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Crystal Structure and Ferroelectric Properties of ε-Ga2O3 Films Grown on (0001)-Sapphire

Mezzadri, Francesco, Calestani, Gianluca, Boschi, Francesco, Delmonte, Davide, Bosi, Matteo, Fornari, Roberto·2016·Inorganic Chemistry

Abstract

The crystal structure and ferroelectric properties of ε-Ga 2 O 3 deposited by low-temperature MOCVD on (0001)-sapphire were investigated by single-crystal X-ray diffraction and the dynamic hysteresis measurement technique. A thorough investigation of this relatively unknown polymorph of Ga 2 O 3 showed that it is composed of layers of both octahedrally and tetrahedrally coordinated Ga 3+ sites, which appear to be occupied with a 66% probability. The refinement of the crystal structure in the noncentrosymmetric space group P 6 3 mc pointed out the presence of uncompensated electrical dipoles suggesting ferroelectric properties, which were finally demonstrated by independent measurements of the ferroelectric hysteresis. A clear epitaxial relation is observed with respect to the c -oriented sapphire substrate, with the Ga 2 O 3 [10–10] direction being parallel to the Al 2 O 3 direction [11–20], yielding a lattice mismatch of about 4.1%.

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Metadata

Authors
Mezzadri, F., Calestani, G., Boschi, F., Delmonte, D., Bosi, M., & Fornari, R.
Venue
Inorganic Chemistry
Published
2016-11-08
Volume
55
Issue
22
Pages
12079-12084
ISSN
  • 0020-1669 (ISSN-L)
  • 1520-510X
OpenAlex
W2554936423
Cited by
268
References
1
FWCI
5.51
Type
journal article
Language
en
Open access
closed

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Mezzadri, F., Calestani, G., Boschi, F., Delmonte, D., Bosi, M., & Fornari, R. (2016). Crystal Structure and Ferroelectric Properties of ε-Ga2O3 Films Grown on (0001)-Sapphire. Inorganic Chemistry. https://doi.org/10.1021/acs.inorgchem.6b02244

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