Cited by 152Electron and X-Ray Spectroscopy TechniquesMagnetic properties of thin filmsSurface and Thin Film Phenomena

The DOI matches its Crossref record; 41 of the 41 references it cites were found in a registry or an index.

Spin-polarized Fermi surface mapping

Hoesch, M., Greber, T., Petrov, V.N., Muntwiler, M., Hengsberger, M., Auwärter, W., Osterwalder, J.·2002·Journal of Electron Spectroscopy and Related Phenomena

Overview

Integrity signals

Registry

Crossref · 10.1016/s0368-2048(02)00058-0

Cites

41 of 41 references verified0 citation errors · 0 not checkable

Statistics

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Verification

Claims the paper makes

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Claims other papers make about this one

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Citations

Cites

Research works printed but not linked: 1

  1. Santoni, 1991, Appl. Phys., A52, 229

Cited by

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Metadata

Authors
Hoesch, M., Greber, T., Petrov, V. N., Muntwiler, M., Hengsberger, M., Auwärter, W., & Osterwalder, J.
Affiliations
  • University of Zurich (CH)
  • Peter the Great St. Petersburg Polytechnic University (RU)
Corresponding author
Hoesch, M.
Venue
Journal of Electron Spectroscopy and Related Phenomena
Publisher
Elsevier BV
Published
2002-07
Volume
124
Issue
2-3
Pages
263-279
ISSN
0368-2048 (ISSN-L)
OpenAlex
W2139259529
Cited by
151
References
39
Citations by year
2026: 4 · 2025: 2 · 2024: 6 · 2023: 4 · 2022: 4 · 2021: 4 · 2020: 7 · 2019: 1 · 2018: 13 · 2017: 9 · 2016: 9 · 2015: 7 · 2014: 12 · 2013: 13 · 2012: 10
FWCI
1.68
Type
journal article
Language
en
Open access
closed
Locations
  • Journal of Electron Spectroscopy and Related Phenomena (publishedVersion)
  • DORA PSI (Paul Scherrer Institute) (submittedVersion)
Topics
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Electron and X-Ray Spectroscopy Techniques
  • Physical Sciences › Physics and Astronomy › Condensed Matter Physics › Magnetic properties of thin films
  • Physical Sciences › Physics and Astronomy › Condensed Matter Physics › Surface and Thin Film Phenomena
Keywords
itinerant ferromagnets, angle-resolved photoemission, spin polarization, polarimeter, Ni(111), magnetic thin films, multilayer systems, electronic band structure, magnetization direction

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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