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Cited by 201

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X-ray photoelectron spectroscopy investigation of boron carbide films deposited by sputtering

Jacobsohn, L.G., Schulze, R.K., Maia da Costa, M.E.H., Nastasi, M.·2004·Surface Science
DOI 10.1016/j.susc.2004.09.020
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Research works printed but not linked: 24

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Metadata

Authors
Jacobsohn, L. G., Schulze, R. K., Maia da Costa, M. E. H., & Nastasi, M.
Venue
Surface Science
Publisher
Elsevier BV
Published
2004-11
Volume
572
Issue
2-3
Pages
418-424
ISSN
0039-6028 (ISSN-L)
DOI
10.1016/j.susc.2004.09.020
OpenAlex
W2034550371
Cited by
201
References
0
FWCI
1.66
Type
journal article
Language
en
Open access
closed
Licence
  • www.elsevier.com/tdm/userlicense/1.0/ (tdm)
  • www.elsevier.com/legal/tdmrep-license (tdm)

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CoChat. (2026). Citation check: X-ray photoelectron spectroscopy investigation of boron carbide films deposited by sputtering. https://app.cochat.ai/papers/10.1016/j.susc.2004.09.020
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Jacobsohn, L. G., Schulze, R. K., Maia da Costa, M. E. H., & Nastasi, M. (2004). X-ray photoelectron spectroscopy investigation of boron carbide films deposited by sputtering. Surface Science. https://doi.org/10.1016/j.susc.2004.09.020

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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.