The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.
Bug isolation via remote program sampling
Abstract
We propose a low-overhead sampling infrastructure for gathering information from the executions experienced by a program's user community. Several example applications illustrate ways to use sampled instrumentation to isolate bugs. Assertion-dense code can be transformed to share the cost of assertions among many users. Lacking assertions, broad guesses can be made about predicates that predict program errors and a process of elimination used to whittle these down to the true bug. Finally, even for non-deterministic bugs such as memory corruption, statistical modeling based on logistic regression allows us to identify program behaviors that are strongly correlated with failure and are therefore likely places to look for the error.
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Cites
The Elements of Statistical Learning
Hastie, T., Friedman, J., & Tibshirani, R. (2001) · Springer Series in Statistics · doi:10.1007/978-0-387-21606-5 · Cited by 24,162
Classification And Regression Trees
Breiman, L., Friedman, J. H., Olshen, R. A., & Stone, C. J. (2017) · doi:10.1201/9781315139470 · Cited by 11,417
A type-based approach to program security
Volpano, D., & Smith, G. (1997) · Lecture Notes in Computer Science · doi:10.1007/bfb0030629 · Cited by 225
Cited by
GenProg: A Generic Method for Automatic Software Repair
Le Goues, C., Nguyen, T., Forrest, S., & Weimer, W. (2012) · IEEE Transactions on Software Engineering · doi:10.1109/tse.2011.104 · Cited by 1,085
The Daikon system for dynamic detection of likely invariants
Ernst, M. D., Perkins, J. H., Guo, P. J., McCamant, S., Pacheco, C., Tschantz, M. S., & Xiao, C. (2007) · Science of Computer Programming · doi:10.1016/j.scico.2007.01.015 · Cited by 1,080
SemFix: program repair via semantic analysis
Nguyen, H. D. T., Qi, D., Roychoudhury, A., & Chandra, S. (2013) · doi:10.5555/2486788.2486890 · Cited by 398
SOBER: statistical model-based bug localization
Liu, C., Yan, X., Fei, L., Han, J., & Midkiff, S. P. (2005) · Proceedings of the 10th European software engineering conference held jointly with 13th ACM SIGSOFT international symposium on Foundations of software engineering · doi:10.1145/1081706.1081753 · Cited by 357
Carat: collaborative energy diagnosis for mobile devices
Oliner, A. J., Iyer, A. P., Stoica, I., Lagerspetz, E., & Tarkoma, S. (2013) · Proceedings of the 11th ACM Conference on Embedded Networked Sensor Systems · doi:10.1145/2517351.2517354 · Cited by 148
Metadata
- Authors
- Liblit, B., Aiken, A., Zheng, A. X., & Jordan, M. I.
- Venue
- ACM SIGPLAN Notices
- Published
- 2003-05-09
- Volume
- 38
- Issue
- 5
- Pages
- 141-154
- ISSN
- 0362-1340 (ISSN-L)
- 1558-1160
- OpenAlex
- W2155479707
- Cited by
- 504
- References
- 3
- FWCI
- 93.52
- Type
- journal article
- Language
- en
- Open access
- closed
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- Liblit, B., Aiken, A., Zheng, A. X., & Jordan, M. I. (2003). Bug isolation via remote program sampling. ACM SIGPLAN Notices. https://doi.org/10.1145/780822.781148
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
