Microstructural and Transport Properties of LaNiO3–δ Films Grown on Si (111) by Chemical Solution Deposition
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The dependence of conductivity on oxygen deficiency δ is attributed to the change in nickel valence from Ni3+ to Ni2+ with increasing δ.
“The dependence of conductivity on oxygen deficiency δ is attributed to the change in nickel valence from Ni3+ to Ni2+ with increasing δ [19,20,21].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [21]
Oxygen deficiency is the reason for resistivity increase attributed to change in nickel valence.
“As it is known, oxygen deficiency is the reason for the resistivity increase attributed to the change in nickel valence [19,20,21,59].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [21]
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Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
- Authors
- Escote, M. T., Pontes, F. M., Leite, E. R., Varela, J. A., Jardim, R. F., & Longo, E.
- Affiliations
- Universidade Federal de São Carlos (BR)
- Instituto de Química Orgánica General (ES)
- Universidade de São Paulo (BR)
- Corresponding author
- Escote, M.T.
- Venue
- Thin Solid Films
- Publisher
- Elsevier BV
- Published
- 2003-11
- Volume
- 445
- Issue
- 1
- Pages
- 54-58
- ISSN
- 0040-6090 (ISSN-L)
- OpenAlex
- W2071425645
- Cited by
- 35
- References
- 0
- Citations by year
- 2023: 2 · 2022: 1 · 2021: 2 · 2018: 2 · 2017: 3 · 2016: 1 · 2015: 1 · 2014: 3 · 2013: 1 · 2012: 2
- FWCI
- 1.27
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Thin Solid Films (publishedVersion)
- Acervo Digital da Universidade Estadual Paulista (Universidade Estadual Paulista) (submittedVersion)
- UNESP Institutional Repository (São Paulo State University) (submittedVersion)
- Funders
- Fundação de Amparo à Pesquisa do Estado de São Paulo
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Electronic and Structural Properties of Oxides
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor materials and devices
- Physical Sciences › Materials Science › Materials Chemistry › Advancements in Solid Oxide Fuel Cells
- Keywords
- perovskite thin films, Si(111) substrate, chemical solution deposition, microstructure, grain size, electrical resistivity, metallic conductivity, film morphology
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
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Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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