Scalable anomaly detection in manufacturing systems using an interpretable deep learning approach
Open accessAbstract
Anomaly detection in manufacturing systems has great potential for the prevention of critical quality faults. In recent years, unsupervised deep learning has shown to frequently outperform conventional methods for anomaly detection. However, tuning, deploying and debugging deep learning models is a time-consuming task, limiting their practical applicability in manufacturing systems. We approach this problem by developing a deep learning model that learns interpretable shapes that can be used for anomaly detection in temporal process data. Application of the model to assembly tightening processes in the automotive industry shows a significant improvement in model interpretability and scalability.
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Cites
Rudin, C. (2019) · Nature Machine Intelligence · doi:10.1038/s42256-019-0048-x · Cited by 10,561 · see citing works
The mythos of model interpretability
Lipton, Z. C. (2018) · Communications of the ACM · doi:10.1145/3233231 · Cited by 5,427 · see citing works
Deep Learning for IoT Big Data and Streaming Analytics: A Survey
Mohammadi, M., Al-Fuqaha, A., Sorour, S., & Guizani, M. (2018) · IEEE Communications Surveys & Tutorials · doi:10.1109/comst.2018.2844341 · Cited by 1,471 · see citing works
Deep Learning for Anomaly Detection: A Survey
Chalapathy, R., & Chawla, S. (2019) · arXiv · doi:10.48550/arxiv.1901.03407 · Cited by 1,240 · see citing works
A review of unsupervised feature learning and deep learning for time-series modeling
Längkvist, M., Karlsson, L., & Loutfi, A. (2014) · Pattern Recognition Letters · doi:10.1016/j.patrec.2014.01.008 · Cited by 1,234 · see citing works
Samek, W., Wiegand, T., & Müller, K.-R. (2017) · arXiv · doi:10.48550/arxiv.1708.08296 · Cited by 1,080 · see citing works
Visual interpretability for deep learning: a survey
Zhang, Q., & Zhu, S. C. (2018) · Frontiers of Information Technology & Electronic Engineering · doi:10.1631/fitee.1700808 · Cited by 975 · see citing works
DeepAnT: A Deep Learning Approach for Unsupervised Anomaly Detection in Time Series
Munir, M., Siddiqui, S. A., Dengel, A. R., & Ahmed, S. (2018) · IEEE Access · doi:10.1109/access.2018.2886457 · Cited by 710 · see citing works
Challenges in deploying machine learning: A survey of case studies
Paleyes, A., Urma, R.-G., & Lawrence, N. D. (2023) · ACM Computing Surveys · doi:10.1145/3533378 · Cited by 638 · see citing works
Intelligible models for classification and regression
Lou, Y., Caruana, R., & Gehrke, J. (2012) · Proceedings of the 18th ACM SIGKDD international conference on Knowledge discovery and data mining · doi:10.1145/2339530.2339556 · Cited by 547 · see citing works
Robust Deep Learning Methods for Anomaly Detection
Chalapathy, R., Khoa, N. L. D., & Chawla, S. (2020) · ACM SIGKDD International Conference on Knowledge Discovery & Data Mining (KDD) · doi:10.1145/3394486.3406704 · Cited by 503 · see citing works
Interpretability of deep learning models: A survey of results
Chakraborty, S., Tomsett, R., Raghavendra, R., Harborne, D., Alzantot, M., Cerutti, F., Srivastava, M. B., Preece, A. D., Julier, S., Rao, R., et al. (2017) · IEEE SmartWorld, Ubiquitous Intelligence & Computing, Advanced & Trusted Computing, Scalable Computing & Communications, Cloud & Big Data Computing, Internet of People and Smart City Innovation (SmartWorld/SCALCOM/UIC/ATC/CBDCom/IOP/SCI) · doi:10.1109/uic-atc.2017.8397411 · Cited by 469 · see citing works
Generic and Scalable Framework for Automated Time-series Anomaly Detection
Laptev, N., Amizadeh, S., & Flint, I. (2015) · ACM SIGKDD Conference on Knowledge Discovery and Data Mining (KDD) · doi:10.1145/2783258.2788611 · Cited by 455 · see citing works
The unreasonable effectiveness of deep learning in artificial intelligence
Sejnowski, T. J. (2020) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.1907373117 · Cited by 352 · see citing works
Hohman, F., Park, H., Robinson, C., & Chau, D. H. (2019) · IEEE Transactions on Visualization and Computer Graphics · doi:10.1109/tvcg.2019.2934659 · Cited by 217 · see citing works
Challenges in the Deployment and Operation of Machine Learning in Practice
Baier, L., Jöhren, F., & Seebacher, S. (2019) · Repository KITopen (Karlsruhe Institute of Technology) · doi:10.5445/ir/1000095028 · Cited by 110 · see citing works
Hsieh, R.-J., Chou, J., & Ho, C.-H. (2019) · IEEE International Conference on Service-Oriented Computing and Applications (SOCA) · doi:10.1109/soca.2019.00021 · Cited by 106 · see citing works
Learning Hierarchical Features from Deep Generative Models
Zhao, S., Song, J., & Ermon, S. (2017) · International Conference on Machine Learning · Cited by 86 · see citing works
Anomaly detection in discrete manufacturing using self-learning approaches
Lindemann, B., Fesenmayr, F., Jazdi, N., & Weyrich, M. (2019) · Procedia CIRP · doi:10.1016/j.procir.2019.02.073 · Cited by 85 · see citing works
Anomaly Detection in Manufacturing Systems Using Structured Neural Networks
Liu, J., Guo, J., Orlik, P. V., Shibata, M., Nakahara, D., Mii, S., & Takáč, M. (2018) · World Congress on Intelligent Control and Automation · doi:10.1109/wcica.2018.8630692 · Cited by 57 · see citing works
Kim, D., Yang, H., Chung, M., Cho, S., Kim, H., Kim, M., Kim, K., & Kim, E.-S. (2018) · International Conference on Information and Computer Technologies (ICICT) · doi:10.1109/infoct.2018.8356842 · Cited by 49 · see citing works
A Deep Learning-based Approach to Anomaly Detection with 2-Dimensional Data in Manufacturing
Maggipinto, M., Beghi, A., & Susto, G. A. (2019) · 2022 IEEE 20th International Conference on Industrial Informatics (INDIN) · doi:10.1109/indin41052.2019.8972027 · Cited by 18 · see citing works
Continuous Process Monitoring Through Ensemble-Based Anomaly Detection
Deuse, J., Wiegand, M., & Weisner, K. (2019) · Studies in classification, data analysis, and knowledge organization · doi:10.1007/978-3-030-25147-5_18 · Cited by 4 · see citing works
Self-citation
Flagged first, then by citations
1 of the 24 references couldn’t be matched to a known paper.
Research works printed but not linked: 2
- F. Hohman, H. Park, C. Robinson, D. H. Chau, Summit: Scaling deep learn- ing interpretability byvisualizing activation and attribution summariza- tions, IEEE Transactions on Visualization and Computer Graphics (2017).
- M. Kahng, P. Andrews, A. Kalro, D. H. Chau, Visual exploration of industry-scale deep neural network models, IEEE Transactions on Visu- alization and Computer Graphics (2019).
Cited by
Sorted by citations
A Survey on Explainable Anomaly Detection
Li, Z., Zhu, Y., & Van Leeuwen, M. (2024) · ACM Transactions on Knowledge Discovery from Data · doi:10.1145/3609333 · Cited by 139 · see citing works
“Reference [185] constructs a deep neural network-based model that can learn interpretable feature representations from unlabeled time series, facilitating the evaluation and deployment of subsequent anomaly detection algorithms.”
BackgroundTime-series pattern recognition in Smart Manufacturing Systems: A literature review and ontology
Farahani, M. A., McCormick, M. R., Gianinny, R., Hudacheck, F., Harik, R., Liu, Z., & Wuest, T. (2023) · Journal of Manufacturing Systems · doi:10.1016/j.jmsy.2023.05.025 · Cited by 80 · see citing works
Pamir, Javaid, N., Almogren, A., Adil, M., Javed, M. U., & Zuair, M. (2022) · IEEE Access · doi:10.1109/access.2022.3215532 · Cited by 28 · see citing works
Rahman, M. M., Gupta, D., Bhatt, S., Shokouhmand, S., & Faezipour, M. (2024) · Future Internet · doi:10.3390/fi16040139 · Cited by 26 · see citing works
Kohli, M., & Chhabra, I. (2025) · Discover Applied Sciences · doi:10.1007/s42452-025-07312-7 · Cited by 19 · see citing works
Trustworthy Generative Few-Shot Learning-Based Intrusion Detection Method in Internet of Things
Zhang, Z., Wang, P., Zhang, T., Liu, M., & Zhou, X. (2024) · IEEE Transactions on Consumer Electronics · doi:10.1109/tce.2024.3473304 · Cited by 12 · see citing works
Tahir, H., Jabbarpour, M. R., Vo, Q. B., Kowalczyk, R., Barr, J., & Bessell, T. (2025) · IEEE Access · doi:10.1109/access.2025.3639551 · Cited by 7 · see citing works
Mühlburger, H., & Wotawa, F. (2022) · IEEE International Conference on Artificial Intelligence Testing (AITest) · doi:10.1109/aitest55621.2022.00015 · Cited by 3 · see citing works
Sridhar, S., Hiremath, S., Kumar, N. K., Rahul, S. G., Teekaraman, Y., & Amirthalakshmi, T. M. (2026) · Array · doi:10.1016/j.array.2026.100772 · Cited by 2 · see citing works
Melgar, P. C., Chambi, L. H., & Torres, R. S. (2025) · International Journal of Advanced Computer Science and Applications · doi:10.14569/ijacsa.2025.0160577 · Cited by 2 · see citing works
Fuzz Testing Molecular Representation Using Deep Variational Anomaly Generation
Nogueira, V. H. R., Sharma, R., Guido, R. V. C., & Keiser, M. J. (2025) · Journal of Chemical Information and Modeling · doi:10.1021/acs.jcim.4c01876 · Cited by 1 · see citing works
Mühlburger, H., & Wotawa, F. (2024) · IFAC-PapersOnLine · doi:10.1016/j.ifacol.2024.07.185 · Cited by 1 · see citing works
West, N., Henkies, M., Mura, R., & Deuse, J. (2025) · doi:10.1109/ieem63636.2025.11357665
Self-citationSong, J., & Kim, H. S. (2026) · Mathematics · doi:10.3390/math14050868
- Authors
- Schlegl, T., Schlegl, S., West, N., & Deuse, J.
- Affiliations
- BMW (Germany) (DE)
- TU Dortmund University (DE)
- University of Technology Sydney (AU)
- Corresponding author
- Schlegl, Thomas
- Venue
- Procedia CIRP
- Publisher
- Elsevier BV
- Published
- 2021
- Volume
- 104
- Pages
- 1547-1552
- ISSN
- 2212-8271 (ISSN-L)
- OpenAlex
- W3217796474
- Cited by
- 15
- References
- 24
- Citations by year
- 2026: 2 · 2025: 5 · 2024: 4 · 2023: 2 · 2022: 2
- FWCI
- 0.89
- Type
- journal article
- Language
- en
- Open access
- diamond
- doi.org
- Licence
- Locations
- Procedia CIRP (publishedVersion, cc-by-nc-nd)
- Topics
- Physical Sciences › Engineering › Control and Systems Engineering › Fault Detection and Control Systems
- Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Keywords
- anomaly detection, manufacturing systems, explainable deep learning, automotive industry, model interpretability, scalability
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review