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Combined Scanning Electrochemical−Atomic Force Microscopy
Abstract
A combined scanning electrochemical microscope (SECM)-atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probe provides a flexible cantilever (force sensor), while the coating insulates the probe such that only the tip end (electrode) is exposed to the solution. The SECM-AFM technique is illustrated with simultaneous electrochemical-probe deflection approach curves, simultaneous topographical and electrochemical imaging studies of track-etched polycarbonate ultrafiltration membranes, and etching studies of crystal surfaces.
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Cited by
Electrochemical Biosensors - Sensor Principles and Architectures
Grieshaber, D., MacKenzie, R., Vörös, J., & Reimhult, E. (2008) · Sensors · doi:10.3390/s80314000 · Cited by 2,329
Local polarization dynamics in ferroelectric materials
Kalinin, S. V., Morozovska, A. N., Chen, L. Q., & Rodriguez, B. J. (2010) · Reports on Progress in Physics · doi:10.1088/0034-4885/73/5/056502 · Cited by 419
Peng, C., Jin, J., & Chen, G. Z. (2007) · Electrochimica Acta · doi:10.1016/j.electacta.2007.07.004 · Cited by 366
Ebejer, N., Güell, A. G., Lai, S. C. S., McKelvey, K., Snowden, M. E., & Unwin, P. R. (2013) · Annual Review of Analytical Chemistry · doi:10.1146/annurev-anchem-062012-092650 · Cited by 355
Self-citationScanning electrochemical microscopy in the 21st century
Sun, P., Laforge, F. O., & Mirkin, M. V. (2007) · Phys. Chem. Chem. Phys. · doi:10.1039/b612259k · Cited by 310
Metadata
- Authors
- Macpherson, J. V., & Unwin, P. R.
- Venue
- Analytical Chemistry
- Publisher
- American Chemical Society (ACS)
- Published
- 1999-12-10
- Volume
- 72
- Issue
- 2
- Pages
- 276-285
- ISSN
- 0003-2700 (ISSN-L)
- 1520-6882
- OpenAlex
- W2067477425
- Cited by
- 383
- References
- 0
- FWCI
- 7.55
- Type
- journal article
- Language
- en
- Open access
- closed
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- Macpherson, J. V., & Unwin, P. R. (2000). Combined Scanning Electrochemical−Atomic Force Microscopy. Analytical Chemistry. https://doi.org/10.1021/ac990921w
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