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Antiferroelectric oxide thin-films: Fundamentals, properties, and applications
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TL;DR
This review synthesizes fundamentals, thin-film engineering strategies, materials, and device applications of antiferroelectric oxide thin films, emphasizing how thickness, strain, interfaces, defects, doping, orientation, domains, superlattices, and octahedral tilts tune AFE order. It argues AFE thin films differ strongly from bulk and are promising for energy storage, electrocaloric cooling, electrostrain, negative capacitance, memory, tunnel junctions, thermal switching, and photovoltaics, while many mechanisms remain unresolved.
Key findings
- AFE thin films exhibit size-driven AFE-to-FE transitions: PbZrO₃ films can develop a FE tetragonal phase below a critical thickness of about 6 nm under short-circuit boundary conditions even without epitaxial strain, and PbZrO₃/PbZr₀.₈Ti₀.₂O₃ multilayers transition when the PbZrO₃ sub-layer thickness decreases to ~10 nm.
- Thin-film phase transitions differ from bulk: bulk PbZrO₃ undergoes a sharp first-order AFE-to-PE transition at ~232 °C, while epitaxial PbZrO₃ films show a modified, diffuse transition and a T_A higher by 40 K than bulk; field-induced switching can be fast, with a characteristic switching time as short as 3 ns.
- Engineering levers include strain, orientation, domain/defect/doping, superlattice/interface control, and octahedral tilt control. For PbHfO₃ films on (100)-, (111)-, and (110)-oriented SrTiO₃, saturated polarization varies from 30.54 to 38.91 μC/cm² and critical transition field from 650 to 870 kV/cm.
- Applications show strong performance: relaxor AFE (Pb₀.₉₇La₀.₀₂)(Zr₀.₅₅Sn₀.₄₅)O₃ thin films achieved ~98.5% energy storage efficiency and ~84.45 J/cm³; PbZrO₃ thermal switching showed a ratio >2.2, <150 ns switching, and >10 million cycles; AFE HfZrO memory showed ~10 ns read/write, >1 ms retention, and 10¹² endurance cycles; PbZrO₃ tunnel junctions showed ON/OFF ratios up to 10⁷.
Methods
- This is a review article, not a primary experimental study; it synthesizes experimental and theoretical literature on antiferroelectric oxide thin films.
- It covers definition/history/mechanisms, phase transitions, thin-film engineering strategies, material families including lead-based and lead-free perovskites, fluorite Hf/Zr oxides, and non-perovskite AFEs, and device applications.
- The main analysis is a thematic/narrative synthesis, with tables and figures comparing key parameters and device performance across reported systems.
Limitations
- The paper states that the mechanism and even definition of AFEs remain ambiguous, multiple soft modes and extrinsic defects obscure the origin of AFE order, structures remain controversial, fatigue mechanisms are not fully understood, and phase-transition dynamics and field-induced FE structures in thin films remain elusive.
- The paper notes that most understanding of epitaxial strain effects comes from zero-Kelvin DFT calculations and may not reflect finite-temperature behavior, and that phenomenological Landau approaches have not been widely used for AFE films.
- Evident from the text: as a review, it does not present new primary data or a systematic meta-analysis, so its conclusions depend on the selected literature.
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In the paper
“Actually, there is no direct observation of pure ferrielectric structure, only its fragments, like abundant but irregular appearance at the anti-phase domain walls and field-induced ferrielectric-like phase, where it sets the lone-displacement motif of more complicated”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
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In the paper
“On the other hand, a long-range and periodic structure of such has not been observed in experiment so far.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
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In the paper
“Fig. 12c-d summarize the ECE of different AFE material systems, which clearly indicate that with increasing thickness, ECE strength ΔT/ΔE enhances significantly [5,39,287,[362][363][364][365][366]367,369,.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
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In the paper
“From Fig. 12c-d, we can also see that for bulk systems, most studies observed the negative ECE in AFE materials.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
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In the paper
“By controlling the crystalline orientation, the giant electrostrain in PbZrO 3 thin film is reported, which is strongly anisotropic with respect to the electric field direction as shown in Fig. 13e-f.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
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In the paper
“In addition to the size effect, recent research has unveiled new AFE systems in multiferroic BiFeO 3 -based [40], lead-based PbSnO 3 [59], fluorite-structure Hf x Zr 1-x O 2 thin films [43], and quasi-2 dimensional francisite Cu 3 Bi(SeO 3 ) 2 O 2 Cl [29].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.2. Timeline of notable events
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In the paper
“When considering cooling-induced phase transition under a field-free condition, the emerged AFE phase can be understood as an interruption of an imminent FE phase transition at or slightly above the FE critical temperature T 0 , by a structural phase transition at T A (T A ≥ T 0 ).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
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In the paper
“During PE-AFE phase transition around T A , a FE phase would emerge briefly under electric field or under the influence of defects and impurities [66,67].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
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“In many well-established AFE samples, the suppressed FE soft mode and related high-temperature dielectric anomaly credit as the vital ingredient of antiferroelectricity [30], this includes classic perovskite AFE oxides such as PbZrO 3 , PbHfO 3 , NaNbO 3 , and AgNbO 3 .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.1. Definition of antiferroelectricity
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In the paper
“When an external electric field is applied, the interaction between the polarization and external electric field can lift the otherwise degenerate states with different polarization directions and thus one polar state becomes preferential in energy, leading to the characteristic AFE-FE phase transition, as depicted in Fig. 2b.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
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“One typical example is that associated with the miniaturization of the microelectronic devices, the tendency of size effect from bulk to thin film makes the structural order parameters even more complex in the AFE, which is manifested by the deviation of cationic displacement from the antiparallel shifts as documented in prototypical AFE PbZrO 3 [16].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
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In the paper
“This interruption can be modeled by a repulsive interaction between polarization P, and structural order parameter ξ, that spontaneously emerges at T A .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
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“In addition to this, thin-film epitaxy also provides additional strategies to effectively tune the structural and physical properties in AFEs [19,20].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
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“In conventional FE systems, it has been reported that manipulating the energy barrier via orientation control is an effective approach to switch the electric dipoles.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
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“For bulk PbZrO 3 , calculations have shown a small energy difference of only ~1 meV/f.u. between the AFE Pbam and FE R3c phases [133].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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“To achieve high-quality, coherently-strained epitaxial films, the key factor is to keep the film thickness thinner than the critical thickness [130].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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“By reducing the film thickness from 900 nm to 100 nm, the AFE behavior is replaced by FE behavior, and whether it is induced by residual strain or the self-biasing effect at the interface remains an open question [57,116].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
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“By applying an electric field along different crystallographic orientations in AFEs, the critical electric field for AFE-FE phase transition and maximum polarization varies significantly.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
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In the paper
“Epitaxial strain has been recognized as an effective tool to modify the crystal and domain structures, to tune the physical properties, and even to create new emergent functionalities in ferroic oxide thin films [131,132].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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- Not matchedcites [131]
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“It is proposed that clamping due to mismatch in thermal expansion coefficient with the substrate suppresses the formation of AFE phase by forming FE and PE phases [140].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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“It is important to emphasize that most of our current understanding regarding the influence of epitaxial strain on the stability of different phases in AFEs has been derived from zero-Kelvin density functional theory (DFT) calculations.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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“The size scaling induced mixed FE/AFE feature can also be found in HfO 2 -based thin films [124][125][126].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
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“Based on first principles calculations, it is anticipated that epitaxial strain can disturb the balance of phase stability between the AFE and FE phases, thereby inducing the AFE-FE phase transition.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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“As Bratkovsky and Levanyuk suggested, the surface of a FE can be regarded as a defect coupled to the order parameter, resulting in the phase transition smearing in thin film [118].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
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- Not matchedcites [118]
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“The electric measurements have revealed that the multilayers undergo a thickness-dependent transition from a mixed AFE-FE behavior to a purely FE behavior.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
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In the paper
“Therefore, we could not conclude whether the AFE transition is first order or not without considering the specific structures from both sides of the transition.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
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“For these two phases, the ab-initio calculations yield very similar energies [74].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
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In the paper
“Otherwise, the strain tends to relax with the assistance of interfacial misfit dislocations.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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“Size effects in ferroic materials have been extensively studied over the years, and these studies have revealed the presence of a critical thickness necessary to stabilize the primary ferroic order parameter and thus the device functionality [113,114].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
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- Not matchedcites [113]
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“For example, Xu et al. demonstrated that the coercive field in 20 nm PbZr 0.2 Ti 0.8 O 3 thin films can be reduced from ~ 350 kV/cm for films on SrTiO 3 (0 0 1) substrate to ~ 150 kV/cm on SrTiO 3 (1 1 1) substrate [143].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
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- Not matchedcites [143]
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In the paper
“With decreasing thickness, the built-in electric field progressively increases until it reaches a critical value and induces the AFE-FE phase transition.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [119]
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In the paper
“In Hf 0.5 Zr 0.5 O 2 thin films, a giant in-plane tensile strain, induced by coalescence of the nucleating grain, are proposed to enhance the ferroelectricity by transforming the nonpolar tetragonal phase to polar orthorhombic phase [141].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [141]
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In the paper
“Growth strain, originating from the coalescence of the nucleating grains and densification during crystallization, is another important factor that influences the structure stability [139,141].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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- Not matchedcites [139]
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In the paper
“In polycrystalline AFE oxide thin films grown on semiconducting substrates (e.g., Si), the thermal and growth strain would play a crucial role in determining the free energy of AFE phase and FE phase, altering the structure stability and consequent electrical behaviors.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
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In the paper
“In contrast with HfO 2 thin films, it is widely acknowledged that ZrO 2 thin films predominantly persist AFE tetragonal structure [128,129].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
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- Not matchedcites [128]
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In the paper
“For the high temperature PE phase of bulk AFEs, the dielectric constant follows the Curie-Weiss law [75]:”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
What the sources say
- Not matchedcites [75]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“Surprisingly, below a critical thickness (about 6 nm), the PbZrO 3 films would develop a FE tetragonal phase for films under short-circuit boundary condition even in the absence of epitaxial strain.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [115]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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In the paper
“However, in contrast to the much more developed theory about FE films, the theory for controlling the functional behavior of AFE films in terms of specific demands is still in its development stage [112].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3. Engineering antiferroelectric order in thin film form
What the sources say
- Not matchedcites [112]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“The physical property in thin films usually show differences from that in bulks due to the additional constraints on electrical and mechanical boundary conditions.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
plaindirect- Asserted: passes — The authors put it forward as true.
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In the paper
“For lead-free AFE AgNbO 3 thin films, first-principles calculations revealed that two phase transitions (from Pm to Cm and from Cm to Amm2) would occur at the range of compressive strain and tensile strain, respectively.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [134]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“However, these findings may not accurately reflect the actual behavior at finite temperatures.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
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None of the sources cited for this claim have been checked yet.
In the paper
“Further, X-ray diffraction studies suggest that the substrate strain plays a crucial role in driving the AFE-to-FE transition of the PbZrO 3 layers.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“Instead, the S mode maintains a mixed feature of the AFE and AFD modes [73].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
What the sources say
- Not matchedcites [73]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“In addition to the strain-induced structural phase transition, the strain can also alter the critical electric fields (E FA and E AF ) for AFE-FE phase transition and thus tune the energy storage properties [136].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [136]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
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In the paper
“In 2007, Eliseev and Glinchuk took the size effects into account in AFE thin films and reported that the surface piezo-effect can break the inversion symmetry near the surface and generate a built-in electric field that is inversely proportional to the film thickness [119].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [119]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“For AFEs, taking PbZrO 3 as an example, it is widely accepted that the AFE phase has an orthorhombic structure (Pbam, a -a -c 0 ), which transforms into a FE rhombohedral (R3c, a -a -a -) phase with the polarization along the [1 1 1] direction under a sufficiently strong electric field [101].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [101]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“Both antipolar structures transform to FE structure with decreasing thickness below 25 nm [121].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [121]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“For epitaxial growth of thin films, the in-plane lattice constant of thin films is expected to be identical to that of the substrate when the film is thinner than a specific critical thickness value.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
plainconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“As suggested by DFT calculations, due to the impact of surface energy, the monoclinic, orthorhombic and tetragonal structure are energetically favorable in sequence as the thickness decreases [127].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [127]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“Subsequently, in 2007, a thickness driven AFE-FE phase transition was reported in PbZrO 3 /PbZr 0.8 Ti 0.2 O 3 multilayers.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“On the other hand, the presence of wide-range FE rhombohedral phase has also been reported in PbZrO 3 thin films grown on SrRuO 3 -buffered SrTiO 3 substrates [123].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [123]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“In NaNbO 3 thin films, an energy-versus-misfit strain phase diagram has been constructed, revealing three phases (monoclinic Cc, orthorhombic Pca2 1 , and orthorhombic Pmc2 1 symmetries) corresponding to different strain regimes [135].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [135]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“In 1998, Ayyub et al. first reported the size effect in AFEs in polycrystalline PbZrO 3 thin films grown on Si substrates.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Thermal strain originates from the mismatch of the thermal expansion coefficients between the film and the underlying substrate during the cooling process after film deposition [138,139].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [138]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [139]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“In 2011, Chaudhuri et al. [18] reported that a FE rhombohedral structure could be stabilized by substrate-induced strain in ultrathin PbZrO 3 epitaxial films grown on (0 0 1) SrRuO 3 -buffered SrTiO 3 substrates.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [18]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“This indicates that the PbZrO 3 sub-layer undergoes a structural transition from an orthorhombic AFE phase to rhombohedral FE phase when the PbZrO 3 sub-layer thickness decreases to ~ 10 nm [117].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [117]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“Emergent AFE behavior has been discovered in several artificial superlattice systems.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“The starting layer with HfO 2 can strengthen the field-induced ferroelectricity from AFE thin films.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [191]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“This is evidenced by identification of antipolar phases in BiFeO 3 / La 0.7 Sr 0.3 MnO 3 , BiFeO 3 /La 0.4 Bi 0.6 FeO 3 , and BiFeO 3 /TbScO 3 superlattices [186][187][188][189].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [186]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [187]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [188]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [189]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“These studies demonstrate that interfacial control offers an effective strategy for the design of new AFE materials for versatile applications.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“For the famous Hf 1-x Zr x O 2 solid solution, the inherent AFE nature in ZrO 2 thin films enables the Hf 1-x Zr x O 2 thin films to exhibit antiferroelectricity over a wide range of composition compared to other dopants [27,43,178].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [27]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [43]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [178]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Defectcontrolled electrocaloric effect (ECE) was also reported in PbZrO 3 thin films [164].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [164]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Moreover, the field-induced phase transition into these new polar phases is predicted to generate extremely large strain of up to 3.6 %, which holds significant technological significance [145].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [145]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Moreover, the superlattices can be tailored to address specific needs by means of epitaxial strain, layer thicknesses, and dielectric stiffness.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [185]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In fluorite HfO 2 -based thin films, different dopants can result in either FE or AFE behavior depending on the dopant size and doping content [43].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [43]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The B-site cation modulation imposed by the superlattice is considered as the origin of antiferroelectricity [86].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [86]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“One paradigm is that the presence of oxygen vacancies, leading to deviation from the ideal stoichiometry, can cause changes in vibrational frequency of the FE and AFE mode, resulting in the presence of intermediate FE phase [67].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [67]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In addition, by introducing point-defect via decreasing oxygen pressure, it has been revealed that a FE-like switching can be obtained in PbZrO 3 thin films at room temperature [162].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [162]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“By mediating the interfacial compressive strain using BaZrO 3 buffer layer, the polar domain walls can be abundantly formed near the interface.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [154]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“This occurs regardless of film thickness, in contrast to the so-called Kittel law, i.e., a square root dependence of domain size on thickness which has been reported for diverse ferroic systems [159,160].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [159]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [160]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In bulks, it has been shown that those translational domains pack themselves into superdomains, which are in turn separated by curved 90 • domain walls and more exotic junctions, such as cloverleaf patterns [147].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [147]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In Si-doped HfO 2 thin films where Si has a smaller radius than Hf, the AFE behavior can be obtained with increasing the doping content of Si [126].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [126]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“For instance, the AFE-FE phase transition can directly be stimulated in nonstoichiometric Pb 1.2 ZrO 3+δ thin films (Fig. 5d) [13].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [13]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“This FE-like switching can be attributed to the pinning effect from pointdefect, which can effectively delay the AFE-FE phase transition.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [162]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Therefore, it is likely that the estimated domain size of 13-nm can characterize the length scale of the densest kind of domain packingthe scale of translational domains.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [158]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Recent studies have also shown that reducing hysteresis with slim hysteresis loops can be achieved by breaking the long-range ordered domains into nanometer scale, thereby introducing nanoscale heterogeneity in AFEs via chemical doping [157], which is particularly important for their applications in energy storage devices.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [157]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“Apart from the tolerance factor that reflects the arrangements of ions in perovskite structures, the properties of perovskite oxides are intricately linked to the average electronegativity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“In 2013, polar translational antiphase boundary was initially discovered in PbZrO 3 [64].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [64]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
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- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“This can be attributed to the low monoclinic phase fraction in the starting layer of HfO 2 .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [190]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [191]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
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- Not matched
In the paper
“It is interesting to note that the above results of pioneering effective Hamiltonian studies disagree with experimental observations by Fesenko et al. [55] in PbZrO 3 single crystals.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [55]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
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- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“The interfacial control is also an effective engineering strategy to tune AFE properties in fluorite-structure Hf 1-x Zr x O 2 thin films [190].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [190]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“In that work, the increasing single layer thickness of ZrO 2 can stabilize the AFE behavior due to the energetically favorable tetragonal structure in pure ZrO 2 .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [191]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“In this proposed model, superior energy storage performance is obtained [185].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [185]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
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- Load-bearing: passes — The paper’s conclusions depend on it.
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- Not matched
In the paper
“Soon afterwards, a similar AFE-type behavior has been demonstrated in SrTiO 3 /BaZrO 3 superlattices, where both constituent phases are PE in bulk.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [87]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boostedcorrelationalSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“Chemical doping is an efficient way to modulate the material properties.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
plaindirect- Asserted: passes — The authors put it forward as true.
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- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“None of these newly identified phases exhibit the commonly acknowledged rhombohedral structure with the R3c symmetry.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [145]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“The gradual increase of lead volatilization results in asymmetric interface nucleation.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [164]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“Notably, they discovered the emergence of three new polar phases: Cc, Ima2 and I4cm are obtained under electric field along the [1 1 1], [1 1 0] and [0 0 1] directions, respectively.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [145]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“In PbZrO 3 /BaZrO 3 /SrTiO 3 thin films, it was found that the polar domain walls (180 • walls) correlated strongly with the interfacial strain [154].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [154]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boostedcorrelational- Asserted: passes — The authors put it forward as true.
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- Not matched
In the paper
“First principles study suggested that the dopant size can change the metal--oxygen bonding to cause energy differences [180].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [180]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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- Not matched
In the paper
“Using the Bragg peak shape analysis combined with X-ray nanoscopy where a nano-focused X-ray beam is used, it has been shown that individual domains are usually not larger than about 13 nm [158].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [158]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“Apart from the emergent antiferroelectricity in para-and ferro-electric materials, the AFE behavior can also be derived from multiferroic BiFeO 3 nanolayers with delicate interface engineering.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“On the one hand, Sr 2+ [111] and La 3+ [170] can stabilize the AFE phase and bring a higher E AF than undoped PbZrO 3 , on the other hand, the B-site dopant with a smaller radius, such as Sn 4+ and Ti 4+ [171], has been employed to decrease the E AF and minimize the hysteresis loop area.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [171]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“Single-crystal diffuse scattering experiments suggest that a -a -c 0 octahedral tilts are attractive to incommensuration and antiferroelectricity in PbHfO 3 , at least at high temperatures [201].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
What the sources say
- Not matchedcites [201]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“According to first-principles calculations, the energy difference between the AFE and FE phases is remarkably small (~1.4 meV/f.u.) [222,224].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [222]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [224]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Therefore, this cannot be regarded as a pure phase but only as a local structure.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“The pressure increase can obviously affect the phase stability by altering the Pb-ion displacements and oxygen octahedral distortion.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
boostedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“It undergoes a phase transition to another PE phase while with a tetragonal structure and space group of P4/mbm (T 2 phase) at a transition temperature of 639 • C.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [218]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [219]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“When the coupling is turned off, both types of distortions appear at much higher temperatures as compared to the case when they are coupled.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
What the sources say
- Not matchedcites [69]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“For example, in Pb 0.97 La 0.02 Zr 0.95 Ti 0.05 O 3 epitaxial thin films, the phase stability can be controlled by thickness-related strain effect, presenting a depth dependent FE to incommensurate/commensurate AFE phase transition [210].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [210]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirectSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Model understanding of these short-period phases belongs to a different realm than that of the original incommensurate phases, despite they both have transverse lead ion displacements as the main feature.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“similar Pb displacement of”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [206]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“From these recent works, one can see that that the experimental progress goes far ahead of the theoretical one.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“Temperature-dependent dielectric permittivity of a pure NaNbO 3 ceramic shows that the largest dielectric anomaly occurs at the P-to-R phase transition (Fig. 8a) [221].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [221]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“The essence is that the substrate's octahedral tilt pattern can propagate into the film to a small but considerable depth.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“With temperature increasing, two intermediate phases are found to exist in two sequential temperature ranges below the transition temperature.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“The analysis of phase transitions in PHO driven by temperature and hydrostatic pressure unveils a quite different story from PbZrO 3 [213].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
What the sources say
- Not matchedcites [213]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“For example, recent X-ray diffraction experiments on PbZrO 3 /SrRuO 3 /SrTiO 3 (0 0 1) heterostructures indicate a curiously frustrated state of the AFE domains there [17].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [17]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Obviously, epitaxial integration has a huge impact on property of the materials.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“Essentially, the modulation period for the transverse polarization wave is fixed at a series of [55].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [55]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In FE thin films, epitaxial strain alone has shown great influence on the transition temperature [205].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [205]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“However, from a modern perspective, PHO is remarkable in demonstrating that the incommensurate phase can be formed by antiferrodistortive soft mode [201].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
What the sources say
- Not matchedcites [201]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“This indicates there is a mixed feature of ferroelectricity and antiferroelectricity of Pb 2+ displacement in PbZrO 3 thin films, resulting in the fluctuation of uncompensated polarization as shown in Fig. 7b and 7c.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [15]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“More surprisingly, the structure is accompanied with a longitudinal component in the modulation wave.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“In fact, due to the low energy barrier between the AFE and FE phases, e.g., in the PbZrO 3 system [208], the polarization/phase structure can be easily tuned by external stimuli, such as electric field, temperature, pressure, chemical doping, etc.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [208]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The third group consists of exotic structures, primarily manifested by FE cycloidal phase, which is activated by electron beam irradiation [103].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [103]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Similar structures have been also experimentally discovered in PbZrO 3 thin films.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [121]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“TiN capping layer is commonly used as a mechanical confinement to engineer the FE/AFE behavior in Hf 1-x Zr x O 2 films [43,139].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [43]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [139]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“During the PE-AFE phase transition, which is essentially related to the origin of antiferroelectricity, an unusually high transition temperature is observed in epitaxial PbZrO 3 thin films.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [15]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The control of domain states at nanometer scale (~10 nm) has been realized in FEs [207]”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [207]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“This can be attributed to the synergistic effect of combined variables, e.g., strain gradient and boundary conditions, which play as additional stimulus for flourish of the commensurate structure.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Obviously, that is a huge complication to the theoretical modeling, where the PbZrO 3 films were commonly considered as only homogeneously strained [133] or not strained at all [212].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [133]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [212]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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- Not matched
In the paper
“To successfully verify its AFE characteristics, additional elements are usually introduced to stabilize the AFE structure, e.g., SrZrO 3 -NaNbO 3 solid solutions [217].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [217]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“These different orthorhombic phases are distinguished by two factors, i.e., the atomic displacement of Nb 5+ and the oxygen octahedral rotation patterns.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“This, again, suggests a collaborative nature of the coupling between octahedral tilts and antiferroelectricity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
What the sources say
- Not matchedcites [202]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“Indications on the importance of such an effect in PbZrO 3 films are reported by earlier studies performed at Max Planck Institute, where Raman studies show that the presence of mechanical stress may lead to the presence of FE phase in PbZrO 3 /SrRuO 3 /SrTiO 3 heterostructures [123].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [123]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“from being simply strained because of the large lattice mismatch of ~ 6 %, which is relaxed almost completely by forming dislocations near the PbZrO 3 /SrRuO 3 interface.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“Because of the easy volatilization of Na at high temperature during sample preparation, it is very difficult to grow high-quality and stoichiometric NaNbO 3 samples [216].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [216]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
In the paper
“This is manifested by the higher T A for dielectric anomaly and annihilation of 1/ 4 superstructure diffractions as the PbZrO 3 film is grown on SrTiO 3 substrate, which increases by 40 K in comparison with bulk PbZrO 3 [15].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [15]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“At high temperature, NaNbO 3 is PE with a cubic structure and space group of Pm3m (C phase).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [218]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [219]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Owing to the structure sensitivity, many new structures have been discovered recently in PbZrO 3 -based crystals and thin films, all of which share intrinsic unit-cell-scale heterogeneity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
A result the paper reports from its own data — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“The commonly used substrates and electrode layers, such as SrTiO 3 and SrRuO 3 , differs by near -3% from Pb-based AFEs.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
plaincorrelational- Asserted: passes — The authors put it forward as true.
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- Load-bearing: passes — The paper’s conclusions depend on it.
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The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Contrary to the originally conceived transverse modulation waves, those phases appear now as modulated structures with certain degree uncompensated polarization.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In order to shift the AFE transition to room temperature, a second perovskite has been extensively incorporated into the BNT matrix, such as BNT-BaTiO 3 (BNT-BT) [249], BNT-NaNbO 3 [250], BNT-SrTiO 3 [36], etc.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [249]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [250]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [36]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“there is another AFE-like behavior in the doped HfO 2 films, manifested by typical double-hysteresis curves.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [276]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Among them, BNT-BT solid solution is particularly interesting, which not only broadens the temperature region of AFE phase, but also greatly improves the piezoelectric, pyroelectric and energy storage performances due to the inherently rich phase boundaries (Fig. 8d) [237].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [237]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Due to the small energy difference between the competing phases, the structure of NaNbO 3 can be easily tuned by chemical composition, defects, electric field, temperature, epitaxial strain, film thickness and grain size.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
plaindirect- Asserted: passes — The authors put it forward as true.
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- Load-bearing: passes — The paper’s conclusions depend on it.
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In the paper
“As shown in Fig. 10a, HfO 2 thin films undergo monoclinic (M) → orthorhombic (O) → tetragonal (T) → cubic (C) phase transition with increasing formation energy [266].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [266]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The energy between this antipolar phase and the FE phase is slightly different, which makes the reversible phase transition possible [127].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [127]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Further study reveals that the electric field can induce monoclinic (Cc) to rhombohedral (R3c) phase transformation”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [245]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [246]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Besides interfacial engineering, chemical substitution can also stabilize the AFE phase of BFO at room temperature [255], as illustrated by the P-E hysteresis curves of Nd doped BiFeO 3 solid solutions (Fig. 9e).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [255]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“and the tetragonal phase exhibits an unusual combination of in-phase (a 0 a 0 c + ) tilts and antiparallel cation displacements along the polar c axis, indicating the AFE feature [241,242].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [241]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [242]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“and rhombohedral (R3c) and monoclinic (Cc) phases may coexist in its equilibrium state at room temperature [245,246]”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [245]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [246]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“this antipolar phase is equivalent to 8-fold 180 • domain walls, which can be seen as a typical sub-lattice property of HfO 2 -based structure [275].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [275]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Therefore, the antipolar orthorhombic phase is fundamentally distinguished from the non-polar tetragonal AFE phase.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“In 2009, using a combination of high-resolution X-ray diffraction, neutron total scattering, electron diffraction, and X-ray absorption fine-structure measurements, Levin et al. reported that the M 1 phase exhibits orthorhombic structure with centrosymmetric Pbcm space group [230].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [230]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Recent atomic-resolution Cs-corrected scanning TEM study revealed that antipolar orthorhombic Pbca phase with antiparallel oxygen-atom shifts coexist with the FE orthorhombic Pbc2 1 phase in (Hf 0.5 Zr 0.5 )O 2 polycrystalline film (Fig. 10c) [274].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [274]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“However, the evidence of a small remnant polarization, obtained from hysteresis loops and the pyroelectric effect, indicated the presence of weak ferroelectricity [51,226], which was further confirmed in subsequent experiments [227].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [51]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [226]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“To achieve an AFE behavior, extra ZrO 2 are usually introduced to stabilize the metastable state, and the electric field induced nonpolar tetragonal → polar orthorhombic phase transition is widely accepted as the origin of AFE behaviors in the fluorite-type material [273].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [273]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“However, the centrosymmetric structure is not consistent with the presence of remnant polarization.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Fig. 9f shows the phase diagram for rare-earth element substituted BiFeO 3 , and composition of the MPB can be tuned by systematically adjusting the average A-site ionic radius.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“For instance, it was found that tensile-strained NaNbO 3 epitaxial films with thickness of 250 nm are a FE Q phase rather than AFE at room temperature [222,225].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [222]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [225]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“To achieve an AFE behavior, extra ZrO 2 are usually introduced to stabilize the metastable state, and the electric field induced nonpolar tetragonal → polar orthorhombic phase transition is widely accepted as the origin of AFE behaviors in the fluorite-type material [273].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [273]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“By decreasing the A-site ion size, the introduced chemical pressure enhances tilting of the oxygen octahedra and favors the antipolar structure [256].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [256]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Then, the AFE behaviors were obtained in other doped HfO 2 and pure ZrO 2 thin films [262,263].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [262]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [263]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Compared with perovskite-type AFE materials, these fluorite-type AFE materials show more compelling advantages in CMOS compatibility and integration [264,265].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [264]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [265]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“However, a slim FE hysteresis loop with a small remnant polarization was also observed under a weak electric field of 80 kV/cm [229]”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [229]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Later, it is reported that BNT undergoes rhombohedral (R3c, a -a -a -) → tetragonal (P4bm, a 0 a 0 c + ) → cubic phase transitions with increasing temperature”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [241]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [242]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Compared with bulk, AgNbO 3 thin films are poorly studied mainly because of the difficulty in synthesizing high-quality and phase-pure samples [233,234].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [233]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [234]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Furthermore, subsequent studies confirmed the universal behavior in structural and electric properties in BFO doped with various rare-earth elements, including La 3+ [258], Dy 3+ [259], Nd 3+ [255,260].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [258]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [259]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [255]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [260]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boostedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“it indeed becomes one of the most promising materials for future utilization in microelectronic system, not only because of its compatibility with the CMOS technique, but also because of its excellent fatigue resistance in nonvolatile random access memory, energy storage, and negative capacitance [61,280].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [61]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [280]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Rests on an assumption: The origin of Hf1-xZrxO2-based antiferroelectricity and its structure details are still obscure.
- Not matched
In the paper
“In 2007, the first complete double hysteresis loop with a large polarization of 52 μC/cm 2 was obtained by Fu et al. in AgNbO 3 ceramics, where electric field is applied up to 220 kV/cm [229].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [229]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“this kind of fatigue is attributed to the polar-antipolar phase transition, but not to oxygen loss or domain wall pinning”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [274]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“They further demonstrated that partial ordering of Nb displacements induced by coupling between (a -b -c -)/(a -b -c + ) octahedral-tilting and local polar Nb displacements dominate the structural behavior of the M-phase polymorphs [230].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [230]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“For the room temperature FE structure, recent high resolution X-ray diffraction experiment suggests that the structure of BNT is monoclinic (Cc, a -a -c -) [243,244].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [243]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [244]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“An important reason lies in the fact that impurity phases, mainly arising from decomposition of AgNbO 3 , are prone to appear during the film deposition 236]”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [236]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“which was further confirmed in subsequent experiments [227].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [227]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“reinvestigation of phase transition and proposed that BNT has a sequence of several structural phase transitions upon heating [247,248], as given below: R(R3c, FE) ̅̅̅ ̅→ 200 o C R + O(Pnma + R3c, AFE) ̅̅̅ ̅→ 280 o C O(Pnma, AFE) ̅̅̅ ̅→ 320 o C T(P4/mbm + P 4 2 /mnm, PE) ̅̅̅ ̅→ 520 o C C(Pm 3m)”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [247]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [248]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“the fatigued sample can be rejuvenated by applying a slightly higher voltage.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [274]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Among them, BNT-BT solid solution is particularly interesting, which not only broadens the temperature region of AFE phase, but also greatly improves the piezoelectric, pyroelectric and energy storage performances due to the inherently rich phase boundaries (Fig. 8d) [237].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [237]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The interfacial electrostatic engineering can liberate the otherwise metastable AFE state of BFO (Fig. 9d), and the stability of the AFE phase can be further enhanced by tuning the dielectric constant of the neighboring layers [187].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [187]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“it is generally believed that AgNbO 3 undergoes a series of at least five reversible structural phase transitions (Fig. 8b) [228]”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [228]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The interfacial electrostatic engineering can liberate the otherwise metastable AFE state of BFO (Fig. 9d), and the stability of the AFE phase can be further enhanced by tuning the dielectric constant of the neighboring layers [187].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [187]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“HfO 2 thin films can be dominated by the metastable state at ambient conditions thermodynamically and kinetically by doping [267], stress [268], defects [269], thickness [270], and electric field [271].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [267]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [268]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [269]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“This proves that the chemical pressure of the A-site substituted cations can drive the formation of MPB.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“This has been utilized to improve the energy storage density in RFE thin films [289,354].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [289]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [354]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Besides, the hysteresis loop shift by imprint effect can effectively enhance the E BDS and thus the P max .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“The overall polarization can be modulated by introducing high-polarization phase [295], interface engineering [296], strain engineering [205], and orientation control [19].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [295]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [296]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [205]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In 2017, Li et al. [77], reported excellent FE and AFE performances in (3-pyrrolinium) CdBr 3 .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [77]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosted- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Besides, E BDS is inversely proportional to the square root of thickness, d [304]:”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [304]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In this organic-inorganic hybrid perovskite, the AFE phase can be seen as an intermediate phase between the FE phase (<235.2K) and PE phase(>244.2K).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [77]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Recent studies have demonstrated that large strain level of ~ 0.3-1 % can be obtained in AFE PbZrO 3 thin films, as shown in Fig. 13a, which is several times larger than traditional FE and electrostrictive materials [400][401][402].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
What the sources say
- Not matchedcites [400]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [401]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [402]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosted- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Previous studies have demonstrated that introducing nanoscale structural heterogeneity into AFEs generally via chemical doping is an effective approach to lower the energy barrier between the AFE and field-driven FE phases and thus reduce the electric hysteresis [157,[292][293][294].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [157,[292][293][294]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“For instance, Zhang et al. [294] demonstrated that the combination of structure heterogeneity and orientation control in relaxor AFE (Pb 0.97 La 0.02 )(Zr 0.55 Sn 0.45 )O 3 thin films can simultaneously achieve high energy storage efficiency (~98.5 %) and energy storage density (~84.45J/cm 3 ).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [294]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Although AFEs lack piezoelectricity due to the presence of the center of symmetry”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“Eventually, by disrupting long-range ordered AFE domains, relaxor antiferroelectrics (RAFEs) can reduce hysteresis upon applying and removing electric fields due to the fast response of nano-domains [293]”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [293]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Therefore, a synergistic approach with engineered structural heterogeneity and meticulous orientation control can be applied to improve the energy storage density Fig. 11b.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In addition to frequency, many other methods have been applied to modulate the ECE such as doping [5,367] and stress [378].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [5]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [367]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [378]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“That is to say, accompanied with large E BDS , small P r and small hysteresis enable the simultaneous enhancement of large J reco and η [293].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [293]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim have been checked yet.
In the paper
“As stated in Section 3.5, the frequency of the external electric field significantly influences the ECE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“In 2019, Wu et al. [286], reported an above-room-temperature AFE in organic-inorganic Ruddlesden-Popper hybrid perovskite, (i-BA) 2 CsPb 2 Br 7 (i-BA is isobutylammonium).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [286]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“For practical applications of the electrocaloric cooling technology, large ΔT and ΔS are needed to guarantee the cooling energy density Q.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“There are many factors that can affect E BDS , such as band gap (E g ) [297], porosity/cavity [298], grain size [299], thickness [300], sample geometry [301], and etc.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [297]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [298]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [299]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Since then, the ECE of AFEs has attracted broad attention due to the large negative ΔT [5,[363][364][365].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [5]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [363]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [364]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“a sharp deformation can also be induced by phase transitions from AFE to FE phase and AFE to PE phase under electric field or heating, especially in the direction along the field [399].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
What the sources say
- Not matchedcites [399]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“La substitution can divide the lattice into different pieces, leading to the generation of nano-domains with opposite polarization [283].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [283]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“In that work, introducing La 3+ and Sn 4+ dopants into AFE PbZrO 3 can engineer the structural heterogeneity and disrupt the long-range ordered AFE domains, which can effectively decrease the polarization hysteresis (E AF -E FA ) [294].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [294]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Thus, bandgap engineering is an effective method to improve energy storage properties [303].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [303]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Imprint is related to the presence of an internal (built-in) electric field within the FE/AFE films, which causes a shift of the P-E loop along the field axis [131,353].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [131]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [353]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Among dielectric materials, including linear dielectrics (LDs), FEs, and relaxor FEs (RFEs), AFEs, AFE materials afford advantages for high J reco by steeply increasing the polarization at a relatively high electric field E AF and fully releasing the stored charge at another high electric field E FA , as shown in Fig. 11a.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Rests on an assumption: Capacitors generally have low energy densities (typically less than 10 J/cm3) relative to other energy storage systems.
In the paper
“As a result, thin films [305] show much higher energy density than bulk materials due to the larger E BDS”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [305]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“From the right panel of Fig. 12a, similar to the temperature induced ECE evolution, the electric field driven ECE also evolves from negative to positive for AFEs.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“the hybrid organic-inorganic perovskite AFEs are expected to show significant potential in energy storage and electrocaloric cooling applications [286,287].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [286]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [287]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plainconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“The negative and positive ECE in AFEs can be combined to increase the value of Q [367][368][369][370].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [367]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [368]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [369]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“AFE phase in perovskite oxides can be stabilized by decreasing t within the range of perovskite structural stability [355].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [355]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Rests on an assumption: The tolerance factor t is a critical indicator for the phase stability of perovskite structure.
- Not matched
In the paper
“In Ruddlesden-Popper structure, a series of A 3 B 2 O 7 type compounds are proposed as a hybrid improper AFE, such as high-temperature antipolar Pnab structure Sr 3 Zr 2 O 7 [284].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [284]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“It has been reported that the formation of defect dipoles by ion bombardment can induce the imprint and delay low-field polarization saturation in RFE Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 thin films [289].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [289]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The switching dynamics analysis based on the nucleation-limited-switching model has reveal a characteristic switching time as short as 3 ns [90], indicating an ultrafast charging time in AFE films.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [90]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The volume change accompanied with field-driven phase transition is regarded as the main reason for the electric field induced strain in AFE materials other than domain reorientation, inverse piezoelectric effect, or electrostriction [88].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
What the sources say
- Not matchedcites [88]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The antiferroelectricity can be attributed to the synergistic dynamic motion of organic i-BA cations and inorganic Cs atoms.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [286]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“antiferroelectricity was reported to exist in a wide range of unconventional structures as well, which highly broadened the AFE family and understanding of antiferroelectricity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Although AFE thin films exhibit high potential in high energy density and pulse power capacitor applications, the state-of-the-art AFE capacitors currently still face the challenge of low efficiency (η = J reco /J total ) caused by large hysteresis.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“Consequently, phonon-phonon scattering phase space has a large change across the phonon spectrum before and after the phase transition, leading to a high switching ratio (>2.2).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.7. Thermal switching
What the sources say
- Not matchedcites [9]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“This indicates that a new type of AFE dipole modulation develops from fourfold to eightfold periodicity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [14]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“As shown in Fig. 14d, by plotting the polarization P versus electric field in the AFE layer E a , two separate negative slope regions were discovered, which confirmed the existence of negative capacitance.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [61]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirectSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Recently, the concept of four-state AFE-based random access memories (AFRAM) was proposed with faster write/read cycles and enhanced data storage capability [8].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [8]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Another AFE-based model for nonvolatile memory is proposed in doped-ZrO 2 , where one branch of the double hysteresis loop can be centered by built-in electric field [280].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [280]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“In a word, AFE could not be simply seen as an analogue of antiferromagnetic material as initially considered, and the origin of AFE could be due to multiple effects.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: unclear — It is unclear whether it could be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Rests on an assumption: Multiple soft modes during AFE phase transition display complex results of structure and electrical behavior, which obscure the origin of AFE order.
- Rests on an assumption: The lack of defect-free AFE material usually results in extrinsic behaviors.
None of the sources cited for this claim have been checked yet.
In the paper
“During the polarization alignment process, the FE state passes through a transient state characterized as: d 2 G/dP 2 < 0 (16 )”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“The negative capacitance in AFE was firstly reported in PbZrO 3 thin films (Fig. 14c) [44].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [44]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“For AFE PbZrO 3 , recent study revealed that the switchable polar and nonpolar state can also significantly influence the barrier between two electrodes with an ON-OFF ratio up to 10 7 , shown in Fig. 15b [422].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.6. Tunnel junctions
What the sources say
- Not matchedcites [422]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“For FEs, it was recently confirmed that the intrinsic inversion asymmetry of lattice can induce the bandgap photovoltages.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.8. Photovoltaics
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“(a,b) Electric field lowers the energy of the FE phase with respect to the AFE and paraelectric phases.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [49]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Steady-state photovoltaic response of the AFE capacitor, showing an open-circuit photovoltage more than 100 V.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [10]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plainSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“In a word, AFE could not be simply seen as an analogue of antiferromagnetic material as initially considered, and the origin of AFE could be due to multiple effects.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Rests on an assumption: Multiple soft modes during AFE phase transition display complex results of structure and electrical behavior, which obscure the origin of AFE order.
- Rests on an assumption: The lack of defect-free AFE material usually results in extrinsic behaviors.
In the paper
“The giant tunneling electroresistance was attributed to the cooperation of macroscopic polarization ordering and Fowler-Nordheim conduction.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.6. Tunnel junctions
What the sources say
- Not matchedcites [422]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“This suggests a strong correlation between different dipole periodicity for the stepwise AFE-FE phase transitions and shed light on the electric field control of those nanodomains for memory devices.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [14]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“The applied electric field can increase one of the two energy minima with opposite directions in G(P) dependence and drive the polarization to the other one.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
In the paper
“However, recent studies have revealed the existence of noncollinear polarization arrangement in AFE thin films [6].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [6]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“The ISE model suggests that the stray field between neighboring domains contributes to the inhomogeneous electrostatic energy.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [417]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Correspondingly, the read process is two directional for both positive and negative voltage.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [8]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“While S-shaped P-E curves have been derived in the Landau-Ginzburg-Devonshire (LGD) theory framework with the double-well free energy landscape F as a function of polarization P [412][413][414]”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [412]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [413]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [414]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Similar process can be realized by writing at an opposite direction and read bidirectionally, leading to 4 optional read-out states.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [8]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“AFEs can be seen as a wellacknowledge two-state system in a certain degree with respect to the electric field induced AFE-FE transition and the free energy landscape in AFE is shown in Fig. 14a 61].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [61]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“For practical applications in memory devices, the read/write time is required to be at the range of 10 ns or less to meet the industry standards [264].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [264]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“This suggests a strong correlation between different dipole periodicity for the stepwise AFE-FE phase transitions and shed light on the electric field control of those nanodomains for memory devices.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [14]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelationalSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“Recently, a built-in bias was generated in AFE Hf 0.25 Zr 0.75 O 2 -based AFTJ to form 2 stable nonvolatile states by using asymmetric work function electrodes [423].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.6. Tunnel junctions
What the sources say
- Not matchedcites [423]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
- Not matched
In the paper
“(c) Polar O FE Pbc2 1 to antipolar O AFE Pbca phase in a fatigued (Hf,Zr)O 2 thin film.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [274]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“In the prototype AFRAM logic operation shown in Fig. 15a, based on the typical double hysteresis loops, the write voltage can fully saturate the AFE structure at one direction.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [8]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“Solid-state thermal conductivity switching has been reported in PbZrO 3 thin films recently by Liu et al. [9], as shown in Fig. 15c.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.7. Thermal switching
What the sources say
- Not matchedcites [9]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“Among the investigated materials, the largest photoelectric field was discovered recently in PbZrO 3 polycrystalline thin films, which is up to the level of million voltage per centimeter [10].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.8. Photovoltaics
What the sources say
- Not matchedcites [10]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“Recently, the in-situ observation of AFE structural evolution is achieved in PbZrO 3 thin films[14].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [14]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
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In the paper
“To solve this issue, Park et al. proposed an alternative model, i.e., the inhomogeneous stray-field energy (ISE) model to explain the negative capacitance in multidomain FE films [417].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [417]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“As a result, the pined polar state can generate the bandgap photovoltages as shown in Fig. 15d [10].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.8. Photovoltaics
What the sources say
- Not matchedcites [10]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
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In the paper
“As the external electric field is loaded, the primitive unit cell of PbZrO 3 experiences a substantial change at the AFE to FE phase transition.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.7. Thermal switching
What the sources say
- Not matchedcites [9]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
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In the paper
“(d) Wake-up effect in (Hf,Zr)O 2 thin films, the antiferroelectric behavior exist only a few switching cycles and transform into ferroelectric behavior.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [276]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“In fact, the negative capacitance was not exclusive in FEs but prevails in any two-state system with an intrinsic energy barrier between states [411].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [411]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“the segments BC and B'C' represent the negative capacitance (C < 0) regions”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [61]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“Repeatability of switching thermal conductivity after 10 7 electric cycles.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [9]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“The observation of weak ferroelectricity especially in thin film form [38], size effect [115,116], and incommensurate structure [172,210] makes the intrinsic structure of AFEs deceptive.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [38]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [115]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [116]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [172]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [210]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
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A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“The discovery in AFE zirconia films further supports that the negative capacitance can be expected in any two-state system with polarization instability, which broadens the understanding of the negative capacitance.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
plainconditionalSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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In the paper
“AFE negative capacitance was also realized in fluorite-structured AFE ZrO 2 thin films very recently (see Fig. 14d-e) [61].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [61]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“The negative capacitance in PbZrO 3 thin films was proposed to be four times than that in FE due to the rich local regions of negative capacitance effect, which makes it more competitive in future application.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [44]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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In the paper
“Although the electric fieldinduced polar state in AFEs is metastable, the absorbed light energy can help to pin and stabilize the polar state after the external field was removed.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.8. Photovoltaics
What the sources say
- Not matchedcites [10]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
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- Not matched
- It may state two separate claims as one. 137
- Probably not a substantial claim. 62
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“For example, bulk PLZT system has an ECE strength as large as 0.25 K cm/kV while the PLZT film system only has a value around 0.025 K cm/kV, almost one order of magnitude smaller.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
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It may state two separate claims as one.
In the paper
“In 1998, a thickness driven AFE-to-FE phase transition was first reported in PbZrO 3 thin films [57].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.2. Timeline of notable events
What the sources say
- Not matchedcites [57]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
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Probably not a substantial claim. The paper’s conclusions may not depend on it.
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A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Moreover, for many device applications, AFE is preferred in thin film form.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
plain- Asserted: passes — The authors put it forward as true.
- Checkable: fails — It may be too vague to check against evidence.
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Probably not a substantial claim. It may be too vague to check against evidence. The paper may give no reason why it holds.
In the paper
“The second attribute can also be present without the presence of the first one [29], which is also not considered as an AFE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.1. Definition of antiferroelectricity
What the sources say
- Not matchedcites [29]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
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Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
In the paper
“However, subsequent experiments found that the anomalously large flexoelectric coupling was not observed in AFE materials, which mildly questioned the flexoelectric effect as the origin of antiferroelectricity [68].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
What the sources say
- Not matchedcites [68]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedged- Asserted: passes — The authors put it forward as true.
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- Load-bearing: fails — The paper’s conclusions may not depend on it.
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Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
In the paper
“At the current state of the art, the understanding of the bulk AFEs is now well systematized and the standing questions, if not yet answered, are now identified solidly [11].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
What the sources say
- Not matchedcites [11]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosted- Asserted: passes — The authors put it forward as true.
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It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“A spring of recent experimental and theoretical findings have produced a plethora of diverse and occasionally conflicting accounts, which clearly demand a unified description to navigate the field.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: fails — It may be too vague to check against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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Probably not a substantial claim. It may be too vague to check against evidence. It may state two separate claims as one.
In the paper
“The first AFE, PbZrO 3 , is discovered in the early 1950s [46].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.2. Timeline of notable events
What the sources say
- Not matchedcites [46]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
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Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“As a result, AFE thin films have become an important branch of ferroic materials due to their diverse range of properties that are tunable between different states.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Analogous to FEs, PbZrO 3 also undergoes a structural phase transition to a high-symmetry phase above a transition temperature (T A ), and a sharp dielectric peak can be observed around T A ≈ 230 • C.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.2. Timeline of notable events
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Despite that, none of the known AFE oxides is found to conform to this collinear two-sublattice model, the model highlights the essence of individual sub-unit cells for the definition of antiferroelectricity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.1. Definition of antiferroelectricity
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
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Probably not a substantial claim. The paper’s conclusions may not depend on it.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“However, this is not the case in AFE thin films, which strongly differ from the bulk materials [12] and whose properties and functional behaviors are more of a mystery [13][14][15].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
What the sources say
- Not matchedcites [12]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [13]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [14]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boostedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“However, most previous articles, including reviews, mainly focus on bulk ceramics [21][22][23], and a comprehensive guideline is still missing on establishing a detailed structure-property relationship and deterministic realization of desirable physical properties in thin-film AFEs, which strongly hinders their practical applications.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
What the sources say
- Not matchedcites [21]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [22]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [23]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
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It may state two separate claims as one.
- Not matched
In the paper
“Inelastic X-ray scattering and Brillouin light scattering experiments suggested that the phase transition in PbZrO 3 , the most widely studied AFE crystal, was driven by flexoelectric coupling with polar soft mode at Brillouin zone center (Γ point), which gives rise to a missed incommensurate structural modulation [30].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
What the sources say
- Not matchedcites [30]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Subsequent to its initial observation, this behavior has been consistently observed in various AFE thin films, and it is commonly attributed to surface and/or strain effects [18,38,58].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.2. Timeline of notable events
What the sources say
- Not matchedcites [18]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [38]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [58]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Proposed mechanisms include flexoelectric coupling with single soft polar optic mode [30], multiple soft (zone-boundary and zone-center) modes coupling [42], and order-disorder transition scenarios [63], which will be discussed in detail in the following section.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.2. Timeline of notable events
What the sources say
- Not matchedcites [30]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [42]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [63]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“(Hf 1-x Zr x )O 2 is commonly seen as an AFE when nonpolar-polar switching can be induced by an external electric field, but antiparallel dipolar displacements in the nonpolar phase have not yet been clearly identified [27,28].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.1. Definition of antiferroelectricity
What the sources say
- Not matchedcites [27]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [28]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Pertinent to structure diversities in AFE thin films, this gives rise to abundant exotic phenomena, including the unusual structural phase transition [17] and complex ferrielectric-like behavior with non-zero remnant polarization [15,18].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1. Introduction
What the sources say
- Not matchedcites [17]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [15]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [18]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Therefore, it can be addressed that the structural order parameter ξ is correlated with the ∑ and R modes and has a repulsive interaction with the polar-mode-related order parameter P.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“However, anomalous superstructure and physical properties revealed by X-ray diffraction, volume expansion, field-dependent dielectric constant and specific heat suggest that PbZrO 3 is not FE, but probably the first AFE material ever known [48,49].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.2. Timeline of notable events
What the sources say
- Not matchedcites [48]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [49]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“The contribution from FE structure leads to an increase in the remnant polarization of the PbZrO 3 thin films as the film thickness decreases, resulting in a mixed feature of FE and AFE behavior in the AFE films, as illustrated in Fig .5a [18].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [18]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“It is certain that the dielectric anomaly and hysteretic behavior indicate the presence of different structural phases during the cyclic measurement of the physical properties, suggesting the first order transition.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“Additionally, compressive strain can enhance the stability of AFD and, subsequently, enhance the antiferroelectricity [134].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [134]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In addition, few other approaches have also been reported: a first-principles-based model with strong coupling between Ʃ and R modes [69], bi-linear coupling [70] and dipole-dipole interaction [71] as a possible origin of the AFE lattice instability, etc.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
What the sources say
- Not matchedcites [69]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [70]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [71]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Despite ongoing debates on the fundamental basis of AFEs, there is a consensus regarding their macroscopic performance and characteristics.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2. Phase transitions in antiferroelectrics
plain- Asserted: passes — The authors put it forward as true.
- Checkable: fails — It may be too vague to check against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: fails — The paper may give no reason why it holds.
Probably not a substantial claim. It may be too vague to check against evidence. The paper’s conclusions may not depend on it. The paper may give no reason why it holds.
In the paper
“Functional oxides generally exhibit significant anisotropy in crystallography, and their physical properties may differ significantly with the change in crystallographic orientation [142].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [142]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Similar to FEs, knowledge about the AFE order and its size effect is essential for both fundamental understanding to the nature of antiferroelectricity and for creating deterministic performance in functional devices [115].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [115]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: unclear — It is unclear whether it could be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“The calculations further indicate that the FE phase is stabilized under compressive epitaxial strain, while the AFE Pbam phase is favored under tensile strains (Fig. 5b).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [133]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“By varying the film thickness, the remnant polarization has a maximum at an intermediate thickness where the polar orthorhombic structure dominates the FE behavior, while decreasing (increasing) the thickness would lower the remnant polarization [126], and the more energetic-favorable AFE tetragonal (PE monoclinic) phase would dominate the electrical behavior [125][126][127].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [126]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [125]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [127]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Taking the prototypical AFE PbZrO 3 as an example, as shown in Fig. 3a, thin films exhibit a modified phase transition order with diffuse characteristics, while bulk PbZrO 3 undergoes a sharp first-order phase transition from an AFE phase to a PE phase at a critical temperature of ~232 • C.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In addition, the transition temperature of PbZrO 3 thin film is found to be higher than that of bulk, which effectively broadens the temperature region of the AFE phase [13,15].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
What the sources say
- Not matchedcites [13]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [15]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In this case, the coexistence of different structure periods, i.e., ↑↑↓↓ and ↑↑↓, are reported and correlated with thickness scaling [121].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [121]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“By removing the mechanical-clamping contribution from the substrate, it delivered more intrinsic behavior of AFEs and proposed the distortion of surface structure, rather than substrate-induced strain, as the origin of AFE size effect [120].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [120]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“This ferrielectric structure exists on SrTiO 3 substrates and disappear on KaTaO 3 substrates, which can be attributed to the epitaxial compressive strain that may induce the fluctuation of the ferrielectric structure as theoretically predicted by DFT calculations [122].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [122]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Xu et al. demonstrated the intrinsic size effect in lead-free AFE NaNbO 3 free-standing membranes, revealing the emergent ferroelectricity as the thickness decrease and coexistence of FE and AFE orders at an intermediate film thickness [120].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [120]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“For instance, in Nddoped BiFeO 3 thin films grown on Pt/Si substrate, a coexistence of AFE, FE and PE phases was reported, while bulk counterpart only exhibits single phase AFE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.2. Strain engineering
What the sources say
- Not matchedcites [140]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plainSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“In contrast to FEs, AFEs exhibit a null macroscopic polarization owing to their mutually compensated dipoles at the sublattice scale.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.2. Electric field induced transitions
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“As temperature decreases to the transition temperature T A , the dielectric permittivity reaches a high value and then drops steeply at T < T A .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“In other word, the AFE transition may also arise from a kind of frustrated phasetransition order near the Curie temperature.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: fails — The paper may give no reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. The paper may give no reason why it holds.
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“The ferroelectricity in ultrathin films is promising for highly scaled next-generation Si electronics beyond 2D limit.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“This FE structure is energetically favorable below certain critical thickness due to surface effect [115] or strain effect [123], and typically exists near the film-bottom electrode heterointerface.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [115]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [123]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“For epitaxial thin films, their orientation is determined by the underlying substrates and their performance can be enhanced by selecting suitable substrate orientation [143].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [143]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In parallel, multimode Ʃ, R, and S trilinear coupling was proposed to account for the AFE phase transition [41,42].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
What the sources say
- Not matchedcites [41]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [42]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Overall, the phase transition in thin films behaves drastically distinct from that in the bulk owing to complex competition between the FE and AFE orders, and many aspects of this behavior remain open questions.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 2.1. Temperature-driven transitions
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“Specifically, the Ʃ mode outweighs the R distortion mode, which is associated to the antiphase octahedral rotation and results in an antiferrodistortive (AFD) character of oxygen displacement.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
What the sources say
- Not matchedcites [72]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“The mixed feature of FE and AFE are commonly seen in AFE thin films, and its microstructures exhibit complex constitutions due to the close energy barrier of the polar and antipolar phases.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“As the thickness decreases below 3 nm, Cheema et al. [128], recently reported an AFE-FE phase transition that occurs, and the orthorhombic FE structure can be stabilized down to 5 Å [128].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.1. Size effect
What the sources say
- Not matchedcites [128]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“In AFEs, a smaller A-site dopant or bigger B-site dopant can stabilize the AFE phase.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“Apart from the AFE in Hf 1-x Zr x O 2 thin films, the AFE behavior is usually discovered in doped HfO 2 thin films with dopant size smaller than Hf, while the dopants with bigger size only result in FE behavior [43].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [43]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Pertinent to the atom occupancy, the anti-site defects, manifested by a false positional occupation, provides a new approach to break the inversion symmetry and altering the electric property [163].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [163]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In PbZrO 3 , by using a first-principles-based effective Hamiltonian approach, Ponomareva et al. predicted that the phase transition pathway of PbZrO 3 also depends on the crystallographic orientation with respect to the applied electric field [145].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [145]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“A larger average electronegativity value signifies the stronger the polarity and a closer proximity to an ionic bond, while a smaller average electronegativity value implies the weaker the polarity and the closer proximity to a covalent bond.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. It may state two separate claims as one.
In the paper
“Similar behavior can also be discovered in Al-doped HfO 2 thin films [179], where Al is also smaller than Hf.The AFE behavior is strengthened with Al content increase to 8.5 %, and a PE-FE-AFE phase transition can be realized during increasing the Al content [179].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [179]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“As a result, the smaller dopants tend to stabilize the nonpolar tetragonal phase, which can be seen as the origin of antiferroelectricity [180].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [180]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“This average difference value in electronegativity between cations and anions indicates the polarity of the chemical bond.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: fails — The paper may give no reason why it holds.
Probably not a substantial claim. The paper may give no reason why it holds.
In the paper
“In AFEs like PbZrO 3 , the orthorhombic AFE structure results in 60 • , 90 • , 120 • and 180 • domains [153].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [153]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“Chemical doping has been widely used to mediate the competitive orderings in functional oxide systems and induce intriguing phenomena including enhanced piezoelectricity near the morphotropic phase boundary (MPB), high energy storage performance, metal-insulator transition, and high-temperature superconductivity [7,[165][166][167][168].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [7,[165][166][167][168]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
In the paper
“As a result of defect-related switching dynamics under different frequency of the same electric field, a large adiabatic temperature change of 30 K from positive ECE can be achieved at 100 Hz while a temperature change of -10 K due to negative ECE was obtained at 10 kHz [164].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [164]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“For PZT system, compositional doping can stabilize either the AFE or FE order, and this stabilization can be rather successfully interpreted in terms of adjusting the Goldschmidt tolerance factor t [169]:”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [169]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In comparison, ZrO 2 with tetragonal matrix displays reduced energy barrier for monoclinic phase formation and reduces the field-induced FE behavior [190,191].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [190]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [191]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In their experiments, applying an electric field along a specific direction triggered a series of transitions to various FE-like phases, where the polarization did not necessarily align along the field.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.3. Orientation control
What the sources say
- Not matchedcites [55]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“On the one hand, Sr 2+ [111] and La 3+ [170] can stabilize the AFE phase and bring a higher E AF than undoped PbZrO 3 , on the other hand, the B-site dopant with a smaller radius, such as Sn 4+ and Ti 4+ [171], has been employed to decrease the E AF and minimize the hysteresis loop area.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [111]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [170]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Those superlattices with large periodicities of 20/20 and 38/38 exhibit FE ordering, while for superlattices with smaller periodicities of 7/7 and 15/15 [87], the strain-induced ferroelectricity in SrTiO 3 and the layer-spacing-dependent coupling are proposed to be the leading mechanism for producing AFE-like behavior [87].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [87]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Previous studies on CaZrO 3 -NaNbO 3 [175], AgNbO 3 -CaZrO 3 [176], NaNbO 3 -SrZrO 3 [177] suggest that reducing the tolerance factor t and increasing the electronegativity difference X favor antiferroelectricity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [175]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [176]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [177]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“This would give rise to AFE-to-relaxor FE phase transition and to boost the energy storage performance [173].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [173]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“It is found that the (PbTiO 3 ) 4 /(SrTiO 3 ) 4 superlattice presents an overall antipolar 180 • domain structure at zero field and undergoes a field-induced phase transition into a polar state for fields of a few megavolts per centimeter.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [185]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In 2002, the first one is observed in KNbO 3 /KTaO 3 1/1 superlattices (samples in which each KNbO 3 and KTaO 3 sub-layer are 1 unit cell thick, respectively), while bulk KTaO 3 and KNbO 3 are FE and PE, respectively, the superlattice appears AFE based on an increase in the dielectric constant with applied DC bias [86].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [86]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Halliyal et al., found that besides tolerance factor t, the electronegativity difference X is another important parameter that determine the stability of the perovskite ABO 3 structure [174].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [174]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“By connecting two 180 • domains with a π phase shift, the dipoles in the domain wall are parallel, making the antiphase boundary polar.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [64]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Moreover, chemical doping would induce complex phase diagrams, resulting in the identification of abundant structural phases, e.g., the incommensurately modulated structure in (Pb,La)(Zr,Sn,Ti)O 3 system [172].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.6. Doping effect
What the sources say
- Not matchedcites [172]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgeddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Nevertheless, recent findings report that defect engineering, an intentional and purposeful introduction of defects, can enhance the material properties and even create emergent functionalities [13,161].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.5. Defect engineering
What the sources say
- Not matchedcites [13]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [161]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“FE and AFE phases in single crystals are usually composed of domains with different orientation of polar/antipolar dipoles to minimize the depolarization field energy and/or elastic energy [146,147].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.4. Domain engineering
What the sources say
- Not matchedcites [146]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [147]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“Instead of tilting by a fixed angle to comply with mechanical compatibility for neighboring domains, as observed in ordinary FEs, it is found that most of domains are non-tilted and thus should bear additional inhomogeneous mechanical stresses.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [17]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Besides the AFE orthorhombic phase and high-field FE rhombohedral phase, other intermediate low-field FE phases were predicted”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [55]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“The electric fieldtemperature phase diagram of bulk PHO was given by Fesenko and Balyunis, suggesting similar multiphase transition versus electric field as occurred in PbZrO 3 [56].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
What the sources say
- Not matchedcites [56]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Most of the above results were obtained in chemically (Ti and Sn) modified PbZrO 3 .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“The room temperature AFE phase of PHO has the same phase symmetry as that of PbZrO 3 , while PHO has an even more complex phase diagram.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Traditional lead based AFE materials, such as PbZrO 3 , still occupy most of the share in relevant research.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2. Lead-free perovskites
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: fails — The paper may give no reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. The paper may give no reason why it holds.
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“However, this may change in an abrupt manner when the external conditions are varied, which is even more generous in epitaxial thin films.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“The films are, therefore, strongly relaxed through misfit dislocations [123] and this strain relaxation should likely impact the film stronger than the octahedral tilt connectivity effect.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
What the sources say
- Not matchedcites [123]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“One of the most stunning discoveries is observation of the devil's staircase in electron diffraction [209].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [209]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: fails — It may be too vague to check against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. It may be too vague to check against evidence. The paper’s conclusions may not depend on it.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“On the other hand, analogous to superior electrical conductivity identified at charged FE domain walls, one may also expect potential presence of conductivity difference between nanoscale polar regions and mesoscale non-polar regions.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“However, regarding the number of intermediate incommensurate phases, one or two, a consensus has not been reached so far [201,214].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
What the sources say
- Not matchedcites [201]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [214]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Considering that the AFE lattice distortion is inhomogeneous, a more complex strain distribution is possibly developed inside PbZrO 3 films.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Rests on an assumption: The AFE lattice distortion in PbZrO3 films is inhomogeneous.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Being the same as PbZrO 3 , NaNbO 3 was initially considered as one of the new FE materials [32,215], since double hysteresis loop is even more difficult to be obtained in pure NaNbO 3 .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [32]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [215]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Moreover, such interfacial engineering strategy is post-annealing-free and thus is beneficial to the CMOS process integration which need a low thermal budget [193].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [193]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In that work, the HfO 2 interfacial layers are reported to boost the formation of (1 1 1)-texture orthorhombic ZrO 2 to enhance the ferroelectricity, while the TiO 2 interfacial layers favor the formation of (1 1 0)-textured tetragonal ZrO 2 to support antiferroelectricity.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [193]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“While in Sndoped PbHfO 3 crystals, the octahedral tilts form earlier on cooling than the incommensuration, and the octahedral tilts seem to aide in moving the AFD susceptibility maximum from zone center towards the incommensurate position [202].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
What the sources say
- Not matchedcites [202]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“The first complete electric field-temperature phase diagram of bulk PbZrO 3 was proposed by Fesenko in 1978 (Fig. 7d) [55].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [55]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“PbZrO 3 is the most investigated material in the field of AFEs.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: fails — The paper may give no reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. The paper may give no reason why it holds.
In the paper
“Atomic scale TEM revealed the”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [121]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“PbHfO 3 (PHO) is often considered as the second model of AFEs and is commonly overshaded by the research on PbZrO 3 .”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
In the paper
“Recently, a question of the ground state of PbZrO 3 has attracted attention due to the rather odd discovery of ferrielectric state having lower energy than the well accepted AFE state at 0 K, according to first principles calculations [122].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [122]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“previous study has also revealed the preferential creation of polar translational boundary by interface engineering in PbZrO 3 thin films [154].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [154]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“It undergoes a PE to AFE phase transition around 230 • C and its AFE orthorhombic unit cell contains 8 formula units (i.e., pseudocubic unit cells), where Pb ions displace antiparallelly along [1 1 0] pc direction (Fig. 7a).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“With further temperature decreasing, several orthorhombic phases appear, including Cmcm (T 1 phase) at 575 • C, Pmnm (S phase) at 519 • C, Pmnm (R phase) at 479 • C, and to Pbcm (P phase) at 359 • C [218,219].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [218]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [219]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Compared with the dielectric behavior and superstructure line from X-ray photography of PbZrO 3 , PHO is recognized as AFE soon after the AFE study of PbZrO 3 [50].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
What the sources say
- Not matchedcites [50]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Taking the discovered ferrielectric-like structure into account, it offers chances to achieve ultra-fine grid of polar entities within the nonpolar matrix, which can be used for multistate information storage.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plainconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“Moreover, second-harmonic generation and hysteresis measurement detected the polar structure at room temperature and the incipient ferroelectricity above the transition temperature.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [15]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Different from the previous two groups, the main distortion takes place in the oxygen octahedral sublattices, while the anti-polar displacements of Pb 2+ ions in the original AFE phase are preserved [102].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [102]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Among these orthorhombic phases, the P and R phases are AFE, while S and T 1 phases are PE [218,220].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
What the sources say
- Not matchedcites [218]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [220]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“One interesting approach that has been suggested [14] to simulate the displacement patterns in PbZrO 3 films is to use the Ising model with competing interactions [211], herein the coefficients are determined by first-principles calculations and can be slightly adjusted to account for defects in the material.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [14]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [211]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“The instability under electron beam makes it difficult to capture the real ground state to some degree but provides opportunities to observe the pathway of electron beam induced phase transition.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Therefore, lead-free AFE materials with a perovskite structure such as NaNbO 3 , AgNbO 3 , (Bi 0.5 Na 0.5 )TiO 3 , rare-earth element doped BiFeO 3 thin films have attracted growing interest in recent years.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2. Lead-free perovskites
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Rests on an assumption: Lead-based AFE materials contain heavy metal lead that is toxic to the environment and human body.
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Most identified structures are not directly accessible in first-principles-based modeling, and considerable breakthroughs are still needed on the theoretical aspect.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“However, the PbZrO 3 /SrRuO 3 /SrTiO 3 heterostructures are rather far from being simply strained because of the large lattice mismatch of ~ 6 %, which is relaxed almost completely by forming dislocations near the PbZrO”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [123]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In ZrO 2 thin films, with introducing the mechanical stress induced by the TiN capping layer, transformation from PE amorphous phase to AFE tetragonal phase can be realized [192], while etching the TiN layer away leads to the transition from the AFE tetragonal phase to FE orthorhombic phase [192].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.7. Superlattice and interface control
What the sources say
- Not matchedcites [192]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“The initial understanding of PHO is the isostructure of PbZrO 3 with Pbam symmetry.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.2. PbHfO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
In the paper
“This may either arise from the surface effect where the surface energy is dominant in straining the thin films, or from intra-domain strain that helps to minimize the material micro twists near the interface [17].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
What the sources say
- Not matchedcites [17]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“Among lead-free AFEs, NaNbO 3 is particularly interesting due to the low cost of raw materials and rich structural motifs in the phase diagram.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.1. NaNbO 3
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
In the paper
“where both M 2 and M 3 phases are AFE, the orthorhombic O phase, tetragonal T phase and cubic C phase are PE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [228]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“By low voltage cycling, the antipolar phase can be further stabilized and replace the FE Pbc2 1 phase, which causes the fatigue in pristine FE thin films [274].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [274]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Although the detailed crystal structure of the new phase is still controversial, the existence of antipolar phase in BFO is beyond doubt, which introduces antiferroelectricity to multiferroics in the doped BFO system.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“The ferroelectricity and antiferroelectricity of fluorite structure was first discovered in 2007 and experimentally verified in Si-doped HfO 2 thin film in 2011 [261].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [261]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
A result the paper reports from its own data — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Fig. 9a shows various low-energy phases of BFO, including the ground state FE structure with R3c symmetry, and two antipolar states with Pbam and Pnma symmetry.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“BiFeO 3 (BFO) is the most studied and important multiferroic material that was first discovered by Royen and Swars in the late of 1950s [251].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [251]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
A result the paper reports from its own data — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“As shown in Fig. 9b, epitaxial strain can modify the relative stability of the AFE phases with respect to the FE R3c phase, while the AFE phase remains metastable for all lattice constants.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“phase can be further stabilized and replace the FE Pbc2 1 phase, which causes the fatigue in pristine FE thin films [274].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [274]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“to be a rhombohedral perovskite FE with space group of R3c at room temperature, and exhibit an AFE behavior at temperature between 200 • C and 320 • C (Fig. 8d) [237].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [237]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Fujino et al. discovered a morphotropic phase boundary (MPB) with enhanced piezoelectric response in Sm-doped BiFeO 3 thin films, where a FE rhombohedral to an AFE pseudo-orthorhombic phase transition takes place at ~ 14 % Sm doping content [257].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [257]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Recently, several studies have demonstrated that AFE phases can be stabilized in BFO/ LaFeO 3 superlattices and BiFeO 3 /La 0.4 Bi 0.6 FeO 3 superlattices (Fig. 9c) [187,254].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [187]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [254]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In 1958, Francombe et al. first successfully synthesized AgNbO 3 ceramics and several dielectric anomalies associated with sequential structural phase transitions were identified [51].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [51]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
In the paper
“Overall, despite of some disputes in structure, its macroscopic features are basically the same and all M 1 , M 2 and M 3 phases show the characteristic double hysteresis loops, which become slimmer with increasing temperature (Fig. 8c) [232].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [232]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“The crystal structures and physical properties of BFO are very sensitive to electric field, pressure, and strain, which offers great flexibility to adjust its crystal structure, even the generation of an AFE order [252,253].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.4. (Bi,Re)FeO 3
What the sources say
- Not matchedcites [252]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [253]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Later in 2011, by using convergent-beam electron diffraction, neutron and synchrotron powder diffraction and first principles calculations, Yashima et al. revealed that AgNbO 3 is FIE at room temperature and has a non-centrosymmetric orthorhombic structure with space group of Pmc2 1 [231].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [231]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“It can be inferred that the FE phase is more stable in HfO 2 while ZrO 2 films prefer to be AFE in ultrathin film thickness [272].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [272]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In 1974, AFE-like double hysteresis loops were first found in BNT-SrTiO 3 solid solutions at a high temperature of 170 • C [36].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [36]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In the structure of BNT, the A site is occupied by Bi 3+ and Na + ions with equal concentration to balance the electroneutrality [238,239].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [238]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [239]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“this kind of behavior is not stable and only exist for a few cycles, which is also termed as the wake-up process [276].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3. Non-perovskite antiferroelectrics 4.3.1. Fluorite-structured Hf 1-x Zr x O 2
What the sources say
- Not matchedcites [276]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Similar to Pb 2+ , lone-pair electrons in the outermost 6 s 2 layer of Bi can produce strong electron cloud polarization [240].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.2.2. AgNbO 3
What the sources say
- Not matchedcites [240]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“In this compound, the antiferroelectricity exists at a relative wide temperature range (298 ~ 353 K) and AFE-PE phase transition occurs at 353 K.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [286]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Clearly, for AFEs, with temperature increasing, there is a transition from negative to positive ECE and the negative ECE can be attributed to the phase transition induced instability of AFE dipoles.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
boosteddirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“Various doping experiments are conducted to improve the stability of AFE phase, in accompany with the increasing of E AF , which shows great values in energy storage applications.[367].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [367]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“(NH 4 )H 2 PO 4 (ADP) is an H-bonded compound reported to have an AFE phase under 148 K [281], and the transition temperature strongly depend on the isotope effect of H.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [281]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“On the contrary, for FEs, electric field always decreases the entropy and induces the positive ECE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: fails — The paper may give no reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. The paper may give no reason why it holds. It may state two separate claims as one.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Different from the conventional perovskite-type AFEs which have multiple soft modes [42,201,285], the antiferroelectricity in francisite is driven by softening of a single antipolar mode [29], resulting in antiparallel displacement of adjacent Cu and Cl ions.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [42]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [201]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [285]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [29]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“For PZO films, Wu et al. [164], obtained a negative ECE at high frequency (10 kHz) and a positive ECE at low frequency fields (100 Hz).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [164]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In AFE Pb 0.97 La 0.02 Zr 0.85 Sn 0.13 Ti 0.02 O 3 films [291], the discharging time was determined to be within 6 ns and a maximum switching current density was achieved as high as 9400 A/cm 2 , which make AFE thin films the great candidate for pulsed power applications in high-speed multichip modules.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [291]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirectSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“In contrast, the polarization of FE always decreases with increasing temperature, leading to a positive ECE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Since applying an electric field typically aligns the diploes and decreases S c , S p has an increase to keep the total S unchanged.The increase of S p causes a temperature rise ΔT, adiabatic temperature change.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- The authors state this as an assumption: For dielectrics, the electronic bandgap is typically large and the electronic entropy S_e can be ignored.
- The authors state this as an assumption: The fast phase transition under an external electric field can be treated as adiabatic and reversible without heat exchange between the dielectric material and the external environment.
- The authors state this as an assumption: The total entropy S of dielectrics has two major components: dipolar or configurational entropy S_c and vibrational entropy S_p.
In the paper
“The first ECE measurement of AFE materials was reported in 1968 by Thacher [34].That early work has shown positive ECE with small magnitude of ΔT.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [34]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“La-doped M-type hexaferrites (La 0.2 Sr 0.7 Fe 12 O 19 ) was proved to integrate antiferroelectricity and ferromagnetism as a novel multiferroic candidate in recent years [282].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [282]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
boostedcorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Dielectric capacitors possess faster charge-discharge speed (~ns), higher power density (up to 10 8 W/kg), better temperature stability and fatigue resistance, compared with fuel cells, batteries, and supercapacitors, and thus are widely used in electronic devices and electrical power systems [288].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [288]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“However, for thin film systems, the ECE phenomena is complex since both negative ECE and positive ECE can be observed [365,380].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [365]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [380]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelational- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“The underlying mechanism is that the domain nucleation and growth is not sufficient at high frequency.In such case, with increasing temperature, the thermal energy promotes the domain nucleation and decreases the pinning force of domain wall movement, leading to the increase of P and negative ECE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [164]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“While at low frequency, there is enough time for the domain nucleation and growth.As a result, the spontaneous polarization reduces with increasing temperature, and therefore the polarization of the electric-field-driven FE phase reduces, leading to the positive ECE.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“Notably, ΔT for combing negative and positive ECE is ΔT 1 + ΔT 2 + ΔT 3 , which is larger than ΔT 1 for only positive ECE (noting that ΔT 1 , ΔT 2 , and ΔT 3 are all positive values).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [367]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“The negative ECE is generally attributed to the non-collinear response of dipoles to an external electric field [5], which increases the entropy and decreases the temperature.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [5]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Despite the AFE only exists at a narrow temperature gap (235.2 ~ 244.2 K) below room temperature, it is the first discovery of the succussive FE -AFE -PE phase transitions in organic-inorganic hybrid perovskites and sheds light on the importance of exploring AFEs based on organic-inorganic hybrid compounds.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [77]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plainSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“francisite Cu 3 Bi(SeO3) 2 O 2 Cl is a newly reported mineral and undergoes AFE phase transition under 115 K with dielectric anomaly [29].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [29]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“By controlling the orientation, the (1 1 1)-oriented films exhibit the largest polarization among (1 1 1)-, (1 1 0)-and (0 0 1)-oriented films and gain the highest energy storage density (~84.45J/cm 3 ) [294].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [294]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“This material is more similar to ideal Kittel's model of antiferroelectricity [24] and offers a good equivalence of antiferromagnets.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [24]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaincorrelationalSingle case- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In 2011, the negative ECE in AFEs was observed for the first time [362].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.2. Electrocaloric cooling
What the sources say
- Not matchedcites [362]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“AFE thin films exhibit a huge potential for energy storage due to the great improvement of E BDS (~2-5 MV/cm), which is more than one order of magnitude higher than that in bulks.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: unclear — It is unclear why the paper says it holds.
It may state two separate claims as one.
In the paper
“However, clear AFE double hysteresis loops have not been reported yet probably because of the relatively low bandgap of the material [23].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.3.2. Other antiferroelectrics
What the sources say
- Not matchedcites [23]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
hedgedconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“For dielectric capacitors, large breakdown field E BDS , small P r , large P max , and slim hysteresis (small J loss ) are needed for high energy storage density and efficiency η [289,290].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.1. Energy-storage capacitors
What the sources say
- Not matchedcites [289]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [290]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“The mechanism and even the definition of AFEs are ambiguous among different reports.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
plain- Asserted: passes — The authors put it forward as true.
- Checkable: fails — It may be too vague to check against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. It may be too vague to check against evidence.
- Rests on an assumption: Multiple soft modes during AFE phase transition display complex results of structure and electrical behavior, which obscure the origin of AFE order.
- Rests on an assumption: The lack of defect-free AFE material usually results in extrinsic behaviors.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“this phenomenological model assumes the presence of depolarized state and has its limit on the cases of multidomain FEs [415,416], and polycrystalline FEs where the polarized states are spatially remained [413].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [415]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [416]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [413]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In typical FE, negative capacitance behavior was theoretically predicted by Landauer in 1976 [407].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [407]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“In 2019, Intel patented an AFE based memory cell [420].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [420]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Not matched
In the paper
“Negative capacitance has been intensely researched in recent few years due to its potential merits to overcome the so-called Boltzmann tyranny in conventional transistor and enable the application for ultralow power electronics [406].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [406]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plainconditional- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“This model succeeds in explaining the observed negative capacitance in several experimental results [414,417], and in prediction of double S-shaped curve in extended ISE model, which considers the distribution of compensating charges, as verified by experiments [418].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [414]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [417]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [418]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Apart from the reversible giant electrostrain in conventional AFEs, for some doped AFE compositions with a field-induced metastable FE phase, electric field induced strain can be maintained even after removal of the electric field, which can set back to the initial zero state by heating over the transition temperature.This interesting phenomenon is the so-called shape memory effect [405].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
What the sources say
- Not matchedcites [405]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“This AFTJ exhibits higher endurance property (>10 9 cycles) and faster switching speed (<30 ns) than Hf 0.5 Zr 0.5 O 2 -based FTJ.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.6. Tunnel junctions
What the sources say
- Not matchedcites [423]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“Although non-volatile FE random access memories (FRAM) have been commercially utilized for years [80], the limited data storage density hinder its further application and market prospect.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [80]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
The paper states this without a source or data behind it here, so there is nothing to check it against. The quote shows it is in the paper.
In the paper
“In contrast, for the counterpart of FEs, the AFEs, believed to be centrosymmetric, cannot induce the photovoltaic effect.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.8. Photovoltaics
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: fails — The paper may give no reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. The paper may give no reason why it holds.
- Rests on an assumption: AFEs are centrosymmetric.
In the paper
“As early as 1968, Berlincourt et al. analyzed the feasibility of using AFE material to make underwater acoustic transducer, and pointed out that transducers based on AFE material own advantages of simple structure, small size, and light weight [403].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
What the sources say
- Not matchedcites [403]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it. It may state two separate claims as one.
- Not matched
In the paper
“In this way, polar and nonpolar states can be effectively obtained with low voltage switching and enhanced endurance.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [280]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“By integrating the P-E a curve, the AFE energy landscape of ZrO 2 can be further obtained and the normally forbidden regions near the structural phase transition, exhibiting negative capacitance feature, were stabilized in the AFE/dielectric heterostructure (Fig. 14e).”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [61]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“The ground AFE state can be perturbed by electric field and then a metastable FE state can be induced.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [61]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“However, these detailed structural evolution under external fields remain elusive, such as the dipole switching kinetics and phase transition pathway.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim.
In the paper
“In that demonstration, the nonlinear behavior of AFE can boost the charge for different logic states, thus the retention time has an increase.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [420]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“As a counterpart of FE, AFE materials do not exhibit net polarization and thus seem to lack a depolarization field, which is considered as one of the origins of forming topological polar structure.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
hedged- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: fails — The paper’s conclusions may not depend on it.
- Based: passes — The paper gives a reason why it holds.
Probably not a substantial claim. The paper’s conclusions may not depend on it.
- Rests on an assumption: AFE materials do not exhibit net polarization.
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“In AFE Hf x Zr 1-x O 2 , the read/write speed is reported to be as fast as 10 ns, and even down to 2 ns within different scenarios from 3-D Embedded-DRAM [264] to FeRAM using AFE capacitors [421].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.5. Memory devices
What the sources say
- Not matchedcites [264]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [421]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
None of the sources cited for this claim could be matched to a paper in Crossref, so there is nothing to check it against.
In the paper
“Recent results reveal that resistance and dielectrics in electric circuit can slow down the charging process and help to stabilize the negative capacitance state [408][409][410].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [408]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [409]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
- Not matchedcites [410]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“The structures of AFEs are complex and remain controversial.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
plain- Asserted: passes — The authors put it forward as true.
- Checkable: unclear — It is unclear whether it could be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
In the paper
“With increasing electric field, the 1/4 superstructure diffraction damps, while weak 1/8 and strong 3/8 superstructure diffraction spots emerge.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 6. Summary and perspective
What the sources say
- Not matchedcites [14]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“The suppression of negative capacitance effect in the structure can be fully explained by the ISE model, while LGD model predict the inconsistent results [419].”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.4. Negative capacitance
What the sources say
- Not matchedcites [419]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: unclear — It is unclear whether the paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
In the paper
“In addition, Liu et al. also reported that the PbZrO 3 -based thermal switching is ultrafast (<150 ns) and can repeat more than 10 million times.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.7. Thermal switching
What the sources say
- Not matchedcites [9]
Couldn’t be matched to a paper in Crossref, so it can’t be checked.
plain- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
- Not matched
A conclusion the paper draws from its own results — it cites no other source for it, so there is none to check. The quote shows it is in the paper.
In the paper
“Moreover, AFE exhibited a quicker response time (~100 kHz) than traditional shape memory metallic alloys (~100 Hz), thus, AFE-based devices are promising for practical industrial applications, such as digital displacement transducers.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 5.3. Electrostrain-based applications
plaindirect- Asserted: passes — The authors put it forward as true.
- Checkable: passes — It can be checked against evidence.
- Load-bearing: passes — The paper’s conclusions depend on it.
- Based: passes — The paper gives a reason why it holds.
It may state two separate claims as one.
The paper relies on this without support.
A comprehensive understanding that addresses the specific requirements for manipulating the functional properties of AFE thin films is still lacking.
“Currently, a comprehensive understanding that addresses the specific requirements for manipulating the functional properties of AFE thin films is still lacking.”
The paper relies on this without support.
AFE films share some properties and control principles with FE films but have distinct characteristics.
“Although AFE films share some properties and control principles with FE films, they have distinct characteristics.”
The paper relies on this without support.
Defects are common in materials and are inevitable during the sample preparation process.
“Defects are common in materials and are inevitable during the sample preparation process.”
The paper relies on this without support.
The AFE lattice distortion in PbZrO3 films is inhomogeneous.
“Considering that the AFE lattice distortion is inhomogeneous”
The paper relies on this without support.
Lead-based AFE materials contain heavy metal lead that is toxic to the environment and human body.
“However, these materials contain heavy metal lead, which is toxic to the environment and human body.”
The paper relies on this without support.
Capacitors generally have low energy densities (typically less than 10 J/cm3) relative to other energy storage systems.
“However, capacitors generally have low energy densities (typically less than 10 J/cm 3 ) relative to other energy storage systems.”
The paper relies on this without support.
Introducing relaxor into AFE usually results in lower polarization under the same electric field.
“Usually, introducing relaxor into AFE results in lower polarization under the same electric field.”
The paper relies on this without support.
The tolerance factor t is a critical indicator for the phase stability of perovskite structure.
“It is known that the tolerance factor t is a critical indicator for the phase stability of perovskite structure.”
The paper relies on this without support.
The origin of Hf1-xZrxO2-based antiferroelectricity and its structure details are still obscure.
“Although the origin of Hf 1-x Zr x O 2 -based antiferroelectricity and its structure details are still obscure”
The authors state this as an assumption.
For dielectrics, the electronic bandgap is typically large and the electronic entropy S_e can be ignored.
“For dielectrics, their electronic bandgap is typically large, and the electronic entropy S e can be ignored.”
The authors state this as an assumption.
The fast phase transition under an external electric field can be treated as adiabatic and reversible without heat exchange between the dielectric material and the external environment.
“The fast phase transition under an external electric field (a few nanoseconds [357,358]) can be treated as adiabatic and reversible without heat exchange between the dielectric material and the external environment.”
The authors state this as an assumption.
The total entropy S of dielectrics has two major components: dipolar or configurational entropy S_c and vibrational entropy S_p.
“Thus, the total entropy S has two major components: dipolar or configurational entropy S c and vibrational entropy S p .”
The authors state this as an assumption.
In the ISE model, there is no charge injection.
“By assuming that there is no charge injection”
The authors state this as an assumption.
The LGD phenomenological model assumes the presence of a depolarized state.
“this phenomenological model assumes the presence of depolarized state”
The paper relies on this without support.
AFEs are centrosymmetric.
“the AFEs, believed to be centrosymmetric”
The paper relies on this without support.
Multiple soft modes during AFE phase transition display complex results of structure and electrical behavior, which obscure the origin of AFE order.
“On one hand, multiple soft modes during AFE phase transition displays complex results of structure and electrical behavior, which obscure the origin of AFE order.”
The paper relies on this without support.
The lack of defect-free AFE material usually results in extrinsic behaviors.
“On the other hand, the lack of defect-free AFE material usually results in extrinsic behaviors.”
The paper relies on this without support.
AFE materials do not exhibit net polarization.
“As a counterpart of FE, AFE materials do not exhibit net polarization and thus seem to lack a depolarization field, which is considered as one of the origins of forming topological polar structure.”
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
Each contradiction between two passages listed here was confirmed by an independent check.
Rated minor: it would not touch a result — a value no result rests on, a p-value that stays on the same side of the significance level, or a conflict that is clerical, resolved elsewhere in the paper, or outside its own findings.
In the paper
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
“χ = 1/(A(T -T 0 ) + Bξ 2 0 ) (2”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 1.3. Mechanisms of antiferroelectricity
“which corresponds to the AFE-type anomaly below the transition if A(T-T 0 ) + ηξ 2 0 increases on cooling below the transition temperature.”
Rated minor: it would not touch a result — a value no result rests on, a p-value that stays on the same side of the significance level, or a conflict that is clerical, resolved elsewhere in the paper, or outside its own findings.
In the paper
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 3.8. Octahedral tilt control
“The commonly used substrates and electrode layers, such as SrTiO 3 and SrRuO 3 , differs by near -3% from Pb-based AFEs.”
§ Antiferroelectric oxide thin-films: Fundamentals, properties, and applications > 4.1.1. PbZrO 3
“the PbZrO 3 /SrRuO 3 /SrTiO 3 heterostructures are rather far from being simply strained because of the large lattice mismatch of ~ 6 %”
Citations
Cites
A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface
Ohtomo, A., & Hwang, H. Y. (2004) · Nature · doi:10.1038/nature02308 · Cited by 4,708
Multiferroics: progress and prospects in thin films
Ramesh, R., & Spaldin, N. A. (2007) · Nature Materials · doi:10.1038/nmat1805 · Cited by 4,004
Scott, J. F., & de Araújo, C. A. P. (1989) · Science · doi:10.1126/science.246.4936.1400 · Cited by 3,891
Applications of Modern Ferroelectrics
Scott, J. F. (2007) · Science · doi:10.1126/science.1129564 · Cited by 3,283
Ferroelectricity in hafnium oxide thin films
Böscke, T. S., Müller, J., Bräuhaus, D., Schröder, U., & Böttger, U. (2011) · Applied Physics Letters · doi:10.1063/1.3634052 · Cited by 2,848
Enhancement of Ferroelectricity in Strained BaTiO 3 Thin Films
Choi, K. J., Biegalski, M. D., Li, Y., Sharan, A., Schubert, J., Uecker, R., Reiche, P., Chen, Y. B., Pan, X. Q., Gopalan, V., et al. (2004) · Science · doi:10.1126/science.1103218 · Cited by 1,962
Ferroelectricity in Simple Binary ZrO 2 and HfO 2
Müller, J., Böscke, T. S., Schroeder, U. P., Mueller, S., Bräuhaus, D., Böttger, U., Frey, L., & Mikolajick, T. (2012) · Nano Letters · doi:10.1021/nl302049k · Cited by 1,874
Above-bandgap voltages from ferroelectric photovoltaic devices
Yang, S., Seidel, J., Byrnes, S. J., et al. (2010) · Nature Nanotechnology · doi:10.1038/nnano.2009.451 · Cited by 1,814
Giant Electrocaloric Effect in Thin-Film PbZr 0.95 Ti 0.05 O 3
Mischenko, A. S., Zhang, Q., Scott, J. F., et al. (2006) · Science · doi:10.1126/science.1123811 · Cited by 1,719
Critical thickness for ferroelectricity in perovskite ultrathin films
Junquera, J., & Ghosez, P. (2003) · Nature · doi:10.1038/nature01501 · Cited by 1,717
Research works printed but not linked: 9
- Zhang, 2016, Energy-storage properties and high-temperature dielectric relaxation behaviors of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3–PbTiO3 ceramics, J Phys D: Appl Phys, 49
- Chaudhuri, 2011, Epitaxial strain stabilization of a ferroelectric phase in PbZrO3 thin films, Phys Rev B, 84
- A k, j k., 1999118933, Ag1-xNaxNbO3 (ANN) solid solutions: from disordered antiferroelectric AgNbO3 to normal antiferroelectric NaNbO3, J Phys Condens Matter
- Smolenskii, 1961, New materials of AIIBIVOVI type, Trans Sov Phys Solid State, 2, 2651
- Acharya, 2022, Exploring the Pb1-xSrxHfO3 System and Potential for High Capacitive Energy Storage Density and Efficiency, Adv Mater, 334, 2105967, 10.1002/adma.202105967 · DOI · Paper page
- Zhao, 2014, Energy-Storage Properties and Electrocaloric Effect of Pb(1–3x/2)LaxZr0.85Ti0.15O3 Antiferroelectric Thick Films. ACS Appl Mater, Interface, 6, 11633
- Landauer, 1976, Can capacitance be negative Collect Phenom, 2, 167
- Levin, 2009, Structural changes underlying the diffuse dielectric response in AgNbO3, Phys Rev B, 79, 10.1103/PhysRevB.79.104113 · DOI
- Nokhrin, 1998, Influence of La impurities on PbZrO3 dielectric permittivity, J Korean Phys Soc, 32, S308
Cited by
Sorted by citations
Antiferroelectric Altermagnets: Antiferroelectricity Alters Magnets
Duan, X., Zhang, J., Zhu, Z., et al. (2025) · Physical Review Letters · doi:10.1103/physrevlett.134.106801 · Cited by 197
Enhanced energy storage in antiferroelectrics via antipolar frustration
Yang, B., Liu, Y., Jiang, R.-J., Lan, S., Liu, S., Zhou, Z., Dou, L., Zhang, M., Huang, H., Chen, L., et al. (2025) · Nature · doi:10.1038/s41586-024-08505-7 · Cited by 150
Dai, S., Li, M., Wu, X., Wu, Y., Li, X., Hao, Y., & Luo, B. (2024) · Journal of Advanced Ceramics · doi:10.26599/jac.2024.9220904 · Cited by 71
Eglitis, R. I., Purans, J., Jia, R., et al. (2025) · Inorganics · doi:10.3390/inorganics13040100 · Cited by 33
Emerging Solid–State Thermal Switching Materials
Jia, J., Li, S., Chen, X., & Shigesato, Y. (2024) · Advanced Functional Materials · doi:10.1002/adfm.202406667 · Cited by 32
Metadata
- Authors
- Si, Y., Zhang, T., Liu, C., Das, S., Xu, B., Burkovsky, R. G., Wei, X.-K., & Chen, Z.
- Affiliations
- Harbin Institute of Technology (CN)
- Nanjing Normal University (CN)
- Indian Institute of Science Bangalore (IN)
- Soochow University (CN)
- Xiamen University (CN)
- Corresponding author
- Das, Sujit
- Wei, Xian-Kui
- Chen, Zuhuang
- Venue
- Progress in Materials Science
- Publisher
- Elsevier BV
- Published
- 2024-04
- Volume
- 142
- Pages
- 101231
- ISSN
- 0079-6425 (ISSN-L)
- OpenAlex
- W4390503066
- Semantic Scholar
- 6486611e33887aac6a0d590b086d58c637cd25b6
- Cited by
- 84
- References
- 442
- Citations by year
- 2026: 36 · 2025: 33 · 2024: 15
- FWCI
- 7.87
- Type
- journal article
- Language
- en
- Open access
- bronze
- doi.org
- Licence
- Locations
- Progress in Materials Science (publishedVersion)
- Universitas Pasundan institutional repositories & scientific journals (Universitas Pasundan) (submittedVersion)
- Funders
- Indian Institute of Science
- National Natural Science Foundation of China (12074277, 52206092, 52372105)
- Government of Jiangsu Province (JSSCBS20210315)
- Natural Science Foundation of Jiangsu Province (BK20210565)
- Xiamen University
- Fundamental Research Funds for the Central Universities
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Multiferroics and related materials
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Keywords
- thin films, antiferroelectric phase transition, lattice strain, film thickness effects, surface and interface effects, stoichiometry, energy storage, solid-state cooling, thermal switch, actuators, memory devices
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
A language model drew the claims from the paper on 2026-10-27, under version 3 of the claim definition (model deepseek-v4.1-flash, prompt extract-v3).
A second model labelled each claim on 2026-10-27 (model jev-1.13-20260917, definition revision gold-guideline-v0.2).
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
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