: architecture and components
Open accessOverview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Stretchable gold conductors on elastomeric substrates
Lacour, S. P., Wagner, S., Huang, Z., & Suo, Z. (2003) · Applied Physics Letters · doi:10.1063/1.1565683 · Cited by 885
Self-citationLumelsky, V. J., Shur, M. S., & Wagner, S. (2001) · IEEE Sensors Journal · doi:10.1109/jsen.2001.923586 · Cited by 433
Self-citationOrdering of Spontaneously Formed Buckles on Planar Surfaces
Huck, W. T. S., Bowden, N., Onck, P., Pardoen, T., Hutchinson, J. W., & Whitesides, G. M. (2000) · Langmuir · doi:10.1021/la991302l · Cited by 416
Floro, J. A., Hearne, S. J., Hunter, J. A., Kotula, P., Chason, E., Seel, S. C., & Thompson, C. V. (2001) · Journal of Applied Physics · doi:10.1063/1.1352563 · Cited by 357
Mechanical buckling instability of thin coatings deposited on soft polymer substrates
Volynskii, A. L., Bazhenov, S., Lebedeva, O. V., & Bakeev, N. F. (2000) · Journal of Materials Science · doi:10.1023/a:1004707906821 · Cited by 305
Design and Performance of Thin Metal Film Interconnects for Skin-Like Electronic Circuits
Lacour, S. P., Jones, J., Suo, Z., & Wagner, S. (2004) · IEEE Electron Device Letters · doi:10.1109/led.2004.825190 · Cited by 260
Self-citationDelocalizing strain in a thin metal film on a polymer substrate
Li, T., Huang, Z. Y., Xi, Z. C., Lacour, S. P., Wagner, S., & Suo, Z. (2005) · Mechanics of Materials · doi:10.1016/j.mechmat.2004.02.002 · Cited by 233
Self-citationThe internal stress in thin silver, copper and gold films
Abermann, R., & Koch, R. (1985) · Thin Solid Films · doi:10.1016/0040-6090(85)90096-3 · Cited by 174
Electrical response of amorphous silicon thin-film transistors under mechanical strain
Gleskova, H., Wagner, S., Soboyejo, W., & Suo, Z. (2002) · Journal of Applied Physics · doi:10.1063/1.1513187 · Cited by 162
Self-citationWrinkled polypyrrole electrode for electroactive polymer actuators
Watanabe, M., Shirai, H., & Hirai, T. (2002) · Journal of Applied Physics · doi:10.1063/1.1505674 · Cited by 144
Cited by
Highly sensitive flexible pressure sensors with microstructured rubber dielectric layers
Mannsfeld, S. C. B., Tee, B. C.-K., Stoltenberg, R. M., Chen, C. V. H.-H., Barman, S., Muir, B. V. O., Sokolov, A. N., Reese, C., & Bao, Z. (2010) · Nature Materials · doi:10.1038/nmat2834 · Cited by 3,291
Hammock, M. L., Chortos, A., Tee, B. C. ‐., Tok, J. B. ‐., & Bao, Z. (2013) · Advanced Materials · doi:10.1002/adma.201302240 · Cited by 2,396
Schwartz, G., Tee, B. C.-K., Mei, J., Appleton, A. L., Kim, D. H., Wang, H., & Bao, Z. (2013) · Nature Communications · doi:10.1038/ncomms2832 · Cited by 2,042
Xu, S., Zhang, Y., Cho, J., Lee, J., Huang, X., Jia, L., Fan, J. A., Su, Y., Su, J., Zhang, H., et al. (2013) · Nature Communications · doi:10.1038/ncomms2553 · Cited by 1,404
Highly Conductive and Stretchable Silver Nanowire Conductors
Xu, F., & Zhu, Y. (2012) · Advanced Materials · doi:10.1002/adma.201201886 · Cited by 1,314
Metadata
- Authors
- Wagner, S., Lacour, S. P., Jones, J., Hsu, P.-H. I., Sturm, J. C., Li, T., & Suo, Z.
- Venue
- Physica E: Low-dimensional Systems and Nanostructures
- Publisher
- Elsevier BV
- Published
- 2004-11
- Volume
- 25
- Issue
- 2-3
- Pages
- 326-334
- ISSN
- 1386-9477 (ISSN-L)
- OpenAlex
- W2141929446
- Cited by
- 309
- References
- 12
- FWCI
- 8.17
- Type
- journal article
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Electronic skin: architecture and components. https://app.cochat.ai/papers/10.1016/j.physe.2004.06.032
- The paper
- Wagner, S., Lacour, S. P., Jones, J., Hsu, P.-H. I., Sturm, J. C., Li, T., & Suo, Z. (2004). Electronic skin: architecture and components. Physica E: Low-dimensional Systems and Nanostructures. https://doi.org/10.1016/j.physe.2004.06.032
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
