The DOI matches its Crossref record; 46 of the 46 references it cites were found in a registry or an index.
Substrates for gallium nitride epitaxy
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Strite, S., & Morkoç, H. (1992) · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · doi:10.1116/1.585897 · Cited by 2,883
Nonmetallic crystals with high thermal conductivity
Slack, G. A. (1973) · Journal of Physics and Chemistry of Solids · doi:10.1016/0022-3697(73)90092-9 · Cited by 2,151
Growth and applications of Group III-nitrides
Ambacher, O. (1998) · Journal of Physics D: Applied Physics · doi:10.1088/0022-3727/31/20/001 · Cited by 1,474
Casady, J. B., & Johnson, R. W. (1996) · Solid-State Electronics · doi:10.1016/0038-1101(96)00045-7 · Cited by 1,445
THE PREPARATION AND PROPERTIES OF VAPOR-DEPOSITED SINGLE-CRYSTAL-LINE GaN
Maruska, H. P., & Tietjen, J. J. (1969) · Applied Physics Letters · doi:10.1063/1.1652845 · Cited by 1,350
CRC Materials Science and Engineering Handbook
Shackelford, J. F., Han, Y.-H., Kim, S., & Kwon, S.-H. (2016) · CRC Press eBooks · doi:10.1201/b18971 · Cited by 1,274
Okada, Y., & Tokumaru, Y. (1984) · Journal of Applied Physics · doi:10.1063/1.333965 · Cited by 1,215
High dislocation densities in high efficiency GaN-based light-emitting diodes
Lester, S. D., Ponce, F. A., Craford, M. G., & Steigerwald, D. A. (1995) · Applied Physics Letters · doi:10.1063/1.113252 · Cited by 966
CRC Materials Science and Engineering Handbook
(2000) · CRC Press eBooks · doi:10.1201/9781420038408 · Cited by 616
Investigation of growth processes of ingots of silicon carbide single crystals
Tairov, Y. M., & Tsvetkov, V. F. (1978) · Journal of Crystal Growth · doi:10.1016/0022-0248(78)90169-0 · Cited by 594
Cited by
GaN-based power devices: Physics, reliability, and perspectives
Meneghini, M., De Santi, C., Abid, I., Buffolo, M., Cioni, M., Khadar, R. A., Nela, L., Zagni, N., Chini, A., Medjdoub, F., et al. (2021) · Journal of Applied Physics · doi:10.1063/5.0061354 · Cited by 723
Metadata
- Authors
- Liu, L., & Edgar, J. H.
- Venue
- Materials Science and Engineering: R: Reports
- Publisher
- Elsevier BV
- Published
- 2002-04
- Volume
- 37
- Issue
- 3
- Pages
- 61-127
- ISSN
- 0927-796X (ISSN-L)
- OpenAlex
- W1974072513
- Cited by
- 833
- References
- 46
- FWCI
- 19.10
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Substrates for gallium nitride epitaxy. https://app.cochat.ai/papers/10.1016/s0927-796x(02)00008-6
- The paper
- Liu, L., & Edgar, J. H. (2002). Substrates for gallium nitride epitaxy. Materials Science and Engineering: R: Reports. https://doi.org/10.1016/s0927-796x(02)00008-6
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.