Cited by 25Electronic and Structural Properties of OxidesMagnetic and transport properties of perovskites and related materialsSemiconductor materials and devices

Conductive metallic LaNiO3 films from metallo-organic precursors

Li, Ai-Dong, Ge, Chuan-Zhen, Wu, Di, Lü, Peng, Zuo, Ya-Qin, Yang, Sen-Zu, Ming, Nai-Ben·1997·Thin Solid Films

Integrity signals

Registry

Crossref · 10.1016/s0040-6090(96)09288-7

Cites

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • The resistivity of LNO films can vary from 100 to 10,000 μOhm·cm, depending on preparation techniques.

    “The resistivity of LNO films can vary from 100 to 10,000 μOhm·cm, depending on preparation techniques [23,24,25,26].”

    From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [23]

Cited by

Sorted by citations

Authors
Li, A.-D., Ge, C.-Z., Wu, D., Lü, P., Zuo, Y.-Q., Yang, S.-Z., & Ming, N.-B.
Affiliations
  • National Laboratory of Solid State Microstructures (CN)
  • Nanjing University (CN)
  • China Center of Advanced Science and Technology (CN)
ORCID
Wu, Di
Venue
Thin Solid Films
Publisher
Elsevier BV
Published
1997-04
Volume
298
Issue
1-2
Pages
165-169
ISSN
0040-6090 (ISSN-L)
OpenAlex
W2094187576
Cited by
25
References
0
Citations by year
2023: 1 · 2021: 1 · 2018: 1 · 2017: 1 · 2016: 1 · 2015: 2 · 2013: 1
FWCI
0.65
Type
journal article
Language
en
Open access
closed
Locations
Thin Solid Films (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Electronic and Structural Properties of Oxides
  • Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Magnetic and transport properties of perovskites and related materials
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor materials and devices
Keywords
LaNiO3, metallo-organic decomposition, annealing temperature, SrTiO3 substrate, epitaxial thin films, electrical conductivity, conductor-insulator transition, crystallinity, film orientation, fused quartz substrate, silicon substrate

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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