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NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space

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Ade, Harald, Hitchcock, Adam P.·2008·Polymer

Abstract

Near Edge X-ray Absorption Fine Structure (NEXAFS) spectromicroscopy, resonant scattering and resonant reflectivity are specialized, synchrotron radiation based, soft X-ray characterization tools that provide moiety-specific contrast and either real-space imaging at ∼30 nm spatial resolution, or scattering signals which can be inverted to provide chemically sensitive information at an even higher spatial resolution (<5 nm). These X-ray techniques complement other real and reciprocal space characterization tools such as various microscopies and conventional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based tools, describe their present state-of-the-art and discuss a number of applications to exemplify their unique aspects.

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Metadata

Authors
Ade, H., & Hitchcock, A. P.
Venue
Polymer
Publisher
Elsevier BV
Published
2008-02
Volume
49
Issue
3
Pages
643-675
ISSN
0032-3861 (ISSN-L)
OpenAlex
W2051868840
Cited by
286
References
0
FWCI
15.40
Type
journal article
Language
en
Open access
hybrid

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CoChat. (2026). Citation check: NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space. https://app.cochat.ai/papers/10.1016/j.polymer.2007.10.030
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Ade, H., & Hitchcock, A. P. (2008). NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space. Polymer. https://doi.org/10.1016/j.polymer.2007.10.030

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