Cited by 46Advanced MEMS and NEMS TechnologiesInertial Sensor and NavigationAnalog and Mixed-Signal Circuit Design

Measurement of noise characteristics of MEMS accelerometers

Mohd-Yasin, Faisal, Korman, Can E, Nagel, David J·2003·Solid-State Electronics

Integrity signals

Registry

Crossref · 10.1016/s0038-1101(02)00220-4

Cites

3 of 3 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • The design and functionality of ACC sensors may lead to sensor noise and other inconsistencies like sensor saturation or displacement.

    “The design and functionality of ACC sensors may lead to sensor noise and other inconsistencies like sensor saturation or displacement63–65.”

    From Data quality evaluation in wearable monitoring (2022) · cites this paper as [64]

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Mohd-Yasin, F., Korman, C. E., & Nagel, D. J.
Affiliations
George Washington University (US)
Corresponding author
Mohd-Yasin, Faisal
Venue
Solid-State Electronics
Publisher
Elsevier BV
Published
2003-02
Volume
47
Issue
2
Pages
357-360
ISSN
0038-1101 (ISSN-L)
OpenAlex
W2155350166
Cited by
46
References
3
Citations by year
2026: 1 · 2025: 2 · 2024: 3 · 2023: 1 · 2022: 3 · 2021: 4 · 2019: 2 · 2018: 4 · 2017: 1 · 2016: 5 · 2015: 4
FWCI
1.75
Type
journal article
Language
en
Open access
closed
Locations
  • Solid-State Electronics (publishedVersion)
  • Griffith Research Online (submittedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced MEMS and NEMS Technologies
  • Physical Sciences › Engineering › Aerospace Engineering › Inertial Sensor and Navigation
  • Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
Keywords
MEMS accelerometer, noise characteristics, 1/f noise, Gaussian white noise, noise spectral density, microelectromechanical systems

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review