The DOI matches its Crossref record; 31 of the 31 references it cites were found in a registry or an index.
The Daikon system for dynamic detection of likely invariants
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Extended static checking for Java
Flanagan, C., Leino, K. R. M., Lillibridge, M., Nelson, G., Saxe, J. B., & Stata, R. (2002) · Proceedings of the ACM SIGPLAN 2002 conference on Programming language design and implementation · doi:10.1145/512529.512558 · Cited by 1,340
Dynamically discovering likely program invariants to support program evolution
Ernst, M. D., Cockrell, J., Griswold, W. G., & Notkin, D. (2001) · IEEE Transactions on Software Engineering · doi:10.1109/32.908957 · Cited by 1,050
Self-citationDiscovering models of software processes from event-based data
Cook, J. E., & Wolf, A. L. (1998) · ACM Transactions on Software Engineering and Methodology · doi:10.1145/287000.287001 · Cited by 870
Simplify: a theorem prover for program checking
Detlefs, D., Nelson, G., & Saxe, J. B. (2005) · Journal of the ACM · doi:10.1145/1066100.1066102 · Cited by 786
Predicting fault incidence using software change history
Graves, T. L., Karr, A. F., Marron, J. S., & Siy, H. (2000) · IEEE Transactions on Software Engineering · doi:10.1109/32.859533 · Cited by 753
An overview of JML tools and applications
Burdy, L., Cheon, Y., Cok, D. R., Ernst, M. D., Kiniry, J. R., Leavens, G. T., Leino, K. R. M., & Poll, E. (2005) · International Journal on Software Tools for Technology Transfer · doi:10.1007/s10009-004-0167-4 · Cited by 714
Self-citationAmmons, G., Bodík, R., & Larus, J. R. (2002) · Proceedings of the 29th ACM SIGPLAN-SIGACT symposium on Principles of programming languages · doi:10.1145/503272.503275 · Cited by 665
Tracking down software bugs using automatic anomaly detection
Hangal, S., & Lam, M. S. (2002) · Proceedings/Proceedings - International Conference on Software Engineering · doi:10.1145/581339.581377 · Cited by 602
Bug isolation via remote program sampling
Liblit, B., Aiken, A., Zheng, A. X., & Jordan, M. I. (2003) · ACM SIGPLAN Notices · doi:10.1145/780822.781148 · Cited by 504
JML: A Notation for Detailed Design
Leavens, G. T., Baker, A. L., & Ruby, C. (1999) · Behavioral Specifications of Businesses and Systems · doi:10.1007/978-1-4615-5229-1_12 · Cited by 417
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The oracle problem in software testing: A survey
Barr, E. T., Harman, M., McMinn, P., Shahbaz, M., & Yoo, S. (2015) · IEEE Transactions on Software Engineering · doi:10.1109/tse.2014.2372785 · Cited by 1,104
Automated Program Repair in the Era of Large Pre-trained Language Models
Xia, C. S., Wei, Y., & Zhang, L. (2023) · 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE) · doi:10.1109/icse48619.2023.00129 · Cited by 433
The ML test score: A rubric for ML production readiness and technical debt reduction
Breck, E., Cai, S., Nielsen, E., Salib, M., & Sculley, D. (2017) · 2017 IEEE International Conference on Big Data (Big Data) · doi:10.1109/bigdata.2017.8258038 · Cited by 310
A Survey on Automated Log Analysis for Reliability Engineering
He, S., He, P., Chen, Z., Yang, T., Su, Y., & Lyu, M. R. (2022) · ACM Computing Surveys · doi:10.1145/3460345 · Cited by 334
Identifying patch correctness in test-based program repair
Xiong, Y., Liu, X., Zeng, M., Zhang, L., & Huang, G. (2018) · Proceedings of the 40th International Conference on Software Engineering · doi:10.1145/3180155.3180182 · Cited by 162
Metadata
- Authors
- Ernst, M. D., Perkins, J. H., Guo, P. J., McCamant, S., Pacheco, C., Tschantz, M. S., & Xiao, C.
- Venue
- Science of Computer Programming
- Publisher
- Elsevier BV
- Published
- 2007-12
- Volume
- 69
- Issue
- 1-3
- Pages
- 35-45
- ISSN
- 0167-6423 (ISSN-L)
- OpenAlex
- W2110908283
- Cited by
- 1,080
- References
- 31
- FWCI
- 228.18
- Type
- journal article
- Language
- en
- Open access
- bronze
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- The paper
- Ernst, M. D., Perkins, J. H., Guo, P. J., McCamant, S., Pacheco, C., Tschantz, M. S., & Xiao, C. (2007). The Daikon system for dynamic detection of likely invariants. Science of Computer Programming. https://doi.org/10.1016/j.scico.2007.01.015
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
