The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.
Artificial intelligence-based sampling planning system for dynamic manufacturing process
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
In the citing paper
“Existing factory processes will be increasingly subject to analysis to ascertain whether they could be automated (Lee, 2002; Löffler & Tschiesner, 2013; Yang et al., 2017).”
From Artificial Intelligence (AI): Multidisciplinary perspectives on emerging challenges, opportunities, and agenda for research, practice and policy (2021) · cites this paper as Lee, 2002
Citations
Cites
Self-Organization and Associative Memory
Kohonen, T. (1989) · Springer Series in Information Sciences · doi:10.1007/978-3-642-88163-3 · Cited by 8,740
Introduction to Statistical Quality Control
Sauter, R., & Montgomery, D. C. (1992) · Technometrics · doi:10.1080/00401706.1992.10484924 · Cited by 7,890
Introduction to Statistical Quality Control
Sauter, R. M., & Montgomery, D. C. (1992) · Technometrics · doi:10.2307/1269251 · Cited by 7,842
Self-Organization and Associative Memory
Kohonen, T. (1988) · Springer Series in Information Sciences · doi:10.1007/978-3-662-00784-6 · Cited by 3,812
Engineering applications of the self-organizing map
Kohonen, T., Oja, E., Simula, O., Visa, A., & Kangas, J. (1996) · Proceedings of the IEEE · doi:10.1109/5.537105 · Cited by 847
The Economic Design of Control Charts: A Unified Approach
Lorenzen, T. J., & Vance, L. C. (1986) · Technometrics · doi:10.1080/00401706.1986.10488092 · Cited by 611
Industrial Applications of Fuzzy Logic and Intelligent Systems
Yen, J., Langari, R., & Zadeh, L. A. (1995) · Medical Entomology and Zoology · Cited by 260
A Combined Adaptive Sample Size and Sampling IntervalXControl Scheme
Prabhu, S. S., Montgomery, D. C., & Runger, G. C. (1994) · Journal of Quality Technology · doi:10.1080/00224065.1994.11979524 · Cited by 221
Industrial Applications Of Fuzzy Technology In The World
広田, 薫., & Sugeno, M. (1995) · Advances in fuzzy systems · doi:10.1142/2850 · Cited by 53
A new intelligent SOFM-based sampling plan for advanced process control
Lee, J. H., You, S. J., & Park, S. C. (2001) · Expert Systems with Applications · doi:10.1016/s0957-4174(00)00054-3 · Cited by 30
Self-citationFUZZY APPLICATIONS FOR AUTOMOBILES
Takahashi, H. (1995) · Advances in fuzzy systems · doi:10.1142/9789812830708_0007 · Cited by 5
Research works printed but not linked: 4
- Bechtold, 1993, A practical guide to expert systems: part a, Instrumentation and Control Systems, 66, 41
- Bechtold, 1994, A practical guide to expert systems: part b, Instrumentation and Control Systems, 67, 75
- Gilles, 1995, Expert systems: finally ready for an industrial workout, Instrumentation and Control Systems, 68, 57
- Kuo, W., Wang, A., Akella, R., Nurani, R., (1996). A combined adaptive sampling strategy with limited capacity. Proceedings of ISSM'96, (pp. 235–238).
Cited by
Dwivedi, Y. K., Hughes, L., Ismagilova, E., Aarts, G., Coombs, C., Crick, T., Duan, Y., Dwivedi, R., Edwards, J., Eirug, A., et al. (2021) · International Journal of Information Management · doi:10.1016/j.ijinfomgt.2019.08.002 · Cited by 4,611
“Existing factory processes will be increasingly subject to analysis to ascertain whether they could be automated (Lee, 2002; Lö ffl er & Tschiesner, 2013; Yang, Chen, Huang, & Li, 2017).”
BackgroundIntegration of decision support systems to improve decision support performance
Liu, S., Duffy, A. H. B., Whitfield, R. I., & Boyle, I. M. (2009) · Knowledge and Information Systems · doi:10.1007/s10115-009-0192-4 · Cited by 223
Perspectives on the future of manufacturing within the Industry 4.0 era
Hughes, L., Dwivedi, Y. K., Rana, N. P., Williams, M. D., & Raghavan, V. (2020) · Production Planning & Control · doi:10.1080/09537287.2020.1810762 · Cited by 228
Rivera-Gómez, H., Gharbi, A., Kenné, J., Montaño-Arango, Ó., & Armenta, J. R. C. (2020) · Computers & Industrial Engineering · doi:10.1016/j.cie.2020.106273 · Cited by 91
An empirical study of intelligent expert systems on forecasting of fashion color trend
Yu, Y. T., Hui, C. L., & Choi, T. (2011) · Expert Systems with Applications · doi:10.1016/j.eswa.2011.09.153 · Cited by 62
Metadata
- Authors
- Lee, J. H.
- Affiliations
- Korea Advanced Institute of Science and Technology (KR)
- Corresponding author
- Lee, Jang Hee
- Venue
- Expert Systems with Applications
- Publisher
- Elsevier BV
- Published
- 2002-02
- Volume
- 22
- Issue
- 2
- Pages
- 117-133
- ISSN
- 0957-4174 (ISSN-L)
- OpenAlex
- W1975995798
- Cited by
- 31
- References
- 10
- Citations by year
- 2024: 2 · 2022: 1 · 2020: 3 · 2019: 1 · 2015: 2 · 2014: 3 · 2013: 2 · 2012: 2
- FWCI
- 1.60
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- www.elsevier.com/tdm/userlicense/1.0/ (tdm)
- Locations
- Expert Systems with Applications (publishedVersion)
- Topics
- Social Sciences › Decision Sciences › Statistics, Probability and Uncertainty › Advanced Statistical Process Monitoring
- Physical Sciences › Engineering › Control and Systems Engineering › Fault Detection and Control Systems
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Keywords
- dynamic sampling, sampling planning, semiconductor manufacturing, wafer inspection, sampling strategy optimization, artificial intelligence, wafer bin maps, data mart, cycle time reduction, inspection throughput
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
