Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 6Diamond and Carbon-based Materials ResearchMetal and Thin Film MechanicsAdvanced Materials and Semiconductor Technologies

The DOI matches its Crossref record; 63 of the 64 references it cites were found in a registry or an index.

Characteristics of carbon films prepared by thermal chemical vapor deposition using camphor

Overview

Integrity signals

Registry

Crossref · 10.1016/j.tsf.2014.01.035

Cites

63 of 63 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Citations

Cites

Show all 64 references

Cited by

Metadata

Authors
Lai, L.-H., Yang, J.-S., & Shiue, S.-T.
Affiliations
National Chung Hsing University (TW)
Corresponding author
Shiue, Sham-Tsong
Venue
Thin Solid Films
Publisher
Elsevier BV
Published
2014-04
Volume
556
Pages
544-551
ISSN
0040-6090 (ISSN-L)
OpenAlex
W1979348595
Cited by
5
References
64
Citations by year
2024: 1 · 2018: 1 · 2017: 1 · 2016: 1 · 2015: 1
FWCI
0.45
Type
journal article
Language
en
Open access
closed
Licence
  • www.elsevier.com/tdm/userlicense/1.0/ (tdm)
  • www.elsevier.com/legal/tdmrep-license (tdm)
Locations
  • Thin Solid Films (publishedVersion)
  • NCHU Institutional Repository CRIS (submittedVersion)
Funders
  • National Science Council (NSC 101-2221-E-005-031-MY2)
  • Ministry of Education
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Diamond and Carbon-based Materials Research
  • Physical Sciences › Engineering › Mechanics of Materials › Metal and Thin Film Mechanics
  • Physical Sciences › Materials Science › Materials Chemistry › Advanced Materials and Semiconductor Technologies
Keywords
carbon films, thermal chemical vapor deposition, camphor, pyrolytic carbon deposition, deposition temperature, activation energy, deposition rate, reaction intermediates, crystallinity, electrical resistivity, water contact angle, methane, acetylene

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.