The DOI matches its Crossref record; 13 of the 13 references it cites were found in a registry or an index.
Al2O3/SiO2 and HfO2/SiO2 dichroic mirrors for UV solid-state lasers
Overview
Integrity signals
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Cites
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Verification
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
In the citing paper
“However, the pair SiO2/TiO2 offers the largest optical contrast, rendering it perfect for high-reflectance dielectric mirrors with a smaller number of pairs and sharper stopbands.”
From Metal Oxide Thin Films for Advanced Photonic Applications (2026) · cites this paper as [32]
In the citing paper
“The most commonly used material to fabricate dielectric mirrors is silicon dioxide (SiO2).”
From Metal Oxide Thin Films for Advanced Photonic Applications (2026) · cites this paper as [32]
Citations
Cites
Photothermal deflection spectroscopy and detection
Jackson, W. B., Amer, N. M., Boccara, A. C., & Fournier, D. (1981) · Applied Optics · doi:10.1364/ao.20.001333 · Cited by 1,363
Thielsch, R., Gatto, A., Heber, J. D., & Kaiser, N. (2002) · Thin Solid Films · doi:10.1016/s0040-6090(02)00208-0 · Cited by 146
Optical properties and environmental stability of oxide coatings deposited by reactive sputtering
Edlou, S. M., Smajkiewicz, A., & Al-Jumaily, G. A. (1993) · Applied Optics · doi:10.1364/ao.32.005601 · Cited by 124
Materials for optical coatings in the ultraviolet
Rainer, F., Lowdermilk, W. H., Milam, D., Carniglia, C. K., Hart, T. T., & Lichtenstein, T. L. (1985) · Applied Optics · doi:10.1364/ao.24.000496 · Cited by 124
High-reflectivity HfO_2/SiO_2 ultraviolet mirrors
Torchio, P., Gatto, A., Alvisi, M., Albrand, G., Kaiser, N., & Amra, C. (2002) · Applied Optics · doi:10.1364/ao.41.003256 · Cited by 93
Surface laser damage thresholds determined by photoacoustic deflection
Petzoldt, S., Elg, A.-P. C., Reichling, M., Reif, J., & Matthias, E. (1988) · Applied Physics Letters · doi:10.1063/1.100491 · Cited by 85
Coutts, D. W., & McGonigle, A. J. S. (2004) · IEEE Journal of Quantum Electronics · doi:10.1109/jqe.2004.834775 · Cited by 73
Use of hafnium dioxide in multilayer dielectric reflectors for the near uv
Baumeister, P. W., & Arnon, O. (1977) · Applied Optics · doi:10.1364/ao.16.000439 · Cited by 55
High damage threshold dielectric coatings for excimer lasers
Kaiser, N., Uhlig, H., Schallenberg, U. B., Anton, B., Kaiser, U. A., Mann, K., & Eva, E. (1995) · Thin Solid Films · doi:10.1016/0040-6090(94)06469-5 · Cited by 53
Photoacoustic study of laser damage in thin films
Rosencwaig, A., & Willis, J. B. (1980) · Applied Physics Letters · doi:10.1063/1.91618 · Cited by 33
Research works printed but not linked: 2
- R. Thielsh, T. Feigl, N. Kaiser, S. Martin, S. Scaglione, F. Sarto, M. Alvisi, A. Rizzo, in: G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, M.J. Soileau (Eds.), Laser-Induced Damage in Optical Materials: Boulder, CO, USA, October 4, 1999, Proc. SPIE 3902, 1999, p. 182.
- M.L. Grilli, A. Krasilnikova, F. Menchini, A. Piegari, in: A. Duparré, R. Geyl, L. Wang (Eds.), Proc. SPIE 5965, Jena, Germany, September 13, 2005, p. 566 (2005).
Cited by
Alias, M. S., Tangi, M., Holguín‐Lerma, J. A., Stegenburgs, E., Alatawi, A. A., Ashry, I., Subedi, R. C., Priante, D., Shakfa, M. K., Ng, T. K., et al. (2018) · Journal of Nanophotonics · doi:10.1117/1.jnp.12.043508 · Cited by 61
Jena, S., Tokas, R. B., Rao, K. D., Thakur, S., & Sahoo, N. K. (2016) · Applied Optics · doi:10.1364/ao.55.006108 · Cited by 57
Rammula, R., Aarik, J., Mändar, H., Ritslaid, P., & Sammelselg, V. (2010) · Applied Surface Science · doi:10.1016/j.apsusc.2010.07.105 · Cited by 40
Influence of temperature and plasma parameters on the properties of PEALD HfO2
Lapteva, M., Beladiya, V., Riese, S., Hanke, P., Otto, F., Fritz, T., Schmitt, P., Stenzel, O., Tünnermann, A., & Szeghalmi, A. V. (2021) · Optical Materials Express · doi:10.1364/ome.422156 · Cited by 34
Beladiya, V., Becker, M., Faraz, T., Kessels, W. M. M., Schenk, P., Otto, F., Fritz, T., Gruenewald, M., Helbing, C., Jandt, K. D., et al. (2019) · Nanoscale · doi:10.1039/c9nr07202k · Cited by 29
Metadata
- Authors
- Grilli, M. L., Menchini, F., Piegari, A., Alderighi, D., Toci, G., & Vannini, M.
- Affiliations
- National Agency for New Technologies, Energy and Sustainable Economic Development (IT)
- Nello Carrara Institute of Applied Physics (IT)
- Corresponding author
- Menchini, Francesca
- Venue
- Thin Solid Films
- Publisher
- Elsevier BV
- Published
- 2009-01
- Volume
- 517
- Issue
- 5
- Pages
- 1731-1735
- ISSN
- 0040-6090 (ISSN-L)
- OpenAlex
- W2062238054
- Cited by
- 28
- References
- 13
- Citations by year
- 2026: 3 · 2022: 4 · 2021: 2 · 2020: 3 · 2019: 1 · 2018: 3 · 2016: 3 · 2015: 2 · 2012: 1
- FWCI
- 1.03
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- www.elsevier.com/tdm/userlicense/1.0/ (tdm)
- Locations
- Thin Solid Films (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Surfaces, Coatings and Films › Optical Coatings and Gratings
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Solid State Laser Technologies
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Laser Material Processing Techniques
- Keywords
- dichroic mirror, HfO2/SiO2 multilayer, end mirrors, laser-induced damage threshold, RF sputtering, high-reflectance coatings
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
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How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Al2O3/SiO2 and HfO2/SiO2 dichroic mirrors for UV solid-state lasers. https://app.cochat.ai/papers/10.1016/j.tsf.2008.09.047
- The paper
- Grilli, M. L., Menchini, F., Piegari, A., Alderighi, D., Toci, G., & Vannini, M. (2009). Al2O3/SiO2 and HfO2/SiO2 dichroic mirrors for UV solid-state lasers. Thin Solid Films. https://doi.org/10.1016/j.tsf.2008.09.047
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
